INSTRUMENT AND METHOD FOR X-RAY DIFFRACTION, FLUORESCENCE, AND CRYSTAL TEXTURE ANALYSIS WITHOUT SAMPLE PREPARATION

• US 20110007869A1
• Filed: 08/06/2010
• Published: 01/13/2011
• Est. Priority Date: 02/14/2006
• Status: Abandoned Application

• Current Assignee: University of Maryland Baltimore County (University of Maryland)
• Original Assignee: University of Maryland Baltimore County (University of Maryland)
• Inventors: Martins, Jose Vanderlei, Arzoumanian, Zaven, GENDREAU, KEITH
• Application Number:
  US12/852,317
• Publication Number:
  US 20110007869A1
• Time in Patent Office: Days
• US Class Current: 378/46
• CPC Class Codes: G01N 2223/076 X-ray fluorescence
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.

Claims

1. An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation, comprising:

a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate; and

a photon-counting X-ray imaging spectrometer disposed to receive X-ray photons output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to said collimated X-ray beam,

wherein the X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.

2. An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation, comprising:

a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate;

a photon-counting X-ray imaging spectrometer disposed to receive X-ray photons output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to said collimated X-ray beam, the X-ray photons comprising diffracted X-rays; and

a housing defining a vacuum chamber and a sample aperture, the sample aperture comprising an X-ray window disposed therein,

wherein the X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate,

wherein the X-ray source is disposed in the vacuum chamber at a first side of the housing and the photon-counting X-ray imaging spectrometer is disposed in the vacuum chamber at a second side of the housing or in another vacuum chamber at the second side of the housing, and

wherein said predetermined coordinate is adjacent an exterior of the X-ray window.

3. An X-ray diffraction and X-ray fluorescence instrument according to claim 2,

wherein said photon-counting X-ray imaging spectrometer comprises a charge coupled device.

4. An X-ray diffraction and X-ray fluorescence instrument according to claim 2, wherein said X-ray source comprises polycapillary optics.

5. An X-ray diffraction and X-ray fluorescence instrument according to claim 2, wherein a position and orientation of said X-ray source and said photon-counting X-ray imaging spectrometer are fixed relative to one another.