CONFIGURABLE VOLTAGE REGULATOR

• US 20100321037A1
• Filed: 08/25/2010
• Published: 12/23/2010
• Est. Priority Date: 09/19/2002
• Status: Active Grant

• Current Assignee: Marvell Asia Pte Limited (Marvell Technology Group Limited)
• Original Assignee: Sehat Sutardja
• Inventors: Sutardja, Sehat
• Granted Patent: US 7,979,224 B2
• Time in Patent Office: Days
• US Class Current: 324/649
• CPC Class Codes: G06F 1/26 Power supply means, e.g. regulation thereof for memories G11C
• CPC Class Codes: H01L 2223/5444 for electrical read out
• CPC Class Codes: H01L 23/66 High-frequency adaptations
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
• CPC Class Codes: H03F 2200/261 Amplifier which being suitable for instrumentation applications
• CPC Class Codes: H03F 2203/45138 Two or more differential amplifiers in IC-block form are combined, e.g. measuring amplifiers
• CPC Class Codes: H03F 3/45475 using IC blocks as the active amplifying circuit
• CPC Class Codes: H03H 11/1291 Current or voltage controlled filters
• CPC Class Codes: H03H 11/30 Automatic matching of source impedance to load impedance
• CPC Class Codes: H03H 7/0153 Electrical filters; Controlling thereof
• CPC Class Codes: H03H 7/40 Automatic matching of load impedance to source impedance

Abstract

A configurable semiconductor includes N terminals adapted to be connected to at least one of T external impedances. N is an integer greater than zero and T is an integer greater than one. The T external impedances have impedance values within predetermined tolerances. A measurement circuit measures an impedance value of at least one of the T external impedances. A control circuit compares the measured impedance value to T ranges and selects a value of a device characteristic based on comparison. The value of the device characteristic selected by the control circuit is independent of the predetermined tolerances of the T external impedances.

Claims

1. A configurable semiconductor, comprising:

N terminals adapted to be connected to at least one of T external impedances, where N is an integer greater than zero and T is an integer greater than one,

wherein said T external impedances have impedance values within predetermined tolerances;

a measurement circuit that measures an impedance value of said at least one of said T external impedances; and

a control circuit that compares said measured impedance value to T ranges and that selects a value of a device characteristic based on said comparison,

wherein said value of said device characteristic selected by said control circuit is independent of said predetermined tolerances of said T external impedances.