PRODUCTION MANAGEMENT SYSTEM

• US 20110066275A1
• Filed: 09/11/2009
• Published: 03/17/2011
• Est. Priority Date: 09/11/2009
• Status: Active Grant

• Current Assignee: SAP SE
• Original Assignee: SAP AG (SAP SE)
• Inventors: Manthey, Arne
• Granted Patent: US 8,359,116 B2
• Time in Patent Office: Days
• US Class Current: 700/110
• CPC Class Codes: G06Q 10/06 Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
• CPC Class Codes: G06Q 10/0633 Workflow analysis
• CPC Class Codes: G06Q 10/0639 Performance analysis of employees; Performance analysis of enterprise or organisation operations
• CPC Class Codes: G06Q 50/04 Manufacturing
• CPC Class Codes: Y02P 90/30 Computing systems specially adapted for manufacturing
• CPC Class Codes: Y02P 90/80 Management or planning

Abstract

A monitoring system includes a control circuit configured to determine scrap values, yield values, and remainder values for at least a first operation and a second operation. The control circuit is configured to transmit one or more display signals. The one or more display signals include instructions to display a first operation status bar and a second operation status bar. The first operation status bar includes a first operation yield value, a first operation scrap value, and a first operation remainder value. The second operation status bar includes a second operation yield value, a second operation scrap value, and a second operation remainder value.

Claims

1. A monitoring system comprising:

a control circuit configured to determine scrap values, yield values, and remainder values for at least a first operation and a second operation, the control circuit being configured to transmit one or more display signals;

wherein the one or more display signals comprise instructions to display a first operation status bar and a second operation status bar;

wherein the first operation status bar comprises a first operation yield value, a first operation scrap value, and a first operation remainder value;

wherein the second operation status bar comprises a second operation yield value, a second operation scrap value, and a second operation remainder value.

2. The monitoring system of claim 1, wherein the control circuit is further configured to monitor a status of the first operation in relation to the second operation.

3. The monitoring system of claim 2, wherein the control circuit is further configured to determine remedial steps related to the second operation based on the status of the first operation.

4. The monitoring system of claim 3, wherein the control circuit is further configured to transmit instructions for a remedial step implementation.

5. The monitoring system of claim 2, wherein the control circuit is further configured to determine that no remedial steps are required related to the second operation based on the status of the first operation.

6. The monitoring system of claim 2, wherein the control circuit is further configured to modify the first operation based on the status of the first operation.

7. The monitoring system of claim 1, wherein a first operation value units and a second operation value units are different units.

8. A method for monitoring a system, comprising:

determining a first operation scrap value;

determining a first operation yield value;

determining a first operation remainder value;

determining a second operation scrap value;

determining a second operation yield value;

determining a second operation remainder value;

transmitting one or more display signals;

displaying a first operation status bar comprising a first operation yield value, a first operation scrap value, and a first operation remainder value, the first operation status bar representing product production for a first operation; and

displaying a second operation status bar comprising a second operation yield value, a second operation scrap value, and a second operation remainder value, the second operation status bar representing product production for a second operation.

9. The method of claim 8, further comprising monitoring a status of the first operation in relation to the second operation.

10. The method of claim 9, further comprising determining remedial steps related to the second operation based on the status of the first operation.

11. The method of claim 10, further comprising transmitting instructions for a remedial step implementation.

12. The method of claim 9, further comprising modifying the first operation based on the status of the first operation.

13. A monitoring system comprising:

a control circuit configured to determine scrap values, yield values, and remainder values for at least a first operation and a second operation;

the control circuit being configured to determine at least a first operation weighting factor and a second operation weighting factor, the control circuit being further configured to determine a first operation progress contribution based on a first operation yield value and the first operation weighting factor, the control circuit being configured to determine a second operation progress contribution based on a second operation yield value and the second operation weighting factor, the control circuit being further configured to determine a total progress based on the first operation progress contribution and the second progress contribution; and

the control circuit being configured to transmit on or more display signals;

wherein the one or more display signals comprise instructions to display a first operation status bar, the first operation status bar comprising a first operation status bar area, the first operation status bar area including dimensions based on the first operation weighting factor, the first operation status bar comprises a first operation yield value, a first operation scrap value, and a first operation remainder value;

wherein the one or more display signals further comprise instructions to display a second operation status bar, the second operation status bar comprising a second operation status bar area, the second operation status bar area including dimensions based on the second operation weighting factor, the second operation status bar comprises a second operation yield value, a second operation scrap value, and a second operation remainder value.

14. The monitoring system of claim 13, wherein the control circuit is further configured to determine a work-in-process correction factor.

15. The monitoring system of claim 14, wherein the one or more display signals may further comprise instructions to display data relating to the work-in-process correction factor.

16. The monitoring system of claim 13, wherein the one or more display signals may further comprise instructions for displaying a condensed order progress status bar.

17. The monitoring system of claim 13, wherein the control circuit is further configured to monitor a status of the first operation in relation to the second operation.

18. The monitoring system of claim 17, wherein the control circuit is further configured to determine remedial steps related to the second operation based on the status of the first operation.

19. The monitoring system of claim 18, wherein the control circuit is further configured to transmit instructions for a remedial step implementation.

20. The monitoring system of claim 17, wherein the control circuit being further configured to modify the first operation based on the status of the first operation.