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METHOD AND APPARATUS FOR INTERROGATING ELECTRONIC EQUIPMENT COMPONENTS

  • US 20110006794A1
  • Filed: 02/26/2009
  • Published: 01/13/2011
  • Est. Priority Date: 02/27/2008
  • Status: Active Grant
First Claim
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1. An apparatus for interrogating an electronic circuit supported by a substrate, comprising:

  • a tester external to the substrate and comprising a tester transceiver;

    a testing circuit supported by the substrate and connected to the electronic circuit, the testing circuit comprising a processor and a testing circuit transceiver in communication with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation from the processor to the tester; and

    the processor being programmed to process instructions from the tester to interrogate the electronic circuit with an interrogation corresponding to the instructions.

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