VOLTAGE GENERATOR TO COMPENSATE SENSE AMPLIFIER TRIP POINT OVER TEMPERATURE IN NON-VOLATILE MEMORY

• US 20110116320A1
• Filed: 11/13/2009
• Published: 05/19/2011
• Est. Priority Date: 11/13/2009
• Status: Active Grant

• Current Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Original Assignee: Sandisk Technologies Incorporated (Western Digital Corporation)
• Inventors: Lee, Seungpil, Zhang, Fanglin, Park, Jong, Chu, Alexander, Mui, Man
• Granted Patent: US 7,974,134 B2
• Time in Patent Office: Days
• US Class Current: 365/185.21
• CPC Class Codes: G11C 11/5642 Sensing or reading circuits; Data output circuits
• CPC Class Codes: G11C 16/26 Sensing or reading circuits; Data output circuits

Abstract

In a non-volatile memory system, a voltage generator provides a voltage to a gate of a voltage-setting transistor which is used in a sense circuit to set an initial voltage at a sense node. At the end of a sense period, a final voltage of the sense node is compared to a trip point, which is the threshold voltage of a voltage-sensing transistor. To account for temperature variations and manufacturing process variations, the voltage generator includes a transistor which is matched to the voltage-setting transistor, and a transistor which is matched to the voltage-sensing transistor. As a result, a voltage swing between the initial voltage and the trip point is constant, even as the initial voltage and trip point vary. In a particular implementation, the voltage generator uses a cascode current mirror circuit, and receives a reference current from a band gap voltage circuit.

Claims

1. Circuitry for use in a non-volatile storage system, comprising:

a current mirror circuit comprising a reference current path and a mirror current path, the reference current path receives a reference current which is mirrored in the minor current path;

a first transistor in the minor current path, the first transistor is matched to a voltage-setting transistor (NHLL) in at least one sense amplifier, and the mirror current path provides a voltage to the voltage-setting transistor, in response to which the voltage-setting transistor sets an initial voltage at a sense node in the at least one sense amplifier at a start of a sensing period;

a resistor connected in series with the current minor circuit; and

a second transistor connected in series with the current minor circuit, the second transistor is matched to a voltage-sensing transistor (NSEN) in the at least one sense amplifier, the voltage-sensing transistor senses a final voltage at the sense node at the end of the sensing period.

2. The circuitry of claim 1, wherein:

the current minor circuit is a cascode current minor circuit in which the reference current path is a reference cascode, and the mirror current path is a mirror cascode.

3. The circuitry of claim 2, wherein:

the mirror cascode includes an additional transistor which is series-connected to the first transistor, and the voltage provided to the voltage-setting transistor is provided from a node which is between the additional transistor and the first transistor.

4. The circuitry of claim 1, wherein:

the sense node is discharged during the sense period, through a bit line and at least one non-volatile storage element, from the initial voltage to the final voltage, and a difference between the initial voltage and the final voltage indicates whether the at least one non-volatile storage element is in a conductive or non-conductive state.

5. The circuitry of claim 4, wherein:

the voltage provided to the voltage-setting transistor varies according to temperature coefficients of the first and second transistors, so that the difference is approximately constant across a range of temperatures.

6. The circuitry of claim 1, wherein:

the reference current exhibits a variation with temperature based on a temperature coefficient, and the resistor has a temperature coefficient which offsets the variation, at least in part.

7. The circuitry of claim 6 wherein:

the resistor is digitally controlled.

8. The circuitry of claim 1, wherein:

the resistor is connected between a drain of the second transistor and the current minor circuit, the drain and a gate of the second transistor are connected to each other, and a source of the second transistor is grounded.

9. The circuitry of claim 1, wherein:

the voltage-setting transistor sets the initial voltage as the voltage provided by the minor current path, less a threshold voltage of the voltage-setting transistor.

10. The circuitry of claim 1, wherein:

the first transistor and the voltage-setting transistor match in that they are arranged in a common orientation on a common substrate, are of a common type and have common physical dimensions; and

the second transistor and the voltage-sensing transistor match in that they are arranged in a common orientation on the common substrate, are of a common type and have common physical dimensions.

11. The circuitry of claim 1, wherein:

the current minor circuit is provided in a voltage generator which provides the voltage from the minor current path to each of a plurality of sense amplifiers.

12. Circuitry for use in a non-volatile storage system, comprising:

a plurality of sense amplifiers, each sense amplifier is associated with at least one non-volatile storage element, each sense amplifier comprise a sense node, a voltage-setting transistor and a voltage-sensing transistor; and

a voltage generator, the voltage generator provides a common voltage to each voltage-setting transistor, each voltage-setting transistor sets an initial voltage at its sense node at a start of a sensing period, based on the common voltage, and each voltage-sensing transistor senses a final voltage at the sense node at the end of the sensing period, the voltage generator comprises first and second transistors connected in series, the first transistor is matched to the voltage-setting transistors, the second transistor is matched to the voltage-sensing transistors, the common voltage is provided at a drain or source of the first transistor, and the common voltage varies with temperature based on temperature coefficients of the first and second transistors.

13. The circuitry of claim 12, further comprising:

a resistor connected in series with the first and second transistors, the voltage generator provides the common voltage based on a reference current, the reference current exhibits a variation with temperature based on a temperature coefficient, and the resistor has a temperature coefficient which offsets the variation, at least in part.

14. The circuitry of claim 12, wherein:

in each sense amplifier, the sense node is discharged during the sense period, through a bit line and the at least one non-volatile storage element, from the initial voltage to the final voltage, and a difference between the initial voltage and the final voltage indicates whether the at least one non-volatile storage element is in a conductive or non-conductive state.

15. The circuitry of claim 14, wherein:

the bit line is kept at a fixed potential during the discharging, and the difference between the initial voltage and the final voltage indicates an amount of current which has been discharged through the bit line and the at least one non-volatile storage element.

16. The circuitry of claim 14, wherein:

the common voltage varies according to temperature coefficients of the first and second transistors, so that the difference is approximately constant across a range of temperatures.

17. A method for operating a non-volatile storage system, comprising:

providing a reference current, the reference current exhibits a variation with temperature based on a temperature coefficient, and the variation is offset, at least in part;

providing a voltage based on the reference current, the voltage exhibits a variation with temperature based on temperature coefficients of first and second transistors, the first transistor is matched to a voltage-setting transistor in a sense amplifier, and the second transistor is matched to a voltage-sensing transistor in the sense amplifier; and

coupling the voltage to the voltage-setting transistor.

18. The method of claim 17, wherein:

the reference current is provided in a reference current path in a current mirror circuit, the first transistor is in a mirror current path of the current mirror circuit, and the resistor and the second transistor are series-connected with one another and with the reference current path and the mirror current path.

19. The method of claim 17, wherein the voltage-setting transistor sets an initial voltage in the sense amplifier at a sense node, based on the voltage coupled to the voltage-setting transistor, and the method further comprises:

discharging the sense node during a sense period, through a bit line and at least one non-volatile storage element, from the initial voltage to a final voltage; and

sensing the final voltage using the voltage-sensing transistor, where a difference between the initial voltage and the final voltage indicates whether the at least one non-volatile storage element is in a conductive or non-conductive state, and the variation of the voltage coupled to the voltage-setting transistor with temperature ensures that the difference is approximately constant across a range of temperatures.

20. The method of claim 19, further comprising:

fixing a potential of the bit line during the discharging, where the difference between the initial voltage and the final voltage indicates an amount of current which has been discharged through the bit line and the at least one non-volatile storage element.