METHOD AND APPARATUS FOR MEASURING AND CORRECTING RECEIVER PARAMETERS

• US 20110026570A1
• Filed: 08/20/2009
• Published: 02/03/2011
• Est. Priority Date: 07/29/2009
• Status: Active Grant

• Current Assignee: Montage Technology Company Limited
• Original Assignee: Montage Technology Company Limited
• Inventors: Wu, Meiwu, Si, Xiaomin, Hu, Gang, Leechung, Yiu, Nie, Yuanfei, Feng, Shen, Chen, Yu
• Granted Patent: US 8,340,167 B2
• Time in Patent Office: Days
• US Class Current: 375/224
• CPC Class Codes: H04B 17/21 for calibration; for correcting measurements

Abstract

A method and apparatus for measuring parameters of a receiver having a mixer for generating an I signal and a Q signal using an input signal, an I channel circuit for processing the I signal, and a Q channel circuit for processing the Q signal. The method includes feeding the receiver a first testing signal before the mixer. The method includes feeding the receiver a second testing signal on the I channel circuit. The method includes feeding the receiver a third testing signal on the Q channel circuit. The method includes measuring I/Q quadrature deviation and I/Q delay imbalance of the receiver using the first, the second, and the third testing signals. This separates the I/Q quadrature deviation and I/Q delay imbalance.

Claims

1. A method for measuring parameters of a receiver, the receiver including a mixer for generating an I signal and a Q signal using an input signal, an I channel circuit for processing the I signal, and a Q channel circuit for processing the Q signal, the method comprising:

feeding the receiver a first testing signal before the mixer;

feeding the receiver a second testing signal on the I channel circuit;

feeding the receiver a third testing signal on the Q channel circuit; and

measuring I/Q quadrature deviation and I/Q delay imbalance of the receiver using the first, the second, and the third testing signals.

2. The method of claim 1, the method further comprising:

sampling on the I channel circuit to obtain a first I signal corresponding to the first testing signal;

sampling on the Q channel circuit to obtain a first Q signal corresponding to the first testing signal;

sampling on the I channel circuit to obtain a second I signal corresponding to the second testing signal;

sampling on the Q channel circuit to obtain a second Q signal corresponding to the third testing signal;

calculating the I/Q quadrature deviation and the I/Q delay imbalance using the first I signal, the first Q signal, the second I signal, and the second Q signal.

3. The method of claim 2, the method further comprising:

calculating a first I/Q phase imbalance using the first I signal and the first Q signal;

calculating a second I/Q phase imbalance using the second I signal and the second Q signal; and

calculating the I/Q quadrature deviation and the I/Q delay imbalance using the first and the second I/Q phase imbalance.

4. The method of claim 2, wherein the first I signal, the first Q signal, the second I signal, and the second Q signal are digital signals.

5. The method of claim 2, wherein

the I channel circuit includes a first low pass filter, the first I signal is sampled at a first position on the I channel circuit before the first low pass filter, the second testing signal is fed at the first position,

the Q channel circuit includes a second low pass filter, the first Q signal is sampled at a second position on the Q channel circuit before the second low pass filter, the third testing signal is fed at the second position,

the position of the first position along the I channel circuit is corresponding with the position of the second position along the Q channel circuit,

the second I signal is sampled at the output of the I channel circuit, the second Q signal is sampled at the output of the Q channel circuit.

6. The method of claim 1, the method further comprising:

generating the first testing signal using a local generated signal which is used to generate a local oscillator signal;

generating the second testing signal using the local generated signal; and

generating the third testing signal using the local generated signal.

7. The method of claim 1, wherein the first testing signal is a radio frequency signal, and the second and the third testing signals are baseband signals.

8. The method of claim 1, wherein the second testing signal and the third testing signal are the same signal.

9. The method of claim 1, the method further comprising:

measuring a step deviation of at least one gain module of the receiver using the first testing signal; and

calibrating gain settings of an automatic gain control table according to the step deviation of the at least one gain module.

10. A receiver comprising:

a mixer for generating an I signal and a Q signal using an input signal;

an I channel circuit for processing the I signal;

a Q channel circuit for processing the Q signal;

a first testing signal generating circuit for generating a first testing signal being connected to the signal path before the mixer;

a second testing signal generating circuit for generating a second testing signal being connected to the I channel circuit; and

a third testing signal generating circuit for generating a third testing signal being connected to the Q channel circuit.

11. The receiver of claim 10, wherein:

the I channel circuit comprises a first low pass filter, the second testing signal generating circuit is connected to the I channel circuit at a first position before the first low pass filter;

the Q channel circuit comprising a second low pass filter, the third testing signal generating circuit is connected to the Q channel circuit at a second position before the second low pass filter;

the position of the first position along the I channel circuit is corresponding with the position of the second position along the Q channel circuit.

12. The receiver of claim 11, further comprising:

a first bypass circuit connected to the I channel circuit at the first position; and

a second bypass circuit connected to the Q channel circuit at the second position.

13. The receiver of claim 10, wherein the first testing signal generating circuit generates the first testing signal using a local generated signal which is used to generate a local oscillator signal, the second testing signal generating circuit generates the second testing signal using the local generated signal, and the third testing signal generating circuit generates the third testing signal using the local generated signal.

14. The receiver of claim 10, wherein the first testing signal is a radio frequency signal, the second testing signal and the third testing signal are baseband signals.

15. The receiver of claim 10, wherein the second testing signal generating circuit and the third testing signal generating circuit are the same circuit.

20. The communication system of claim 15, wherein the first testing signal is a radio frequency signal, the second testing signal and the third testing signal are baseband signals.

16. A communication system, comprising:

a receiver comprising a signal path, the signal path comprising a mixer for generating an I signal and a Q signal using an input signal, an I channel circuit for processing the I signal, and a Q channel circuit for processing the Q signal;

a first testing signal generating circuit for generating a first testing signal being connected to the signal path before the mixer;

a second testing signal generating circuit for generating a second testing signal being connected to the I channel circuit; and

a third testing signal generating circuit for generating a third testing signal being connected to the Q channel circuit; and

a demodulator comprising a digital signal processor for measuring I/Q quadrature deviation and I/Q delay imbalance using the first, the second, and the third testing signals in testing mode, and for demodulating in working mode.

17. The communication system of claim 16, wherein:

the I channel circuit comprises a first low pass filter, the second testing signal generating circuit is connected to the I channel circuit at a first position before the first low pass filter;

the Q channel circuit comprising a second low pass filter, the third testing signal generating circuit is connected to the Q channel circuit at a second position before the second low pass filter,

the position of the first position along the I channel circuit is corresponding with the position of the second position along the Q channel circuit.

18. The communication system of claim 17, further comprising:

a first bypass circuit connected to the I channel circuit at the first position; and

a second bypass circuit connected to the Q channel circuit at the second position.

19. The communication system of claim 16, wherein the first testing signal generating circuit generates the first testing signal using a local generated signal which is used to generate a local oscillator signal, the second testing signal generating circuit generates the second testing signal using the local generated signal, and the third testing signal generating circuit generates the third testing signal using the local generated signal.