SYSTEM AND METHOD FOR RECOVERY FROM MEMORY ERRORS IN A MEDICAL DEVICE
First Claim
1. A system comprising:
- an implantable medical device, the implantable medical device comprising;
a memory circuit;
a radiation detector circuit configured to detect a condition correlative to a high-energy radiation level that exceeds a background radiation level; and
a controller circuit, communicatively coupled to the memory circuit and the radiation detector circuit, wherein the control circuit is configured to;
check memory locations for errors using a first rate of error checking per time period during a normal operation mode; and
,in response to the radiation detector circuit indicating a high-energy radiation level, initiate a memory scrubbing mode, wherein the memory scrubbing mode has an increased rate of error checking substantially all memory locations per time period in the memory circuit to check for any errors and correct any such errors.
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Abstract
A system comprising an implantable medical device that comprises a memory circuit, a radiation detector circuit configured to detect a condition correlative to a high-energy radiation level that exceeds a background radiation level, and a controller circuit. The control circuit checks memory locations for errors using a first rate of error checking per time period during a normal operation mode and, in response to the radiation detector circuit indicating a high-energy radiation level, initiates a memory scrubbing mode, wherein the memory scrubbing mode has an increased rate of error checking substantially all memory locations per time period in the memory circuit to check for any errors and correct any such errors.
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Citations
20 Claims
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1. A system comprising:
an implantable medical device, the implantable medical device comprising; a memory circuit; a radiation detector circuit configured to detect a condition correlative to a high-energy radiation level that exceeds a background radiation level; and a controller circuit, communicatively coupled to the memory circuit and the radiation detector circuit, wherein the control circuit is configured to; check memory locations for errors using a first rate of error checking per time period during a normal operation mode; and
,in response to the radiation detector circuit indicating a high-energy radiation level, initiate a memory scrubbing mode, wherein the memory scrubbing mode has an increased rate of error checking substantially all memory locations per time period in the memory circuit to check for any errors and correct any such errors. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method of operating an implantable medical device comprising:
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checking memory locations for errors using a first rate of error checking per time period during a normal operation mode; detecting a condition correlative to a high-energy radiation level that exceeds a background radiation level using a radiation detector circuit in the implantable medical device; and initiating a memory scrubbing mode in the device, wherein the memory scrubbing mode includes an increased rate of error checking substantially all memory locations per time period to check for any errors and to correct any such errors. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19)
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20. A system comprising:
an implantable medical device, the implantable medical device comprising; a memory circuit; means for determining a condition correlative to a high-energy radiation level that exceeds a background radiation level; and a controller circuit, communicatively coupled to the memory circuit and the radiation detector circuit, wherein the control circuit is configured to; check memory locations for errors using a first rate of error checking per time period during a normal operation mode; and
,in response to the radiation detector circuit indicating a high-energy radiation level, initiate a memory scrubbing mode, wherein the memory scrubbing mode has an increased rate of error checking substantially all memory locations per time period in the memory circuit to check for any errors and correct any such errors.
Specification