×

SEMICONDUCTOR APPARATUS AND METHOD OF DETECTING CHARACTERISTIC DEGRADATION OF SEMICONDUCTOR APPARATUS

  • US 20110068818A1
  • Filed: 09/20/2010
  • Published: 03/24/2011
  • Est. Priority Date: 09/24/2009
  • Status: Active Grant
First Claim
Patent Images

1. A semiconductor apparatus comprising:

  • a set value storage unit that stores a set value determined based on an initial characteristic value of the semiconductor apparatus; and

    a detector that detects characteristic degradation of the semiconductor apparatus based on a characteristic value of the semiconductor apparatus at given timing and the set value stored in the set value storage unit.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×