ELECTRONIC ANALYSIS CIRCUIT WITH MODULATION OF SCANNING CHARACTERISTICS FOR PASSIVE-MATRIX MULTICONTACT TACTILE SENSOR

• US 20110025619A1
• Filed: 12/19/2008
• Published: 02/03/2011
• Est. Priority Date: 12/19/2007
• Status: Abandoned Application

• Current Assignee: Stantum SAS
• Original Assignee: Stantum SAS
• Inventors: Olivier, Julien, Largillier, Guillaume, Joguet, Pascal
• Application Number:
  US12/809,349
• Publication Number:
  US 20110025619A1
• Time in Patent Office: Days
• US Class Current: 345/173
• CPC Class Codes: G06F 1/3262 Power saving in digitizer or tablet
• CPC Class Codes: G06F 3/041661 using detection at multiple resolutions, e.g. coarse and fine scanning; using detection within a limited area, e.g. object tracking window
• CPC Class Codes: G06F 3/047 using sets of wires, e.g. crossed wires
• CPC Class Codes: G06F 3/0488 using a touch-screen or digitiser, e.g. input of commands through traced gestures

Abstract

An electronic analysis circuit for a multicontact passive-matrix tactile sensor including an electrical supply mechanism powering one of two axes of the matrix, and a mechanism detecting electrical characteristics along the other axis of the matrix, at nodes between the two axes. At least one scanning characteristic is modulated locally or temporally. A multicontact passive-matrix tactile sensor can include such an electronic analysis circuit.

Claims

1-18. -18. (canceled)

19. An analyzer electronic circuit for passive-matrix multicontact tactile sensor comprising:

means for energization of one of two axes of the matrix; and

means for detecting electrical characteristics on the other axis of the matrix at nodes between the two axes,

wherein at least one scanning characteristic is modulated locally or temporally.

20. An analyzer electronic circuit according to claim 19, wherein the modulation modifies scanning frequency locally or temporally.

21. An analyzer electronic circuit according to claim 19, wherein the modulation modifies scanning resolution locally or temporally.

22. An analyzer electronic circuit according to claim 19, wherein the modulation modifies scanning resolution and frequency locally or temporally.

23. An analyzer electronic circuit according to claim 19, wherein scanning is effected using a set of low scanning characteristics over a whole of a surface of the sensor and using at least one set of high scanning characteristics over at least one smaller area.

24. An analyzer electronic circuit according to claim 23, wherein the at least one smaller area is a contact area in which contact has been detected during scanning using a set of low scanning characteristics.

25. An analyzer electronic circuit according to claim 24, wherein the scanning using at least one set of high scanning characteristics is conditioned by detection, if any, of a contact area during scanning using the set of low scanning characteristics.

26. An analyzer electronic circuit according to claim 24, wherein limits of the area scanned using the at least one set of high scanning characteristics are determined as a function of a contour of the contact area detected during scanning using the set of low scanning characteristics.

27. An analyzer electronic circuit according to claim 24, wherein limits of the area scanned using the at least one set of high scanning characteristics are updated after each scan using the set of low scanning characteristics.

28. An analyzer electronic circuit according to claim 24, wherein the at least one set of high scanning characteristics is a function of a size of the area to be scanned.

29. An analyzer electronic circuit according to claim 23, wherein the at least one smaller area is an area corresponding to a location of a graphic object.

30. An analyzer electronic circuit according to claim 29, wherein a small area corresponding to the location of a graphic object is scanned using the set of high scanning characteristics, which is a function of the characteristics of the graphic object.

31. An analyzer electronic circuit according to claim 19, wherein analysis of the area scanned using the at least one set of high scanning characteristics further includes filtering steps more sophisticated than those used during analysis of a whole of the surface of the sensor using the set of low scanning characteristics.

32. An analyzer electronic circuit according to claim 19, wherein the modulation is a function of graphic elements displayed on a tactile screen.

33. An analyzer electronic circuit according to claim 19, wherein the modulation is a function of a result of detection, if any, of a contact point.

34. An analyzer electronic circuit according to claim 19, wherein there is no scanning of parts of a tactile screen not including a graphic object.

35. An analyzer electronic circuit according to claim 19, controlling the sensor during a scanning phase by energizing successive tracks of one of networks and detecting a response on each of the tracks of a second network.

36. A passive-matrix multicontact tactile sensor comprising:

means for energization of one of two axes of the matrix; and

means for detecting electrical characteristics on the other axis of the matrix at nodes between the two axes;

the sensor including an analyzer electronic circuit according to claim 19.