MONITORING SYSTEM
First Claim
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1. ) A method of performing impedance measurements on a subject, the method including, in a processing system:
- a) determining at least one impedance measurement to be performed;
b) determining at least one electrode arrangement associated with the determined impedance measurement;
c) displaying a representation indicative of the electrode arrangement; and
,d) causing the impedance measurement to be performed once the electrodes have been arranged in accordance with the displayed representation.
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Accused Products
Abstract
A method of performing impedance measurements on a subject. The method includes using a processing system to determine at least one impedance measurement to be performed, and at one electrode arrangement associated with the determined measurement. A representation of the arrangement is displayed so the impedance measurement can be performed once the electrodes have been arranged in accordance with the displayed representation.
129 Citations
83 Claims
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1. ) A method of performing impedance measurements on a subject, the method including, in a processing system:
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a) determining at least one impedance measurement to be performed; b) determining at least one electrode arrangement associated with the determined impedance measurement; c) displaying a representation indicative of the electrode arrangement; and
,d) causing the impedance measurement to be performed once the electrodes have been arranged in accordance with the displayed representation. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 30, 38, 56)
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29. ) Apparatus for performing impedance measurements on a subject, the apparatus including a processing system for:
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a) determining at least one impedance measurement to be performed; b) determining at least one electrode arrangement associated with the determined impedance measurement; c) displaying a representation indicative of the electrode arrangement; and
,d) causing the impedance measurement to be performed once the electrodes have been arranged in accordance with the displayed representation.
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31. ) A method of performing impedance measurements on a subject, the method including, in a processing system:
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a) determining at least one impedance measurement to be performed; b) receiving data representing at least one measured impedance value; c) processing the at least one measured impedance value to determine at least one impedance parameter; and
,d) generating a representation of the at least one impedance parameter, wherein at least one of the processing and the generating are performed in accordance with the at least one impedance measurement. - View Dependent Claims (32, 33, 34, 35, 36, 37, 40)
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39. ) Apparatus for performing impedance measurements on a subject, the apparatus including a processing system for:
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a) determining at least one impedance measurement to be performed; b) receiving data representing at least one measured impedance value; c) processing the at least one measured impedance value to determine at least one impedance parameter; and
,d) generating a representation of the at least one impedance parameter, wherein at least one of the processing and generating representation are performed in accordance with the at least one impedance measurement.
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41. ) A method of performing impedance measurements on a subject, the method including, in a processing system:
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a) determining at least one impedance measurement type; b) determining a profile indicative of a sequence of impedance measurements; c) displaying a representation indicative of required electrode arrangements; and
,d) causing the impedance measurements to be performed. - View Dependent Claims (42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 58)
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57. ) Apparatus for performing impedance measurements on a subject, the apparatus including a processing system for:
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a) determining at least one impedance measurement type; b) determining a profile indicative of a sequence of impedance measurements; c) displaying a representation indicative of required electrode arrangements; and
,d) causing the impedance measurements to be performed.
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59. ) A method for configuring a processing system for use in impedance analysis of a subject, the method including, in a processing system:
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a) receiving configuration data, the configuration data being indicative of at least one feature; b) determining, using the configuration data, instructions representing the at least one feature; and
,c) causing, at least in part using the instructions, at least one of; i) impedance measurements to be performed; and
,ii) analysis of impedance measurements. - View Dependent Claims (60, 61, 62, 63, 64, 65, 66, 67, 68, 71, 76)
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69. ) Apparatus for configuring a processing system for use in impedance analysis of a subject, the apparatus including a processing system for:
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a) receiving configuration data, the configuration data being indicative of at least one feature; b) determining, using the configuration data, instructions representing the at least one feature; and
,c) causing, at least in part using the instructions, at least one of i) impedance measurements to be performed; and
,ii) analysis of impedance measurements. - View Dependent Claims (70)
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72. ) A method for configuring a processing system for use in impedance analysis of a subject, the method including, in a computer system:
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a) determining configuration data required for the processing system, the configuration data being indicative of at least one feature; and
,b) causing the configuration data to be received by the processing system, the processing system being responsive to the configuration data to cause, at least one of; i) impedance measurements to be performed; and
,ii) analysis of impedance measurements. - View Dependent Claims (73, 74, 75, 78)
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77. ) Apparatus for configuring a processing system for use impedance analysis of a subject, the method including, in a computer system:
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a) determining configuration data required for a processing system, the configuration data being indicative of at least one feature; and
,b) causing the configuration data to be received by the processing system, the processing system being responsive to the configuration data to cause, at least one of; i) impedance measurements to be performed; and
,ii) analysis of impedance measurements.
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79. ) A for use in diagnosing conditions in a subject, the method including, in a processing system:
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a) determining at least one impedance measurement to be performed; b) determining at least one electrode arrangement associated with the determined impedance measurement; c) displaying a representation indicative of the electrode arrangement; and
,d) causing the impedance measurement to be performed once the electrodes have been arranged in accordance with the displayed representation.
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80. ) A for use in diagnosing conditions in a subject, the method including, in a processing system:
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a) determining at least one impedance measurement to be performed; b) receiving data representing at least one measured impedance value; c) processing the at least one measured impedance value to determine at least one impedance parameter; and
,d) generating a representation of the at least one impedance parameter, wherein at least one of the processing and the generating are performed in accordance with the at least one impedance measurement.
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81. ) A for use in diagnosing conditions in a subject, the method including, in a processing system:
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a) determining at least one impedance measurement type; b) determining a profile indicative of a sequence of impedance measurements; c) displaying a representation indicative of required electrode arrangements; and
,d) causing the impedance measurements to be performed.
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82. ) A for use in diagnosing conditions in a subject, the method including, in a processing system:
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a) receiving configuration data, the configuration data being indicative of at least one feature; b) determining, using the configuration data, instructions representing the at least one feature; and
,c) causing, at least in part using the instructions, at least one of i) impedance measurements to be performed; and
,ii) analysis of impedance measurements.
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83. ) A for use in diagnosing conditions in a subject, the method including, in a computer system:
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a) determining configuration data required for the processing system, the configuration data being indicative of at least one feature; and
,b) causing the configuration data to be received by the processing system, the processing system being responsive to the configuration data to cause, at least one of; i) impedance measurements to be performed; and
,ii) analysis of impedance measurements.
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Specification