DEVICE FOR MICROSCOPY HAVING SELECTIVE ILLUMINATION OF A PLANE

• US 20110031414A1
• Filed: 04/04/2009
• Published: 02/10/2011
• Est. Priority Date: 04/11/2008
• Status: Active Grant

• Current Assignee: Carl Zeiss Microscopy GmbH (Carl-Zeiss-Stiftung)
• Original Assignee: Carl Zeiss Microscopy GmbH (Carl-Zeiss-Stiftung)
• Inventors: Dietrich, Christian, Power, Christopher, Lippert, Helmut, Radt, Benno
• Granted Patent: US 8,921,809 B2
• Time in Patent Office: Days
• US Class Current: 250/459.1
• CPC Class Codes: G02B 21/002 Scanning microscopes scanning near field optical microscopes G01Q60/18
• CPC Class Codes: G02B 21/06 Means for illuminating specimens
• CPC Class Codes: G02B 21/10 affording dark-field illumination G02B21/14 and G02B21/125 take precedence
• CPC Class Codes: G02B 21/16 adapted for ultraviolet illumination ; Fluorescence microscopes G02B21/0076 takes precedence

Abstract

A microscopy device, particularly for use in an imaging fluorescence lifetime microscopy method is provided. The microscopy device comprises an illumination means for generating an illumination beam, an imaging detector for spatially resolved acquisition of an emission radiation emitted by an object to be examined, an illumination beam path between the illumination means and the object to be examined, and a detection beam path between the object to be examined and the detector. The illumination beam path comprises illumination optics which are designed to generate a light sheet of illumination radiation extending transverse to the axis of the illumination beam path, wherein the axis of the detection beam path is oriented substantially perpendicular to a section plane of the light sheet and of the object to be examined. The illumination means comprise a pulsed laser.

Claims

1. A microscopy device comprising:

illumination means for generating an illumination beam, an imaging detector for spatially resolved acquisition of an emission radiation emitted by an object to be examined;

an illumination beam path between the illumination means and the object to be examined, and a detection beam path between the object to be examined and the detector,

wherein the illumination beam path comprises illumination optics which are designed to generate a light sheet of illumination radiation extending transverse to the axis of the illumination beam path,

wherein the axis of the detection beam path is oriented at an angle diverging from 0°

to a section plane of the light sheet and of the object to be examined, and

wherein the illumination means comprise a pulsed laser.

2. The microscopy device according to claim 1,

wherein the detector is designed for time-resolved acquisition of photons of the emission radiation.

3. The microscopy device according to claim 2,

wherein the detector is designed as a time window-based image intensifier.

4. The microscopy device according to claim claim 2,

wherein the detector is designed as a single photon counter.

5. The microscopy device according to claim 2,

wherein the detector comprises a plurality of detector elements, each of which is designed to emit a time signal depending on an acquisition time of at least one photon relative to a pulse of the illumination beam or to control the acquisition of photons depending on a time signal generated relative to the pulse of the illumination beam.

6. The microscopy device according to claim 5,

wherein the microscopy device comprises evaluating and controlling means which are designed to evaluate the time signals with respect to at least one fluorescence lifetime.

7. The microscopy device according to claim 2,

wherein the microscopy device comprises evaluating and controlling means which are designed to discriminate between different signal components of the emission radiation depending on an acquisition time of photons of the emission radiation.

8. The microscopy device according to claim 7,

wherein the different signal components include autofluorescence radiation of the object to be examined, fluorescence radiation of fluorescent dyes introduced into the object to be examined, or reflected illumination radiation.

9. The microscopy device according to claim 7,

wherein the controlling and evaluating means are designed to carry out an imaging evaluation in parallel for at least two of the signal components.

10. The microscopy device according to claim 1, comprising:

a first raster scanning unit for substantially linear raster scanning of the focus plane in the illumination beam path.

11. The microscopy device according to claim 10, comprising:

a second raster scanning unit for substantially linear raster scanning of the focus plane in the detection beam path, wherein the detector is constructed as a linear array detector.

12. The microscopy device according to claim 1,

wherein the illumination optics comprise cylindrical optics for forming a light sheet.

13. The microscopy device according to claim 1,

wherein the pulsed laser has a pulse duration of less than 1 ns.

14. The microscopy device according to claim 1,

wherein the illumination means are constructed in such a way that a bandwidth of at least 200 nm can be covered with the illumination radiation.

15. The microscopy device according to claim 1,

wherein the laser is constructed as a supercontinuum laser.

16. The microscopy device according to claim 1, comprising:

an adjustable filter for spectrally structured filtering of the illumination radiation.

17. The microscopy device according to claim 1, comprising:

means for positioning the object to be examined relative to the illumination beam path or detection beam path.

18. The microscopy device according to claim 1,

wherein the axis of the detection beam path is oriented substantially perpendicular to a section plane of the light sheet and of the object to be examined.

19. A method of using a microscopy device according to claim 1 in an imaging fluorescence lifetime microscopy method.