Method For Decoding Data In Non-Volatile Storage Using Reliability Metrics Based On Multiple Reads

• US 20110131473A1
• Filed: 02/10/2011
• Published: 06/02/2011
• Est. Priority Date: 03/29/2007
• Status: Active Grant

• Current Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Original Assignee: SanDisk Corporation (Western Digital Corporation)
• Inventors: Chin, Henry, Zhao, Dengtao, Mokhlesi, Nima
• Granted Patent: US 8,468,424 B2
• Time in Patent Office: Days
• US Class Current: 714/773
• CPC Class Codes: G06F 12/00 Accessing, addressing or allocating within memory systems or architectures digital input from, or digital output to record carriers, e.g. to disk storage units, G06F3/06
• CPC Class Codes: G11C 11/5642 Sensing or reading circuits; Data output circuits
• CPC Class Codes: G11C 16/04 using variable threshold transistors, e.g. FAMOS
• CPC Class Codes: G11C 16/28 using differential sensing or reference cells, e.g. dummy cells
• CPC Class Codes: G11C 29/00 Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
• CPC Class Codes: G11C 29/02 Detection or location of defective auxiliary circuits, e.g. defective refresh counters
• CPC Class Codes: G11C 29/028 with adaption or trimming of parameters
• CPC Class Codes: H03M 13/11 using multiple parity bits
• CPC Class Codes: H03M 13/37 Decoding methods or techniques, not specific to the particular type of coding provided for in groups H03M13/03 - H03M13/35

Abstract

Data stored in non-volatile storage is decoded using iterative probabilistic decoding and multiple read operations to achieve greater reliability. An error correcting code such as a low density parity check code may be used. In one approach, initial reliability metrics, such as logarithmic likelihood ratios, are used in decoding read data of a set of non-volatile storage element. The decoding attempts to converge by adjusting the reliability metrics for bits in code words which represent the sensed state. If convergence does not occur, e.g., within a set time period, the state of the non-volatile storage element is sensed again, current values of the reliability metrics in the decoder are adjusted, and the decoding again attempts to converge.

Claims

1. A method for decoding data in non-volatile storage, comprising:

performing a first sense operation on at least one non-volatile storage element;

providing a first code word based on the first sense operation;

performing a decoding process for the first code word using a first set of reliability metrics which is based on the first code word; and

if the decoding process does not meet a first condition, performing a second sense operation on the at least one non-volatile storage element and adjusting the decoding process based on the second sense operation.

2. The method of claim 1, wherein the decoding process attempts to satisfy parity checks of an error correction code, and the decoding process converges when the parity checks are satisfied.

3. The method of claim 2, wherein the error correction code comprises a low density parity check code which is applied over a set of non-volatile storage elements which includes the at least one non-volatile storage element.

4. The method of claim 1, wherein the sense operations comprise read operations.

5. The method of claim 1, wherein the first condition comprises the decoding process converging within a given time period.

6. The method of claim 1, wherein the first condition comprises the decoding process converging within a given number of iterations.

7. The method of claim 1, wherein the first condition comprises the decoding process satisfying a given number of parity checks.

8. The method of claim 1, wherein the first code word comprises bits which indicate whether a voltage threshold of the at least one non-volatile storage element is above or below each of a plurality of different voltage threshold levels, as indicated by the first sense operation.

9. The method of claim 1, wherein, if the decoding process does not meet a second condition, the method further comprises:

performing a third sense operation on the at least one non-volatile storage element; and

adjusting the decoding process based on the third sense operation.

10. The method of claim 1, wherein the first set of reliability metrics comprises logarithmic likelihood ratios, the first code word comprises multiple bits, and the logarithmic likelihood ratios are provided for each bit.

11. The method of claim 1, wherein the first code word comprises multiple bits in respective bit positions, and the first set of reliability metrics includes reliability metrics for each bit.

12. The method of claim 11, wherein for at least one of the bit positions of the first code word, the reliability metric is adjusted to indicate a higher reliability when a sensed programming state of the first sense operation is consistent with a sensed programming state of the second sense operation.

13. The method of claim 11, wherein for at least one of the bit positions of the first code word, the reliability metric is adjusted to indicate a lower reliability when a sensed programming state of the first sense operation is inconsistent with a sensed programming state of the second sense operation.

14. The method of claim 11, wherein for each bit position, the reliability metric in the first set of reliability metrics represents a probability that the associated bit is not errored.

15. The method of claim 1, wherein the decoding process is adjusted based on:

(a) reliability metrics which are based on the second sense operation and (b) reliability metrics in the adjusted decoding process.

16. The method of claim 1, wherein the decoding process is adjusted based on a sum which includes:

(a) reliability metrics which are based on the second sense operation and (b) reliability metrics in the adjusted decoding process.

17. A non-volatile storage system, comprising:

a set of non-volatile storage elements; and

one or more control circuits in communication with the set of non-volatile storage elements, the one or more control circuits perform a first sense operation on at least one non-volatile storage element of the set, provide a first code word based on the first sense operation, perform a decoding process for the first code word using a first set of reliability metrics which is based on the first code word, and if the decoding process does not meet a first condition, perform a second sense operation on the at least one non-volatile storage element and adjust the decoding process based on the second sense operation.

18. The non-volatile storage system of claim 17, wherein the first condition comprises the decoding process converging within a given time period, converging within a given number of iterations, or satisfying a given number of parity checks.

19. The non-volatile storage system of claim 17, wherein the first code word comprises bits which indicate whether a voltage threshold of the at least one non-volatile storage element is above or below each of a plurality of different voltage threshold levels, as indicated by the first sense operation.

20. The non-volatile storage system of claim 17, wherein if the decoding process does not meet a second condition, the one or more control circuits perform a third sense operation on the at least one non-volatile storage element and adjust the decoding process based on the third sense operation.

21. The non-volatile storage system of claim 17, wherein the first set of reliability metrics comprises logarithmic likelihood ratios, the first code word comprises multiple bits, and the logarithmic likelihood ratios are provided for each bit.

22. The non-volatile storage system of claim 17, wherein the decoding process is adjusted based on:

(a) reliability metrics which are based on the second sense operation and (b) reliability metrics in the adjusted decoding process.