MONITORING SYSTEM
First Claim
1. Apparatus for performing impedance measurements on a subject, the apparatus including:
- a) a first processing system for;
i) determining an impedance measurement procedure; and
,ii) selecting instructions corresponding to the measurement procedure; and
,b) a second processing system for;
i) generating, using the instructions, control signals, the control signals being used to apply one or more signals to the subject;
ii) receiving an indication of the one or more signals applied to the subject;
iii) receiving an indication of one or more signals measured across the subject;
iv) performing, using the instructions, at least preliminary processing of the indications to thereby allow impedance values to be determined.
1 Assignment
0 Petitions
Accused Products
Abstract
Apparatus for performing impedance measurements on a subject. The apparatus includes a first processing system for determining an impedance measurement procedure and determining instructions corresponding to the measurement procedure. A second processing system is provided for receiving the instructions, using the instructions to generate control signals, with the control signals being used to apply one or more signals to the subject. The second processing system then receives first data indicative of the one or more signals applied to the subject, second data indicative of one or more signals measured across the subject and performs at least preliminary processing of the first and second data to thereby allow impedance values to be determined.
-
Citations
101 Claims
-
1. Apparatus for performing impedance measurements on a subject, the apparatus including:
-
a) a first processing system for; i) determining an impedance measurement procedure; and
,ii) selecting instructions corresponding to the measurement procedure; and
,b) a second processing system for; i) generating, using the instructions, control signals, the control signals being used to apply one or more signals to the subject; ii) receiving an indication of the one or more signals applied to the subject; iii) receiving an indication of one or more signals measured across the subject; iv) performing, using the instructions, at least preliminary processing of the indications to thereby allow impedance values to be determined. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 67, 68)
-
-
24. A method of performing impedance measurements on a subject, the method including:
-
a) using a first processing system for; i) determining an impedance measurement procedure; and
,ii) selecting instructions corresponding to the measurement procedure; and
,b) using a second processing system for; i) generating, using the instructions, control signals, the control signals being used to apply one or more signals to the subject; ii) receiving an indication of the one or more signals applied to the subject; iii) receiving an indication of one or more signals measured across the subject; iv) performing, using the instructions, at least preliminary processing of the first and second data to thereby allow impedance values to be determined.
-
-
25. (canceled)
-
26. A method of diagnosing conditions in a subject, the method including, in a processing system:
-
a) using a first processing system for; i) determining an impedance measurement procedure; and
,ii) selecting instructions corresponding to the measurement procedure; and
,b) using a second processing system for; i) generating, using the instructions, control signals, the control signals being used to apply one or more signals to the subject; ii) receiving an indication of the one or more signals applied to the subject; iii) receiving an indication of one or more signals measured across the subject; iv) performing, using the instructions, at least preliminary processing of the first and second data to thereby allow impedance values to be determined.
-
-
27. (canceled)
-
28. Apparatus for connecting measurement apparatus to an electrode, the apparatus including:
-
a) a housing having a connector for coupling the housing to an electrode; and
,b) a circuit mounted in the housing, the circuit being electrically coupled to the electrode using the connector, and being coupled to a lead, the circuit being for at least one of; i) generating predetermined electrical signals in accordance with control signals received from the measurement apparatus; ii) providing an indication of electrical signals applied to the electrode; and
,iii) providing an indication of electrical signals measured at the electrode. - View Dependent Claims (29, 30, 31, 32, 33, 34, 35, 36)
-
-
37. (canceled)
-
38. A method of performing impedance measurements on a subject, the method including, in a processing system:
-
a) determining an encoded value associated with at least one electrode lead; and
,b) causing at least one impedance measurement to be performed using the encoded value. - View Dependent Claims (39, 40, 41, 42, 43, 44, 45, 46, 47)
-
-
48. Apparatus for performing impedance measurements on a subject, the apparatus including:
-
a) at least one lead for connecting to electrodes coupled to the subject, the at least one lead including an encoded value; and
,b) a processing system coupled to the at least one lead for; i) determining the encoded value; and
,c) causing at least one impedance measurement to be performed using the encoded value.
-
-
49. (canceled)
-
50. A method of performing impedance measurements on a subject, the method including, in a processing system:
-
a) determining an electrode identifier associated with at least one electrode provided on the subject; b) determining, using the electrode identifier, an electrode position indicative of the position of the at least one electrode on the subject; and
,c) causing at least one impedance measurement to be performed using the electrode position. - View Dependent Claims (51, 52, 53, 54, 55, 56)
-
-
57. Apparatus for performing impedance measurements on a subject, the apparatus including a processing system for:
-
a) determining an electrode identifier associated with at least one electrode provided on the subject; b) determining, using the electrode identifier, an electrode position indicative of the position of the at least one electrode on the subject; and
,c) causing at least one impedance measurement to be performed using the electrode position.
