CAPACITANCE MEASUREMENT CIRCUIT AND METHOD

• US 20110001491A1
• Filed: 12/16/2009
• Published: 01/06/2011
• Est. Priority Date: 07/02/2009
• Status: Active Grant

• Current Assignee: Novatek Microelectronics Corporation (Novatek Microelectronics Corp Limited)
• Original Assignee: Novatek Microelectronics Corporation (Novatek Microelectronics Corp Limited)
• Inventors: Chang, Hui-Hung, Huang, He-Wei, Chang, Chih-Yuan
• Granted Patent: US 8,415,957 B2
• Time in Patent Office: Days
• US Class Current: 324/658
• CPC Class Codes: G01R 27/2605 Measuring capacitance capacitive sensors G01D5/24
• CPC Class Codes: H03K 17/962 Capacitive touch switches
• CPC Class Codes: H03K 2217/960725 Charge-transfer

Abstract

A capacitance measurement circuit and method are provided. A storage capacitor is pre-charged. Charge transfer is performed between an under-test capacitor and the storage capacitor. The storage capacitor is discharged and charged according to a relationship between a voltage of the storage capacitor and a reference voltage. The capacitance of the under-test capacitor is measured according to the voltage on the storage capacitor.

Claims

1. A capacitance measuring method for measuring a capacitance of an under-test capacitor, the measuring method comprising:

pre-charging a storage capacitor;

performing a charge transfer between the under-test capacitor and the storage capacitor;

charging and discharging the storage capacitor according to a relationship between a voltage of the storage capacitor and a reference voltage; and

measuring the capacitance of the under-test capacitor according to the voltage of the storage capacitor.

2. The capacitance measuring method according to claim 1, wherein the step of pre-charging the storage capacitor comprises:

pre-charging the storage capacitor to the reference voltage.

3. The capacitance measuring method according to claim 1, wherein the step of charging and discharging the storage capacitor comprises:

discharging the storage capacitor when the voltage of the storage capacitor is higher than the reference voltage; and

charging the storage capacitor when the voltage of the storage capacitor is lower than the reference voltage.

4. The capacitance measuring method according to claim 3, wherein, a discharge period for discharging the storage capacitor is fixed.

5. The capacitance measuring method according to claim 1, wherein the step of charging and discharging the storage capacitor comprises:

discharging the storage capacitor when the voltage of the storage capacitor is higher than another reference voltage, wherein the another reference voltage is higher than the reference voltage; and

charging the storage capacitor when the voltage of the storage capacitor is lower than the reference voltage;

wherein, a discharge period for discharging the storage capacitor is fixed.

6. The capacitance measuring method according to claim 1, wherein the step of charging and discharging the storage capacitor comprises:

discharging the storage capacitor when the voltage of the storage capacitor is higher than the reference voltage; and

charging the storage capacitor when the voltage of the storage capacitor is lower than the reference voltage;

wherein, a charge period for charging the storage capacitor is fixed.

7. The capacitance measuring method according to claim 1, wherein the step of measuring the capacitance of the under-test capacitor comprises:

accumulating a count of cross-over points between the voltage of the storage capacitor and a reference line within a predetermined time interval to reflect the capacitance of the under-test capacitor.

8. The capacitance measuring method according to claim 1, wherein the step of measuring the capacitance of the under-test capacitor comprises:

integrating an area enclosed by a charge waveform of the voltage of the storage capacitor and a reference line within a predetermined time interval to reflect the capacitance of the under-test capacitor.

9. The capacitance measuring method according to claim 1, wherein the step of measuring the capacitance of the under-test capacitor comprises:

integrating an area enclosed by a discharge waveform of the voltage of the storage capacitor and a reference line within a predetermined time interval to reflect the capacitance of the under-test capacitor.

10. The capacitance measuring method according to claim 1, wherein the step of measuring the capacitance of the under-test capacitor comprises:

integrating an area enclosed by a charge/discharge waveform of the voltage of the storage capacitor and a reference line within a predetermined time interval to reflect the capacitance of the under-test capacitor.

11. The capacitance measuring method according to claim 1, wherein the step of measuring the capacitance of the under-test capacitor comprises:

filtering and amplifying the voltage of the storage capacitor to obtain an output analog signal, wherein a frequency of the output analog signal reflects the capacitance of the under-test capacitor.

