SEMICONDUCTOR INTEGRATED COMMUNICATION CIRCUIT AND OPERATION METHOD THEREOF

• US 20110128992A1
• Filed: 11/29/2010
• Published: 06/02/2011
• Est. Priority Date: 11/30/2009
• Status: Active Grant

• Current Assignee: Renesas Electronics Corporation
• Original Assignee: Renesas Electronics Corporation
• Inventors: Yamawaki, Taizo, MAEDA, Koji, Akamine, Yukinori
• Granted Patent: US 8,411,730 B2
• Time in Patent Office: Days
• US Class Current: 375/130
• CPC Class Codes: H04B 17/0085 using test signal generators
• CPC Class Codes: H04B 17/21 for calibration; for correcting measurements
• CPC Class Codes: H04L 25/06 Dc level restoring means; Bias distortion correction ; Decision circuits providing symbol by symbol detection
• CPC Class Codes: H04L 27/3863 Compensation for quadrature error in the received signal

Abstract

The semiconductor integrated communication circuit includes:

a low-noise amplifier; a receive mixer; a receive VCO; a demodulation-processing circuit; a modulation-processing circuit; a transmit mixer; a transmit VCO; a second-order-distortion-characteristic-calibration circuit; a quadrature-receive-signal-calibration circuit; and a test-signal generator. The test-signal generator generates first and second test signals using the transmit VCO. In the second-order-distortion-characteristic-calibration mode, the second-order-distortion-characteristic-calibration circuit variably changes an operation parameter of the receive mixer thereby to calibrate the second-order distortion characteristic to achieve its best condition while the first test signal is supplied to the receive mixer. In the quadrature-receive-signal-calibration mode, the quadrature-receive-signal-calibration circuit calibrates IQ mismatch of a quadrature receive signal to achieve the best condition thereof while the second test signal is supplied to the receive mixer. The integrated communication circuit can minimize the increase in chip footprint of a test-signal-generating circuit used to perform calibrations of both the second-order characteristic and IQ mismatch.

Claims

1. A semiconductor integrated communication circuit to be mounted in a radio communication terminal device, and capable of performing radio frequency communication with a base station in transmit and receive modes, the semiconductor integrated communication circuit comprising:

a low-noise amplifier;

a receive mixer;

a receive-voltage-control oscillator;

a demodulation-signal-processing circuit;

a modulation-signal-processing circuit;

a transmit mixer;

a transmit-voltage-control oscillator; and

a set of a second-order-distortion-characteristic-calibration circuit, a quadrature-receive-signal-calibration circuit, and a test-signal generator, the set allowing the communication circuit to work in a second-order-distortion-characteristic-calibration mode, and a quadrature-receive-signal-calibration mode,

wherein the low-noise amplifier amplifies an RF receive signal received through an antenna of the radio communication terminal device,

wherein the receive mixer accepts supply of an amplified RF signal from the low-noise amplifier through one input terminal thereof, and supply of an RF receive local signal produced in response to an oscillating output signal of the receive-voltage-control oscillator through the other input terminal,

wherein the demodulation-signal-processing circuit processes a quadrature-demodulation-receive signal output from an output terminal of the receive mixer thereby to produce an quadrature receive signal,

wherein, in the receive mode, the receive mixer and demodulation-signal-processing circuit take charge of processing the RF receive signal,

wherein the modulation-signal-processing circuit handles a quadrature transmit signal,

wherein the transmit mixer accepts supply of a quadrature transmit output signal from the modulation-signal-processing circuit through one input terminal thereof, and supply of an RF transmit local signal produced in response to an oscillating output signal of the transmit-voltage-control oscillator through the other input terminal,

wherein, in the transmit mode, the transmit mixer produces and outputs an RF transmit signal in response to an oscillating output signal from the transmit-voltage-control oscillator,

wherein the test-signal generator produces a first test signal used in the second-order-distortion-characteristic-calibration mode, and a second test signal used in the quadrature-receive-signal-calibration mode, using an oscillating output signal from the transmit-voltage-control oscillator,

