METHOD AND CIRCUIT FOR CONFIGURING PIN STATES

• US 20110018587A1
• Filed: 07/21/2010
• Published: 01/27/2011
• Est. Priority Date: 07/24/2009
• Status: Abandoned Application

• Current Assignee: Huawei Technologies Co., Ltd. (Huawei Investment & Holding Co., Ltd.)
• Original Assignee: Huawei Technologies Co., Ltd. (Huawei Investment & Holding Co., Ltd.)
• Inventors: Li, Bo
• Application Number:
  US12/840,940
• Publication Number:
  US 20110018587A1
• Time in Patent Office: Days
• US Class Current: 327/74
• CPC Class Codes: G06F 1/22 Means for limiting or controlling the pin/gate ratio
• CPC Class Codes: H03K 19/1732 by limitation or reduction of the pin/gate ratio for data-processing equipment G06F1/22

Abstract

The present disclosure relates to an electronic technology and discloses a method and circuit for configuring pin states. The method for configuring pin states includes: establishing a connection between a pin and a variable resistor; loading a fixed voltage on the pin, and detecting intensity of currents generated by the variable resistor under different resistance; comparing the detected current intensity with at least two different reference values, and outputting corresponding pin states according to the comparison results; or loading a fixed current on the pin, and detecting voltages generated by the variable resistor under different resistance; comparing the detected voltages with at least two different reference values, and outputting corresponding pin states according to the comparison results. With the present disclosure, multiple pin states may be easily obtained.

Claims

1. A method for configuring pin states, comprising:

loading a fixed voltage on a pin connected to a variable resistor;

detecting intensity of currents generated by the variable resistor under different resistance;

comparing the current intensity with at least two different reference values, and

outputting corresponding pin states according to the comparison results;

or

loading a fixed current on a pin connected to a variable resistor;

detecting voltages generated by the variable resistor under different resistance;

comparing the voltages with at least two different reference values, and

outputting corresponding pin states according to the comparison results.

2. The method of claim 1, wherein comparing the current intensity with at least two different reference values and outputting the corresponding pin states according to the comparison results further comprises:

comparing the current intensity with at least two different reference values respectively;

outputting logic signals according to the comparison results; and

using the logic signal combinations as the corresponding pin states.

3. The method of claim 1, wherein comparing the voltages with at least two different reference values and outputting the corresponding pin states according to the comparison results further comprises:

comparing the voltages with at least two different reference values respectively;

outputting logic signals according to the comparison results; and

using the logic signal combinations as the pin states.

4. A method for configuring pin states comprising:

loading a variable current on a pin connected to a variable resistor;

detecting voltages generated by the variable resistor under different resistance;

comparing the voltages with a reference value, and

outputting corresponding pin states according to the comparison results.

5. The method of claim 4, wherein comparing the voltages with the reference value and outputting the corresponding pin states according to the comparison results further comprises:

comparing the voltages with the reference value respectively, and

using logic signals obtained according to the comparison results as the pin states.

6. A circuit for configuring pin states comprising

a pin;

a variable resistor, wherein a first end of the pin is connected to a first end of the variable resistor, and a second end of the variable resistor is connected to the earth; and

a detection circuit having an input end connected to a second end of the pin, wherein the detection circuit is configured to;

load a fixed voltage on the second end of the pin,

compare the current intensity with at least two different reference values when detecting intensity of currents generated by the variable resistor under different resistance, and

output corresponding pin states according to the comparison results;

or

load a fixed current on the second end of the pin,

compare the voltages with at least two different reference values when detecting voltages generated by the variable resistor under different resistance, and

output corresponding pin states according to the comparison results.

7. The circuit of claim 6, wherein if the detection circuit loads a fixed voltage on the second end of the pin, the detection circuit comprises:

a fixed voltage supply circuit connected to the second end of the pin, configured to load a fixed voltage on the second end of the pin; and

a current comparison circuit connected to the second end of the pin, configured to;

detect intensity of currents generated by the variable resistor under different resistance, compare the current intensity with at least two different reference values respectively, and output the corresponding pin states according to the comparison results.

8. The circuit of claim 6, wherein if the detection circuit loads a fixed current on the second end of the pin, the detection circuit comprises:

a fixed current supply circuit connected to the second end of the pin, configured to load a fixed current on the second end of the pin; and

a voltage comparison circuit connected to the second end of the pin, configured to;

detect voltages generated by the variable resistor under different resistance, compare the voltages with at least two different reference values respectively, and output the corresponding pin states according to the comparison results.

9. A circuit for configuring pin states comprising:

a pin having a first end connected to a first end of a variable resistor, wherein a second end of the variable resistor is connected to the earth,

a detection circuit having an input end connected to a second end of the pin, wherein the detection circuit is configured to;

load a variable current on the second end of the pin,

compare the voltages with a reference value when detecting voltages generated by the variable resistor under different resistance, and

output corresponding pin states according to the comparison results.

10. The circuit of claim 9, wherein the detection circuit further comprises:

a variable current supply circuit connected to the second end of the pin, configured to load a variable current on the second end of the pin; and

a voltage comparison circuit connected to the second end of the pin, configured to;

detect voltages generated by the variable resistor under different resistance, compare the voltages with a reference value respectively, and output the corresponding pin states according to the comparison results.