Techniques to Enhance Selectivity of Electrical Breakdown of Carbon Nanotubes
First Claim
1. A method comprising:
- providing a substrate;
forming on a surface of the substrate a mixture of semiconducting and metallic carbon nanotubes;
on the mixture, patterning a first slot and second slot, each having a width W and a spacing S between the first and second slot, wherein W is less than S;
etching the mixture in the slots;
removing the patterning;
forming drain and source electrodes contacting ends of the mixture; and
biasing the drain and source electrode with voltage to remove the metallic carbon nanotubes.
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Abstract
Techniques are used to fabricate carbon nanotube devices. These techniques improve the selective removal of undesirable nanotubes such as metallic carbon nanotubes while leaving desirable nanotubes such as semiconducting carbon nanotubes. In a first technique, slot patterning is used to slice or break carbon nanotubes have a greater length than desired. By altering the width and spacing of the slotting, nanotubes have a certain length or greater can be removed. Once the lengths of nanotubes are confined to a certain or expected range, the electrical breakdown approach of removing nanotubes is more effective. In a second technique, a Schottky barrier is created at one electrode (e.g., drain or source). This Schottky barrier helps prevent the inadvertent removal the desirable nanotubes when using the electrical breakdown approach. The first and second techniques can be used individually or in combination with each other.
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Citations
20 Claims
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1. A method comprising:
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providing a substrate; forming on a surface of the substrate a mixture of semiconducting and metallic carbon nanotubes; on the mixture, patterning a first slot and second slot, each having a width W and a spacing S between the first and second slot, wherein W is less than S; etching the mixture in the slots; removing the patterning; forming drain and source electrodes contacting ends of the mixture; and biasing the drain and source electrode with voltage to remove the metallic carbon nanotubes. - View Dependent Claims (2, 3, 4, 5)
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6. A method comprising:
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providing a silicon substrate; forming on a surface of the substrate a mixture of semiconducting and metallic carbon nanotubes; forming drain and source electrodes contacting ends of the mixture, wherein between a first end of the mixture and the source electrode is a Schottky barrier contact; and biasing the drain and source electrode with voltage to remove the metallic carbon nanotubes. - View Dependent Claims (7, 8)
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9. A method comprising:
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providing a substrate; forming on a surface of the substrate a mixture of semiconducting and metallic carbon nanotubes; forming a source electrode comprising a Schottky barrier contact that couples to first ends of the mixture; forming a drain electrode that electrically couples to second ends of the mixture; and biasing the drain and source electrode with a voltage to remove the metallic carbon nanotubes. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification