METHODS AND APPARATUSES TO TEST THE FUNCTIONALITY OF CAPACITIVE SENSORS
First Claim
1. A method, comprising:
- supplying a test signal to a driving layer of a touch sensor while the touch sensor is in an ambient state;
measuring received signals at a sensing layer of the touch sensor, the sensing layer being electrically isolated from the driving layer, the measured received signals having measurement values corresponding to mutual capacitances between the driving layer and the sensing layer;
supplying the test signal to the driving layer while the touch sensor is in a capacitive load state, wherein the capacitive load state identifies a state of the touch sensor when a capacitive load is applied to at least a portion of the driving layer;
measuring the received signals at the sensing layer; and
comparing the measurement values to target threshold values to identify a fault point in a device.
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Accused Products
Abstract
Some embodiments include apparatus and methods to test a device having a driving layer and a sensing layer. A test signal is applied to electrodes of the driving layer in a capacitive load state, with a capacitive load applied, and in an ambient state, without a capacitive load applied. Measured values are obtained at the sensing layer for each state. The measured values are compared with threshold values. A report is generated when a measured value violates a threshold. In one embodiment, the driving layer and the sensing layer form multiple capacitive electrodes within a touch sensor. The measured values are related to mutual capacitance values of the touch sensor.
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Citations
25 Claims
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1. A method, comprising:
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supplying a test signal to a driving layer of a touch sensor while the touch sensor is in an ambient state; measuring received signals at a sensing layer of the touch sensor, the sensing layer being electrically isolated from the driving layer, the measured received signals having measurement values corresponding to mutual capacitances between the driving layer and the sensing layer; supplying the test signal to the driving layer while the touch sensor is in a capacitive load state, wherein the capacitive load state identifies a state of the touch sensor when a capacitive load is applied to at least a portion of the driving layer; measuring the received signals at the sensing layer; and comparing the measurement values to target threshold values to identify a fault point in a device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A test system apparatus, comprising:
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an electrical measurement unit to; apply a test signal to a conductive trace of a plurality of conductive traces formed in a driving layer of a device; and measure at least one electrical characteristic of a sensing layer of the device; apply a capacitive load to at least a portion of the plurality of conductive traces formed in the driving layer; and measure the at least one electrical characteristic of the sensing layer with the capacitive load applied to the at least a portion of the plurality of conductive traces; and a processing unit to; compare a measurement of the at least one electrical characteristic to threshold values; and generate a failure report when the measurement violates a first threshold value of the threshold values. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19)
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20. A computer-readable medium comprising instructions, which when implemented by one or more machines, cause the one or more machines to:
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measure an ambient electrical characteristic of a dual layer sensor while in an ambient state, the dual layer sensor having a driving layer and a sensing layer; measure a capacitive load electrical characteristic of the dual layer sensor while a capacitive load is applied to the driving layer; compare the ambient electrical characteristic and the capacitive load electrical characteristic to corresponding threshold values; report a failure when the measured ambient electrical characteristics violates an ambient threshold value; and report a failure when the measured capacitive load electrical characteristic violates a capacitive load threshold value. - View Dependent Claims (21)
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22. A test apparatus, comprising:
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a base plate having a position frame portion to receive a dual layer device; and a conductive top layer to apply a conductive load to the dual layer device for test, the conductive top layer having a plurality of elongated members configured to couple with conductive traces on a driving layer of the dual layer device. - View Dependent Claims (23, 24, 25)
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Specification