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MEMORY KINK CHECKING

  • US 20110063919A1
  • Filed: 09/14/2009
  • Published: 03/17/2011
  • Est. Priority Date: 09/14/2009
  • Status: Active Grant
First Claim
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1. A method for operating a memory device, comprising:

  • selectively applying one of a plurality of voltages to a first data line according to a programming status of a first memory cell, wherein the first memory cell is coupled to the first data line and to a selected access line;

    determining an effect on a second data line due at least in part to the voltage applied to the first data line and a capacitive coupling between at least the first data line and the second data line, wherein the second data line is coupled to a second memory cell, the second memory cell is adjacent to the first memory cell, and the second memory cell is coupled to the selected access line; and

    applying kink correction to the second data line, responsive to the determined effect, during a subsequent programming pulse applied to the second memory cell.

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