Method of Fabricating Semiconductor Die with Through-Hole Via on Saw Streets and Through-Hole Via in Active Area of Die
First Claim
1. A method of forming a semiconductor device, comprising:
- forming a semiconductor wafer having active areas separated from each other by saw street guides;
forming contact pads on a first surface of the semiconductor wafer within the active areas;
forming a trench in the saw street guides;
filling the trench with organic material;
forming first vias in the organic material;
forming second vias through the contact pads on the active area of the die;
forming conductive traces between the contact pads and first vias;
depositing conductive material in the first vias and second vias to form first conductive vias and second conductive vias, respectively; and
singulating the semiconductor wafer along the saw street guides to separate the active areas of the semiconductor wafer into die.
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Accused Products
Abstract
A semiconductor wafer contains a plurality of die with contact pads disposed on a first surface of each die. Metal vias are formed in trenches in the saw street guides and are surrounded by organic material. Traces connect the contact pads and metal vias. The metal vias can be half-circle vias or full-circle vias. Metal vias are also formed through the contact pads on the active area of the die. Redistribution layers (RDL) are formed on a second surface of the die opposite the first surface. Repassivation layers are formed between the RDL for electrical isolation. The die are stackable and can be placed in a semiconductor package with other die. The vias through the saw streets and vias through the active area of the die, as well as the RDL, provide electrical interconnect to the adjacent die.
22 Citations
22 Claims
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1. A method of forming a semiconductor device, comprising:
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forming a semiconductor wafer having active areas separated from each other by saw street guides; forming contact pads on a first surface of the semiconductor wafer within the active areas; forming a trench in the saw street guides; filling the trench with organic material; forming first vias in the organic material; forming second vias through the contact pads on the active area of the die; forming conductive traces between the contact pads and first vias; depositing conductive material in the first vias and second vias to form first conductive vias and second conductive vias, respectively; and singulating the semiconductor wafer along the saw street guides to separate the active areas of the semiconductor wafer into die. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method of fabricating a semiconductor package, comprising:
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forming a semiconductor wafer including die, contact pads disposed on first surfaces of the die, first conductive vias disposed outside a perimeter of the die, second conductive vias disposed in the die, and conductive traces electrically connecting the first conductive vias to the contact pads; forming redistribution layers (RDLs) on second surfaces of the die opposite the first surfaces; forming repassivation layers between the RDLs on the second surface of the die; singulating the semiconductor wafer to separate the die; stacking the die; and electrically interconnecting the stacked die using the first and second conductive vias. - View Dependent Claims (9, 10, 11)
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12. A method of fabricating a semiconductor package, comprising:
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providing a first die having contact pads and first conductive vias formed along a perimeter of the die, the first conductive vias electrically connected to the contact pads by conductive traces, the first die further including second conductive vias formed through an active area of the die; providing a second die disposed adjacent to the first die; and electrically connecting the first and second die using bond wires and the first conductive vias. - View Dependent Claims (13, 14)
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15. A method of fabricating a semiconductor device, comprising:
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providing a semiconductor wafer including die and contact pads disposed on a first surface of an active area of each die, the semiconductor wafer further including a saw street guide between each die; forming a trench in the saw street guide; filling the trench with an organic material; forming first conductive vias that are surrounded by the organic material; forming second conductive vias in the active area of the die; and connecting the contact pads and the first conductive vias using conductive traces. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22)
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Specification