wherein, in the second-order-distortion-characteristic-calibration mode, the second-order-distortion-characteristic-calibration circuit variably changes an operation parameter of the receive mixer, thereby to calibrate a second-order distortion characteristic to achieve its best condition while the first test signal from the test-signal generator is supplied to the receive mixer, and

wherein, in the quadrature-receive-signal-calibration mode, the quadrature-receive-signal-calibration circuit calibrates phase and amplitude mismatches between an in-phase and a quadrature-phase component of the quadrature receive signal produced by the demodulation-signal-processing circuit to achieve a best condition of the signal while the second test signal from the test-signal generator is supplied to the receive mixer.

2. The semiconductor integrated communication circuit according to claim 1,

wherein the low-noise amplifier, receive mixer, receive-voltage-control oscillator, and demodulation-signal-processing circuit constitute one of a direct-down-conversion receiver and a low-IF receiver, and

wherein a surface-acoustic-wave filter, which has been conventionally considered to be connected to one of input and output terminals of the low-noise amplifier of the one receiver, is eliminated.

3. The semiconductor integrated communication circuit according to claim 2, further comprising:

a DC offset calibration circuit connected with the demodulation-signal-processing circuit,

wherein the DC offset calibration circuit executes a DC-offset-calibrating operation for calibrating DC offsets of the in-phase and quadrature-phase components of the quadrature receive signal produced by the demodulation-signal-processing circuit, and

wherein, in the second-order-distortion-characteristic-calibration mode, the DC offset calibration circuit executes the DC-offset-calibrating operation every time the second-order-distortion-characteristic-calibration circuit variably changes the operation parameter of the receive mixer.

4. The semiconductor integrated communication circuit according to claim 3,

Wherein, after power-on of the semiconductor integrated communication circuit, an operation mode of the semiconductor integrated communication circuit is caused to transition in order of the second-order-distortion-characteristic-calibration mode, the quadrature-receive-signal-calibration mode, and the transmit/receive mode in turn,

wherein the quadrature-receive-signal-calibration mode is enabled after the calibration of the second-order distortion characteristic to achieve its best condition, which involves the receive mixer, in the second-order-distortion-characteristic-calibration mode, and

wherein the transmit and receive modes are enabled after the calibration of the second-order distortion characteristic to achieve its best condition, which involves the receive mixer, in the second-order-distortion-characteristic-calibration mode, and after the calibration of the quadrature receive signal to achieve the best condition of the signal in the quadrature-receive-signal-calibration mode.

5. The semiconductor integrated communication circuit according to claim 4, further comprising:

a function for performing a radio frequency communication with a base station using multiple bands,

wherein the operation mode of the semiconductor integrated communication circuit is caused to transition in order of the second-order-distortion-characteristic-calibration mode, and the quadrature-receive-signal-calibration mode in turn for each of the multiple bands.

6. The semiconductor integrated communication circuit according to claim 5, further comprising:

a second oscillator,

wherein the test-signal generator produces a first test signal used in the second-order-distortion-characteristic-calibration mode, and a second test signal used in the quadrature-receive-signal-calibration mode, using a second oscillating output signal from the second oscillator, and the oscillating output signal from the transmit-voltage-control oscillator.

7. The semiconductor integrated communication circuit according to claim 6,

wherein the second oscillator which generates the second oscillating output signal is one of a voltage-control oscillator used by a digital interface, a reference-signal source, and a digital sine-wave signal source.

8. The semiconductor integrated communication circuit according to claim 7, further comprising:

a spreading circuit connected between an input terminal of the test-signal generator and an output terminal of the digital sine-wave signal source; and

a de-spreading circuit connected between an output terminal of the demodulation-signal-processing circuit and an input terminal of the second-order-distortion-characteristic-calibration circuit,

wherein the second oscillator which generates the second oscillating output signal is the digital sine-wave signal source.

