ELECTRICAL TERMINAL TEST POINT AND METHODS OF USE

• US 20110062975A1
• Filed: 09/11/2009
• Published: 03/17/2011
• Est. Priority Date: 09/11/2009
• Status: Active Grant

• Current Assignee: Exelon Generation Company LLC (Exelon Corporation)
• Original Assignee: Exelon Generation Company LLC (Exelon Corporation)
• Inventors: Walcher, James W.
• Granted Patent: US 9,069,011 B2
• Time in Patent Office: Days
• US Class Current: 324/750.24
• CPC Class Codes: G01R 1/0408 Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808
• CPC Class Codes: G01R 1/0416 Connectors, terminals G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364
• CPC Class Codes: G01R 1/06705 Apparatus for holding or moving single probes for moving multiple probe heads or ICs under test G01R31/2886

Abstract

Described herein are embodiments of an electrical terminal test point that can be temporarily attached to an electrical terminal (e.g., terminal block) in order to provide an interface between the test leads/jumpers of a test device and the electrical contact points of the electrical terminal. In one aspect, embodiments of the electrical terminal test point provide a shield for the electrical contact points of the electrical terminal (whether or not being used for testing) from inadvertent contact and prevents test leads/jumpers of test device from accidentally falling off or being knocked off of their contact points. Electrical terminal test point can be installed and removed without affecting the electrical connections made by electrical terminal (e.g., without removing terminal screws of electrical terminal).

Claims

1. An electrical terminal test point comprising:

a conducting mechanism configured to provide an electrical connection to a contact point, wherein the electrical connection is established and removed from the contact point without disrupting electrical continuity through the contact point; and

an attachment mechanism separate from the conducting mechanism, said attachment mechanism configured to maintain the electrical connection between the conducting mechanism and the contact point.

2. The electrical terminal test point of claim 1, wherein the conducting mechanism further comprises:

a first portion configured to provide a connection point for one or more test leads of a test device; and

a second portion attached to the first portion, said second portion configured to apply pressure to the contact point.

3. The electrical terminal test point of claim 2, wherein the first portion of the conducting mechanism is at least partially insulated and the second portion of the conducting mechanism is at least partially not insulated.

4. The electrical terminal test point of claim 2, wherein at least the second portion of the conducting mechanism is spring-loaded.

5. The electrical terminal test point of claim 1 further comprising:

a plurality of conducting mechanisms, wherein a location associated with respective conducting mechanisms of the plurality corresponds to a location associated with a specific one of a plurality of contact points.

6. The electrical terminal test point of claim 1, wherein the attachment mechanism is configured to attach to one or more leads associated with the contact point.

7. The electrical terminal test point of claim 6, wherein the attachment mechanism further comprises:

a first portion configured to extend substantially perpendicular to the one or more leads associated with the contact point when the electrical connection is established with the contact point; and

a second portion attached to and extending substantially perpendicular to the first portion of the attachment mechanism,

wherein the attachment mechanism is configured to move substantially perpendicular to and rotate about the one or more leads, such that the second portion of the attachment mechanism is capable of attaching to the one or more leads.

8. The electrical terminal test point of claim 7, wherein the attachment mechanism comprises a spring-loaded L-hook.

9. The electrical terminal test point of claim 1, wherein the attachment mechanism comprises a Cleco fastener.

11. The electrical terminal test point of claim 1, wherein at least a portion of the attachment mechanism is insulated.

12. The electrical terminal test point of claim 1, wherein the attachment mechanism is directly connected to the conducting mechanism.

13. The electrical terminal test point of claim 1 further comprising:

a shield configured to protect the contact point, wherein the attachment mechanism and the conducting mechanism are operatively connected with the shield.

14. The electrical terminal test point of claim 13, wherein the conducting mechanism and the attachment mechanism are substantially perpendicular to and extend through the shield.

15. The electrical terminal test point of claim 13, wherein the shield is at least partially made of a non-metal material.

16. The electrical terminal test point of claim 13, wherein the shield is at least partially comprised of a see-through material.

17. The electrical terminal test point of claim 1, further comprising a handle.

18. The electrical terminal test point of claim 1, wherein the electrical terminal comprises a terminal block.

19. The electrical terminal test point of claim 1, wherein the contact point comprises a contact point of an electrical terminal, said contact point configured to establish an electrical connection between two or more leads associated with the electrical terminal.

20. The electrical terminal test point of claim 19, wherein the electrical terminal comprises a terminal block.

10. The electrical terminal test point of claim 10, wherein the attachment mechanism comprises a spring-loaded J-hook.

21. A terminal block test point comprising:

a shield configured to protect one or more contact points of a terminal block;

one or more conducting mechanisms substantially perpendicular to and extending through the shield, respective conducting mechanisms configured to provide an electrical connection to one of the one or more contact points of the terminal block, respective contact points configured to establish a connection between two or more leads associated with the terminal block, wherein respective conducting mechanisms are capable of being removed from the corresponding contact point without disrupting the connection established by the contact point;

one or more attachment mechanisms substantially perpendicular to and extending through the shield, said attachment mechanisms separate from the one or more conducting mechanisms, respective attachment mechanisms configured to maintain the electrical connection between at least one of the one or more conducting mechanisms and the corresponding at least one contact point of the terminal block and further to cause at least a portion of the shield to contact at least a portion of the terminal block.

22. A method comprising:

attaching an electrical terminal test point to an electrical terminal for the purpose of performing one of a plurality of tests in association with the electrical terminal, said electrical terminal test point comprising;

one or more conducting mechanisms, each configured to provide an electrical connection to one of a plurality of contact points of the electrical terminal, respective contact points configured to establish a connection between two or more leads associated with the electrical terminal, wherein respective conducting mechanisms are capable of being attached and removed from the corresponding contact point without disrupting the connection established by the contact point; and

one or more attachment mechanisms separate from the one or more conducting mechanisms, said attachment mechanisms configured to maintain the electrical connection between the one or more conducting mechanisms and the corresponding one or more contact points of the electrical terminal; and

attaching one or more test leads of a test device to the one or more conducting mechanisms of the electrical terminal test point.

23. The method of claim 22 further comprising:

selecting one of the plurality of tests to be performed in association with the electrical terminal;

identifying one or more of the plurality of contact points of the electrical terminal associated with the selected test; and

selecting one of a plurality of electrical terminal test points based at least in part on the one or more identified contact points.

24. The method of claim 23, wherein a location associated with respective conducting mechanisms of the electrical terminal test point corresponds to a location associated with a specific one of the plurality of contact points of the electrical terminal, and wherein selecting one of the plurality of electrical terminal test points based at least in part on the one or more identified contact points comprises selecting the electrical terminal test point based at least in part on a location of the one or more identified contact points.

25. The method of claim 24, wherein the electrical terminal test point comprises a specific number of conducting mechanisms, and wherein selecting one of the plurality of electrical terminal test points based at least in part on the one or more identified contact points, further comprises selecting the electrical terminal test point based at least in part on a number of identified contact points.