-
-
58. (canceled)
-
59. A method for configuring a measuring device for measuring the impedance of a subject, the method including, in a processing system:
-
a) receiving configuration data, the configuration data being indicative of at least one feature; b) determining, using the configuration data, instructions representing the at least one feature; and
,c) causing, at least in part using the instructions, at least one of; i) impedance measurements to be performed; and
,ii) analysis of impedance measurements. - View Dependent Claims (60, 61, 62, 63, 64, 65, 66)
-
-
69. Apparatus for configuring a measuring device for measuring the impedance of a subject, the apparatus including a processing system for:
-
a) receiving configuration data, the configuration data being indicative of at least one feature; b) determining, using the configuration data, instructions representing the at least one feature; and
,c) causing, at least in part using the instructions, at least one of; i) impedance measurements to be performed; and
,ii) analysis of impedance measurements.
-
-
70. (canceled)
-
71. A method for configuring a measuring device for measuring the impedance of a subject, the method including, in a computer system:
-
a) determining configuration data required for a measuring device, the configuration data being indicative of at least one feature; and
,b) causing the configuration data to be received by a processing system in the measuring device, the processing system being responsive to the configuration data to configure the measuring device to allow the at least one feature to be used. - View Dependent Claims (72, 73, 74)
-
-
75. (canceled)
-
76. Apparatus for configuring a measuring device for measuring the impedance of a subject, the method including, in a computer system:
-
a) determining configuration data required for a measuring device, the configuration data being indicative of at least one feature; and
,b) causing the configuration data to be received by a processing system in the measuring device, the processing system being responsive to the configuration data to configure the measuring device to allow the at least one feature to be used.
-
-
77. (canceled)
-
78. A method of performing impedance measurements on a subject, wherein the method includes, in a processing system:
-
a) causing a first signal to be applied to the subject; b) determining at least one parameter relating to at least one second signal measured across the subject; c) comparing the at least one parameter to at least one threshold; and
,d) depending on the results of the comparison, selectively repeating steps (a) to (d) using a first signal having an increased magnitude. - View Dependent Claims (79, 80, 81, 82)
-
-
83. Apparatus for performing impedance measurements on a subject, wherein the apparatus includes a processing system for:
-
a) causing a first signal to be applied to the subject; b) determining at least one parameter relating to at least one second signal measured across the subject; c) comparing the at least one parameter to at least one threshold; and
,d) depending on the results of the comparison, selectively repeating steps (a) to (d) using a first signal having an increased magnitude. - View Dependent Claims (84)
-
-
85. (canceled)
-
86. A method of providing an electrode for use in impedance measurement procedures, the method including:
-
a) providing on a substrate; i) a number of electrically conductive contact pads; and
,ii) a corresponding number of electrically conductive tracks, each track extending from an edge of the substrate to a respective contact pad; b) applying an insulating layer to the substrate, the insulating layer including a number of apertures, and being positioned to thereby overlay the tracks with at least a portion of each pad contact aligned with a respective aperture; and
,c) providing an electrically conductive medium in the apertures. - View Dependent Claims (87, 88, 89, 90, 91, 92, 93, 94)
-
-
95. An electrode for use in impedance measurement procedures, the electrode including:
-
a) a substrate having provided thereon; i) a number of electrically conductive contact pads; and
,ii) a corresponding number of electrically conductive tracks, each track extending from an edge of the substrate to a respective contact pad; b) an insulating layer provided on the substrate, the insulating layer including a number of apertures, and being positioned to thereby overlay the tracks with at least a portion of each pad contact aligned with a respective aperture; and
,c) an electrically conductive medium provided in the apertures.
-
-
96. (canceled)
-
97. A method for use in diagnosing conditions in a subject, the method including, in a processing system:
-
a) determining an encoded value associated with at least one electrode lead; and
,b) causing at least one impedance measurement to be performed using the encoded value.
-
-
98. A method for use in diagnosing conditions in a subject, the method including, in a processing system:
-
a) determining an electrode identifier associated with at least one electrode provided on the subject; b) determining, using the electrode identifier, an electrode position indicative of the position of the at least one electrode on the subject; and
,c) causing at least one impedance measurement to be performed using the electrode position.
-
-
99. A method for use in diagnosing conditions in a subject, the method including, in a processing system:
-
a) receiving configuration data, the configuration data being indicative of at least one feature; b) determining, using the configuration data, instructions representing the at least one feature; and
,c) causing the measuring device to perform, using the instructions, at least one of; i) impedance measurements; and
,ii) analysis of impedance measurements.
-
-
100. A method for use in diagnosing conditions in a subject, the method including, in a processing system:
-
a) determining configuration data required for a measuring device, the configuration data being indicative of at least one feature; and
,b) causing the configuration data to be received by a processing system in the measuring device, the processing system being responsive to the configuration data to configure the measuring device to allow the at least one feature to be used.
-
-
101. A method for use in diagnosing conditions in a subject, the method including, in a processing system:
-
a) causing a first signal to be applied to the subject; b) determining at least one parameter relating to at least one second signal measured across the subject; c) comparing the at least one parameter to at least one threshold; and
,d) depending on the results of the comparison, selectively repeating steps (a) to (d) using a first signal having an increased magnitude.
-
Specification