9. The semiconductor integrated communication circuit according to claim 7, further comprising:

a test-signal switch; and

a test-signal-variable-gain amplifier,

wherein the first and second test signals which the test-signal generator generates and outputs through an output terminal thereof can be supplied to an input terminal of the test-signal-variable-gain amplifier, and

wherein first and second test amplified signals which the test-signal-variable-gain amplifier generates and outputs through an output terminal thereof can be supplied to the receive mixer through the test-signal switch.

10. The semiconductor integrated communication circuit according to claim 7, further comprising:

a test-signal switch connected between an output terminal of the test-signal generator and an input terminal of the low-noise amplifier,

wherein the first and second test signals which the test-signal generator generates and outputs through the output terminal thereof can be supplied to the input terminal of the low-noise amplifier through the test-signal switch.

11. A method of operating a semiconductor integrated communication circuit to be mounted in a radio communication terminal device, and capable of performing radio frequency communication with a base station in transmit and receive modes, the semiconductor integrated communication circuit comprising:

a low-noise amplifier;

a receive mixer;

a receive-voltage-control oscillator;

a demodulation-signal-processing circuit;

a modulation-signal-processing circuit;

a transmit mixer;

a transmit-voltage-control oscillator; and

a set of a second-order-distortion-characteristic-calibration circuit, a quadrature-receive-signal-calibration circuit, and a test-signal generator, the set allowing the communication circuit to work in a second-order-distortion-characteristic-calibration mode, and a quadrature-receive-signal-calibration mode,

wherein the low-noise amplifier amplifies an RF receive signal received through an antenna of the radio communication terminal device,

wherein the receive mixer accepts supply of an amplified RF signal from the low-noise amplifier through one input terminal thereof, and supply of an RF receive local signal produced in response to an oscillating output signal of the receive-voltage-control oscillator through the other input terminal,

wherein the demodulation-signal-processing circuit processes a quadrature-demodulation-receive signal output from an output terminal of the receive mixer thereby to produce an quadrature receive signal,

wherein, in the receive mode, the receive mixer and demodulation-signal-processing circuit take charge of processing the RF receive signal,

wherein the modulation-signal-processing circuit handles a quadrature transmit signal,

wherein the transmit mixer accepts supply of a quadrature transmit output signal from the modulation-signal-processing circuit through one input terminal thereof, and supply of an RF transmit local signal produced in response to an oscillating output signal of the transmit-voltage-control oscillator through the other input terminal,

wherein, in the transmit mode, the transmit mixer produces and outputs an RF transmit signal in response to an oscillating output signal from the transmit-voltage-control oscillator, and

wherein the test-signal generator produces a first test signal used in the second-order-distortion-characteristic-calibration mode, and a second test signal used in the quadrature-receive-signal-calibration mode, using an oscillating output signal from the transmit-voltage-control oscillator, and

wherein the method of operating a semiconductor integrated communication circuit comprises the steps of;

using the second-order-distortion-characteristic-calibration circuit, in the second-order-distortion-characteristic-calibration mode, to variably change an operation parameter of the receive mixer, thereby to calibrate a second-order distortion characteristic to achieve its best condition while the first test signal from the test-signal generator is supplied to the receive mixer; and

using the quadrature-receive-signal-calibration circuit, in the quadrature-receive-signal-calibration mode, to calibrate phase and amplitude mismatches between in-phase and quadrature-phase components of the quadrature receive signal produced by the demodulation-signal-processing circuit to achieve a best condition of the signal while the second test signal from the test-signal generator is supplied to the receive mixer.

12. The method of operating a semiconductor integrated communication circuit according to claim 11,

wherein the low-noise amplifier, receive mixer, receive-voltage-control oscillator, and demodulation-signal-processing circuit constitute one of a direct-down-conversion receiver and a low-IF receiver, and

wherein a surface-acoustic-wave filter, which has been conventionally considered to be connected to one of input and output terminals of the low-noise amplifier of the one receiver, is eliminated.

