COMPUTING DEVICE FOR ENABLING CONCURRENT TESTING
First Claim
1. A method for enabling concurrent testing, comprising:
- generating a plurality of test objects on a computing device, wherein;
the plurality of test objects is generated using derived classes that are based on a base test class; and
each of the plurality of test objects corresponds to a separate block in a Device Under Test (DUT);
adding, on the computing device, the plurality of test objects to a queue;
sending information based on the plurality of test objects to an Automated Test Equipment (ATE); and
causing the ATE to concurrently test the separate blocks in the DUT using the plurality of test objects.
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Accused Products
Abstract
A method for enabling concurrent testing is described. The method includes generating a plurality of test objects on a computing device. The plurality of test objects is generated using derived classes that are based on a base test class and each of the plurality of test objects corresponds to a separate block in a Device Under Test (DUT). The method also includes adding the plurality of test objects to a queue and sending information based on the plurality of test objects to an Automated Test Equipment (ATE). The method also includes causing the ATE to concurrently test the separate blocks in the DUT using the plurality of test objects.
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Citations
44 Claims
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1. A method for enabling concurrent testing, comprising:
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generating a plurality of test objects on a computing device, wherein; the plurality of test objects is generated using derived classes that are based on a base test class; and each of the plurality of test objects corresponds to a separate block in a Device Under Test (DUT); adding, on the computing device, the plurality of test objects to a queue; sending information based on the plurality of test objects to an Automated Test Equipment (ATE); and causing the ATE to concurrently test the separate blocks in the DUT using the plurality of test objects. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A computing device for enabling concurrent testing, comprising:
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a processor; memory in electronic communication with the processor; instructions stored in the memory, the instructions being executable to; generate a plurality of test objects, wherein; the plurality of test objects is generated using derived classes that are based on a base test class; and each of the plurality of test objects corresponds to a separate block in a Device Under Test (DUT); add the plurality of test objects to a queue; send information based on the plurality of test objects to an Automated Test Equipment (ATE); and cause the ATE to concurrently test the separate blocks in the DUT using the plurality of test objects. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38)
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39. A computer-program product for enabling concurrent testing comprising a non-transitory tangible computer-readable medium having instructions thereon, the instructions comprising:
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code for causing a computing device to generate a plurality of test objects, wherein; the plurality of test objects is generated using derived classes that are based on a base test class; and each of the plurality of test objects corresponds to a separate block in a Device Under Test (DUT); code for causing the computing device to add the plurality of test objects to a queue; code for causing the computing device to send information based on the plurality of test objects to an Automated Test Equipment (ATE); and code for causing the computing device to cause the ATE to concurrently test the separate blocks in the DUT using the plurality of test objects. - View Dependent Claims (40, 41)
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42. An apparatus for enabling concurrent testing, comprising:
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means for generating a plurality of test objects, wherein; the plurality of test objects is generated using derived classes that are based on a base test class; and each of the plurality of test objects corresponds to a separate block in a Device Under Test (DUT); means for adding the plurality of test objects to a queue; means for sending information based on the plurality of test objects to an Automated Test Equipment (ATE); and means for causing the ATE to concurrently test the separate blocks in the DUT using the plurality of test objects. - View Dependent Claims (43, 44)
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Specification