METHOD AND APPARATUS FOR INTERROGATING ELECTRONIC EQUIPMENT COMPONENTS
First Claim
1. An apparatus for interrogating an electronic circuit supported by a substrate, comprising:
- a tester external to the substrate and comprising a tester transceiver;
a testing circuit supported by the substrate and connected to the electronic circuit, the testing circuit comprising a processor and a testing circuit transceiver in communication with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation from the processor to the tester; and
the processor being programmed to process instructions from the tester to interrogate the electronic circuit with an interrogation corresponding to the instructions.
1 Assignment
0 Petitions
Accused Products
Abstract
An apparatus for interrogating an electronic circuit supported by a substrate includes a tester external to the substrate and comprising an tester transceiver. A testing circuit is supported by the substrate and connected to the electronic circuit. The testing circuit includes a processor and a testing circuit transceiver in communication with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation from the processor to the tester. The processor being programmed to process instructions from the tester to interrogate the electronic circuit with an interrogation corresponding to the instructions.
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Citations
41 Claims
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1. An apparatus for interrogating an electronic circuit supported by a substrate, comprising:
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a tester external to the substrate and comprising a tester transceiver; a testing circuit supported by the substrate and connected to the electronic circuit, the testing circuit comprising a processor and a testing circuit transceiver in communication with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation from the processor to the tester; and the processor being programmed to process instructions from the tester to interrogate the electronic circuit with an interrogation corresponding to the instructions. - View Dependent Claims (2, 3, 4, 5, 7, 8, 9, 12, 13, 17, 19)
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6. (canceled)
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10-11. -11. (canceled)
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14-16. -16. (canceled)
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18. (canceled)
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20. A method of interrogating an electronic circuit during manufacture of the electronic circuit on a substrate, comprising the steps of:
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providing a testing circuit supported by the substrate and connected to the electronic circuit, the testing circuit comprising a processor and a testing circuit transceiver; transmitting instructions from a tester to the testing circuit; processing the instructions using the processor; and interrogating the electronic circuit using an interrogation corresponding to the instructions. - View Dependent Claims (22, 23, 24, 26, 27, 28, 30, 31, 35, 37, 38, 39)
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21. (canceled)
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25. (canceled)
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29. (canceled)
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32-34. -34. (canceled)
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36. (canceled)
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40. A method of interrogating an electronic circuit supported by a substrate during manufacture of the electronic circuit, comprising the steps of:
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providing a testing circuit supported by the substrate, the testing circuit comprising a testing circuit transceiver for communicating with a test probe and a processor for processing instructions from the test probe, the testing circuit being electrically connected to the electronic circuit; instructing the testing circuit to interrogate the electronic circuit using a first interrogation; applying a manufacturing step to the electronic circuit; and instructing the testing circuit to interrogate the electronic circuit using a second interrogation.
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41-56. -56. (canceled)
Specification