Hybrid method for 3D shape measurement
First Claim
1. A method for three-dimensional shape measurement, comprising:
- generating sinusoidal fringe patterns by projecting defocused binary patterns onto an object to thereby produce phase-shifted fringe patterns;
capturing images of the object with the phase-shifted fringe patterns produced thereon; and
evaluating the images for use in the three-dimensional shape measurement.
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Abstract
A method for three-dimensional shape measurement provides for generating sinusoidal fringe patterns by defocusing binary patterns. A method for three-dimensional shape measurement may include (a) projecting a plurality of binary patterns onto at least one object; (b) projecting three phase-shifted fringe patterns onto the at least one object; (c) capturing images of the at least one object with the binary patterns and the phase-shifted fringe patterns; (d) obtaining codewords from the binary patterns; (e) calculating a wrapped phase map from the phase-shifted fringe patterns; (f) applying the codewords to the wrapped phase map to produce an unwrapped phase map; and (g) computing coordinates using the unwrapped phase map for use in the three-dimensional shape measurement of the at least one object. A system for performing the method is also provided. The high-speed real-time 3D shape measurement may be used in numerous applications including medical science, biometrics, and entertainment.
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Citations
35 Claims
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1. A method for three-dimensional shape measurement, comprising:
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generating sinusoidal fringe patterns by projecting defocused binary patterns onto an object to thereby produce phase-shifted fringe patterns; capturing images of the object with the phase-shifted fringe patterns produced thereon; and evaluating the images for use in the three-dimensional shape measurement. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method for three-dimensional shape measurement, comprising:
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(a) projecting a plurality of binary patterns onto at least one object; (b) projecting three phase-shifted fringe patterns onto the at least one object; (c) capturing images of the at least one object with the binary patterns and the phase-shifted fringe patterns; (d) obtaining codewords from the binary patterns; (e) calculating a wrapped phase map from the phase-shifted fringe patterns; (f) applying the codewords to the wrapped phase map to produce an unwrapped phase map; and (g) computing coordinates using the unwrapped phase map for use in the three-dimensional shape measurement of the at least one object. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15)
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16. A system for three-dimensional shape measurement, comprising:
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at least one projector; at least one camera; at least one system processor; wherein the system being configured to perform steps of (a) generating sinusoidal fringe patterns by projecting defocused binary patterns onto an object to thereby produce phase-shifted fringe patterns, (b) capturing images of the object with the phase-shifted fringe patterns produced thereon, and (c) evaluating the images for use in the three-dimensional shape measurement. - View Dependent Claims (17, 18, 19, 20, 21, 22)
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23. A system for three-dimensional shape measurement, comprising:
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at least one projector; at least one camera; at least one system processor; wherein the system being configured to perform steps of (a) projecting a plurality of binary patterns onto at least one object, (b) projecting three phase-shifted fringe patterns onto the at least one object, (c) capturing images of the at least one object with the binary patterns and the phase-shifted fringe patterns, (d) obtaining codewords from the binary patterns, (e) calculating a wrapped phase map from the phase-shifted fringe patterns, (f) applying the codewords to the wrapped phase map to produce an unwrapped phase map, and (g) computing coordinates using the unwrapped phase map for use in the three-dimensional shape measurement of the at least one object.
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- 24. A method for three-dimensional shape measurement, comprising generating sinusoidal fringe patterns by defocusing binary patterns.
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32. A system for three-dimensional shape measurement, comprising:
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at least one projector; at least one camera; at least one system processor; and wherein the system being configured to generate sinusoidal fringe patterns by defocusing binary patterns, projecting the sinusoidal fringe patterns onto at least one object, capturing images of the at least one object with the sinusoidal fringe patterns, and evaluating the images to provide for three-dimensional shape measurement of the at least one object. - View Dependent Claims (33, 34, 35)
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Specification