×

CAPACITANCE MEASUREMENT CIRCUIT AND METHOD

  • US 20110001491A1
  • Filed: 12/16/2009
  • Published: 01/06/2011
  • Est. Priority Date: 07/02/2009
  • Status: Active Grant
First Claim
Patent Images

1. A capacitance measuring method for measuring a capacitance of an under-test capacitor, the measuring method comprising:

  • pre-charging a storage capacitor;

    performing a charge transfer between the under-test capacitor and the storage capacitor;

    charging and discharging the storage capacitor according to a relationship between a voltage of the storage capacitor and a reference voltage; and

    measuring the capacitance of the under-test capacitor according to the voltage of the storage capacitor.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×