13. The method of operating a semiconductor integrated communication circuit according to claim 12,

wherein the semiconductor integrated communication circuit further comprises a DC offset calibration circuit connected with the demodulation-signal-processing circuit,

wherein the DC offset calibration circuit executes a DC-offset-calibrating operation for calibrating DC offsets of the in-phase and quadrature-phase components of the quadrature receive signal produced by the demodulation-signal-processing circuit, and

wherein, in the second-order-distortion-characteristic-calibration mode, the DC offset calibration circuit executes the DC-offset-calibrating operation every time the second-order-distortion-characteristic-calibration circuit variably changes the operation parameter of the receive mixer.

14. The method of operating a semiconductor integrated communication circuit according to claim 13,

Wherein, after power-on of the semiconductor integrated communication circuit, an operation mode of the semiconductor integrated communication circuit is caused to transition in order of the second-order-distortion-characteristic-calibration mode, the quadrature-receive-signal-calibration mode, and the transmit/receive mode in turn,

wherein the quadrature-receive-signal-calibration mode is enabled after the calibration of the second-order distortion characteristic to achieve its best condition, which involves the receive mixer, in the second-order-distortion-characteristic-calibration mode, and

wherein the transmit and receive modes are enabled after the calibration of the second-order distortion characteristic to achieve its best condition, which involves the receive mixer, in the second-order-distortion-characteristic-calibration mode, and after the calibration of the quadrature receive signal to achieve the best condition of the signal in the quadrature-receive-signal-calibration mode.

15. The method of operating a semiconductor integrated communication circuit according to claim 14,

wherein the semiconductor integrated communication circuit further comprises a function for performing a radio frequency communication with a base station using multiple bands, and

wherein the operation mode of the semiconductor integrated communication circuit is caused to transition in order of the second-order-distortion-characteristic-calibration mode, and the quadrature-receive-signal-calibration mode in turn for each of the multiple bands.

16. The method of operating a semiconductor integrated communication circuit according to claim 15,

wherein the semiconductor integrated communication circuit further comprises a second oscillator, and

wherein the test-signal generator produces a first test signal used in the second-order-distortion-characteristic-calibration mode, and a second test signal used in the quadrature-receive-signal-calibration mode, using a second oscillating output signal from the second oscillator, and the oscillating output signal from the transmit-voltage-control oscillator.

17. The method of operating a semiconductor integrated communication circuit according to claim 16,

wherein the second oscillator which generates the second oscillating output signal is one of a voltage-control oscillator used by a digital interface, a reference-signal source, and a digital sine-wave signal source.

18. The method of operating a semiconductor integrated communication circuit according to claim 17,

wherein the semiconductor integrated communication circuit further comprises:

a spreading circuit connected between an input terminal of the test-signal generator and an output terminal of the digital sine-wave signal source; and

a de-spreading circuit connected between an output terminal of the demodulation-signal-processing circuit and an input terminal of the second-order-distortion-characteristic-calibration circuit,

wherein the second oscillator which generates the second oscillating output signal is the digital sine-wave signal source.

19. The method of operating a semiconductor integrated communication circuit according to claim 17,

wherein the semiconductor integrated communication circuit further comprises:

a test-signal switch; and

a test-signal-variable-gain amplifier,

wherein the first and second test signals which the test-signal generator generates and outputs through an output terminal thereof can be supplied to an input terminal of the test-signal-variable-gain amplifier, and

wherein first and second test amplified signals which the test-signal-variable-gain amplifier generates and outputs through an output terminal thereof can be supplied to the receive mixer through the test-signal switch.

20. The method of operating a semiconductor integrated communication circuit according to claim 17,

wherein the semiconductor integrated communication circuit further comprises a test-signal switch connected between an output terminal of the test-signal generator and an input terminal of the low-noise amplifier, and

wherein the first and second test signals which the test-signal generator generates and outputs through the output terminal thereof can be supplied to the input terminal of the low-noise amplifier through the test-signal switch.