12. A capacitance measurement circuit for measuring a capacitance of an under-test capacitor, comprising:

a storage capacitor;

a switch circuit coupled to the storage capacitor, a reference voltage and a voltage source;

a voltage detector coupled to the storage capacitor for detecting a voltage of the storage capacitor;

a switch controller coupled to the voltage detector and the switch circuit for controlling the switch circuit; and

a current source coupled to the switch circuit;

wherein, under control of the switch controller, the reference voltage is coupled to the storage capacitor through the switch circuit to pre-charge the storage capacitor;

the under-test capacitor is coupled to the storage capacitor and the voltage source for performing charge transfer between the under-test capacitor and the storage capacitor;

discharging the storage capacitor by the current source according to a relationship between the voltage of the storage capacitor and the reference voltage; and

charging the storage capacitor by the under-test capacitor by charge transfer according to a relationship between the voltage of the storage capacitor and the reference voltage.

13. The capacitance measurement circuit according to claim 12, wherein, the switch circuit comprises:

a first switch for selectively coupling the voltage source to the under-test capacitor;

a second switch for selectively coupling the storage capacitor to the under-test capacitor;

a third switch for selectively coupling the reference voltage to the storage capacitor; and

a fourth switch for selectively coupling the current source to the storage capacitor.

14. The capacitance measurement circuit according to claim 13, wherein,

when the voltage detection circuit detects that the voltage of the storage capacitor is higher than the reference voltage, the switch controller turns on the fourth switch, so that the current source is coupled to the storage capacitor to discharge the storage capacitor;

and

when the voltage detection circuit detects that the voltage of the storage capacitor is lower than the reference voltage, the switch controller turns off the fourth switch and the under-test capacitor charges the storage capacitor.

15. The capacitance measurement circuit according to claim 14, wherein, the switch controller turns on the fourth switch, so that a discharge period for discharging the storage capacitor is fixed.

16. The capacitance measurement circuit according to claim 13, wherein,

when the voltage detection circuit detects that the voltage of the storage capacitor is higher than another reference voltage, the switch controller turns on the fourth switch, so that the current source is coupled to the storage capacitor to discharge the storage capacitor, the another reference voltage is higher than the reference voltage, and a discharge period for discharging the storage capacitor is fixed;

and

when the voltage detection circuit detects that the voltage of the storage capacitor is lower than the reference voltage, the switch controller turns off the fourth switch and the under-test capacitor charges the storage capacitor.

17. The capacitance measurement circuit according to claim 13, wherein,

when the voltage detection circuit detects that the voltage of the storage capacitor is higher than the reference voltage, the switch controller turns on the fourth switch for coupling the current source to the storage capacitor to discharge the storage capacitor;

and

when the voltage detection circuit detects that the voltage of the storage capacitor is lower than the reference voltage, the switch controller turns off the fourth switch and the under-test capacitor charges the storage capacitor, a charging period for charging the storage capacitor being fixed.

18. The capacitance measurement circuit according to claim 12, further comprising:

an analog digital converter coupled to the voltage detection circuit for converting the voltage of the storage capacitor into a digital data which reflects the capacitance of the under-test capacitor.

19. The capacitance measurement circuit according to claim 18, wherein, the analog digital converter accumulates a count of cross-over points between the voltage of the storage capacitor and a reference line within a predetermined time interval.

20. The capacitance measurement circuit according to claim 18, wherein, the analog digital converter integrates an area enclosed by a charge waveform of the voltage of the storage capacitor and a reference line within a predetermined time interval.

21. The capacitance measurement circuit according to claim 18, wherein, the analog digital converter integrates an area enclosed by a discharge waveform of the voltage of the storage capacitor and a reference line within a predetermined time interval.

22. The capacitance measurement circuit according to claim 18, wherein, the analog digital converter integrates an area enclosed by a charge/discharge waveform of the voltage of the storage capacitor and a reference line within a predetermined time interval.

23. The capacitance measurement circuit according to claim 12, further comprising:

a filter and an amplifier coupled to the voltage detection circuit for converting the voltage of the storage capacitor into an analog data which reflects the capacitance of the under-test capacitor.