Semiconductor Device having variable parameter selection based on temperature and test method
First Claim
1. A semiconductor device, comprising:
- a first temperature sensing circuit including a first temperature threshold value and providing a first temperature indication signal having a first temperature indication logic level;
a multiplexer having a first multiplexer input coupled to receive the first temperature indication signal and a second multiplexer input coupled to receive a data signal, the multiplexer coupled to receive a temperature read enable signal and provides a first multiplexer output signal; and
an output circuit coupled to receive the first multiplexer output signal and includes a first data output terminal wherein during a temperature read mode, the temperature read enable signal is activated and the first temperature indication logic level is provided to the first data output terminal through the output circuit.
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Abstract
A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, or a word line low voltage. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined.
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Citations
20 Claims
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1. A semiconductor device, comprising:
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a first temperature sensing circuit including a first temperature threshold value and providing a first temperature indication signal having a first temperature indication logic level; a multiplexer having a first multiplexer input coupled to receive the first temperature indication signal and a second multiplexer input coupled to receive a data signal, the multiplexer coupled to receive a temperature read enable signal and provides a first multiplexer output signal; and an output circuit coupled to receive the first multiplexer output signal and includes a first data output terminal wherein during a temperature read mode, the temperature read enable signal is activated and the first temperature indication logic level is provided to the first data output terminal through the output circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification