Localized Shockwave-Induced Tissue Disruption

• US 20110144638A1
• Filed: 12/14/2009
• Published: 06/16/2011
• Est. Priority Date: 12/14/2009
• Status: Abandoned Application

• Current Assignee: Alcon Research Limited (Nestle SA)
• Original Assignee: Alcon Research Limited (Nestle SA)
• Inventors: Huculak, John C., Kovalcheck, Steven W., Heeren, Tammo
• Application Number:
  US12/637,362
• Publication Number:
  US 20110144638A1
• Time in Patent Office: Days
• US Class Current: 606/41
• CPC Class Codes: A61F 9/00736 Instruments for removal of intra-ocular material or intra-ocular injection, e.g. cataract instruments A61F9/008 takes precedence

Abstract

A high-intensity pulsed-electrical-field (HIPEF) apparatus removes ocular tissue from a localized portion of an eye by delivering one or more focused shockwaves to that tissue. In one embodiment, for example, the apparatus generates one or more electrical pulses, delivers the one or more focused shockwaves to ocular tissue by applying the generated electrical pulses to a HIPEF probe, and then removes the ocular tissue disrupted by the one or more focused shockwaves via aspiration. To mitigate risk of damage to adjacent ocular tissue, the apparatus delivers the one or more focused shockwaves with energy substantially limited to the tissue being removed. The HIPEF apparatus is, therefore, especially advantageous in the context of cataract surgery where cataract tissue need be broken apart and removed without damaging adjacent tissue associated with the lens capsule required to implant an intraocular lens.

Claims

1. A method for removing ocular tissue from a localized portion of an eye during eye surgery, the method comprising:

generating one or more electrical pulses;

delivering one or more focused shockwaves to ocular tissue within a portion of an eye by applying the generated electrical pulses to at least one electrode of a high-intensity pulsed-electrical-field (HIPEF) probe; and

removing from said portion of the eye ocular tissue disrupted by said one or more focused shockwaves.

2. The method of claim 1, wherein said ocular tissue comprises cataract tissue.

3. The method of claim 1, wherein delivering one or more focused shockwaves comprises forming and collapsing cavitation bubbles adjacent said ocular tissue by applying the generated electrical pulses to said at least one electrode of the HIPEF probe.

4. The method of claim 1, wherein delivering one or more focused shockwaves comprises applying the generated electrical pulses to said at least one electrode of the HIPEF probe and temporarily displacing the HIPEF probe.

5. The method of claim 1, wherein delivering one or more focused shockwaves comprises:

applying the generated electrical pulses to said at least one electrode of the HIPEF probe to create a HIPEF; and

inducing displacement of ocular tissue within said portion of the eye by applying the HIPEF to that ocular tissue.

6. The method of claim 1, wherein removing from said portion of the eye ocular tissue disrupted by said one or more focused shockwaves comprises removing the ocular tissue by aspiration.

7. A high-intensity pulsed-electrical-field (HIPEF) apparatus for removing ocular tissue from a localized portion of an eye during eye surgery, the HIPEF apparatus comprising:

a pulse generation circuit configured to generate one or more electrical pulses;

a HIPEF probe comprising at least one electrode and configured to deliver one or more focused shockwaves to ocular issue within a portion of an eye by applying the generated electrical pulses to said at least one electrode; and

an aspiration system configured to remove from said portion of the eye ocular tissue disrupted by said one or more focused shockwaves.

8. The HIPEF apparatus of claim 7, wherein said ocular tissue comprises cataract tissue.

9. The HIPEF apparatus of claim 7, wherein the HIPEF probe is configured to deliver one or more focused shockwaves by forming and collapsing cavitation bubbles adjacent said ocular tissue, by applying the generated electrical pulses to said at least one electrode of the HIPEF probe.

10. The HIPEF apparatus of claim 7, wherein the HIPEF probe is configured to deliver one or more focused shockwaves by applying the generated electrical pulses to said at least one electrode of the HIPEF probe and temporarily displacing the HIPEF probe.

11. The HIPEF apparatus of claim 7, wherein the HIPEF probe is configured to deliver one or more focused shockwaves by:

applying the generated electrical pulses to said at least one electrode of the HIPEF probe to create a HIPEF; and

inducing displacement of ocular tissue within said portion of the eye by applying the HIPEF to that ocular tissue.