OPENER AND BUFFER TABLE FOR TEST HANDLER

• US 20100320348A1
• Filed: 07/02/2008
• Published: 12/23/2010
• Est. Priority Date: 07/16/2007
• Status: Active Grant

• Current Assignee: Techwing Co., Ltd.
• Original Assignee: Techwing Co., Ltd.
• Inventors: Kim, Dong-Han, Na, Yun-Sung, Jeon, In-Gu, Ahn, Seung-Chul, Son, Jae-Hyun
• Granted Patent: US 8,523,158 B2
• Time in Patent Office: Days
• US Class Current: 248/346.03
• CPC Class Codes: G01R 31/2893 Handling, conveying or loading, e.g. belts, boats, vacuum fingers G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H01L21/67

Abstract

An opener and a buffer table for a test handler are disclosed. The opener includes an opening plate, a plurality of pin blocks forming pairs, and at least one or more interval retaining apparatus for retaining an interval between the pin blocks forming a pair. Each of the pin blocks is movably coupled to the opening plate, and includes opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board. Although semiconductor devices to be tested are altered in size and a carrier board loading with the semiconductor devices is thus replaced, the opener does not need to be replaced, thereby reducing the replacement cost and the waste of resources.

Claims

1. An opener for a test handler comprising:

an opening plate;

a plurality of pin blocks that are formed in pairs, are movably coupled to the opening plate, and comprise opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board; and

at least one or more interval retaining apparatuses for retaining an interval between the pin blocks forming a pair.

2. The opener according to claim 1, further comprising:

guider for guiding a movement of the plurality of pin blocks.

3. The opener according to claim 1, wherein each of the at least one or more interval retaining apparatuses comprises:

an interval securing element for securing an interval between the pin blocks forming a pair; and

an interval retaining element for retaining the interval that is secured by the interval securing element.

4. The opener according to claim 3, wherein the interval retaining element comprises at least one or more elastic members for applying an elastic force to at least one of the pin blocks forming a pair.

5. The opener according to claim 3, wherein the interval retaining element is integrally formed with the interval securing element.

6. The opener according to claim 5, wherein the interval retaining element is interval retaining protrusions that are integrally formed with the interval securing element, in which the interval retaining protrusions are inserted into protrusion receiving grooves that are formed in the pin blocks forming a pair.

7. An opener for a test handler comprising:

an opening plate;

pin blocks that are movably coupled to the opening plate, wherein each of the pin blocks comprises opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board; and

a position determining apparatus for determining a position for the pin blocks, wherein the position is arbitrarily selected and the pin blocks are located at the determined position.

8. A buffer table for a test handler comprising:

a placement table on which at least one or more placement compartments for receiving semiconductor devices are formed; and

a placement area defining jig, detachably or movably coupled to the placement table, for defining a placement area of the placement table by using at least one inclined plane thereof, wherein the at lease one inclined plane is a part of the inclined planes that define the placement area.