CHIP-BASED PROBER FOR HIGH FREQUENCY MEASUREMENTS AND METHODS OF MEASURING
First Claim
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1. A circuit to reduce parasitics of programmable termination in a chip-based prober, comprising at least two biploar transistors in parallel.
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Abstract
A chip-based prober for measuring a device-under-test is provided. The prober includes a probe tip, a voltage and control connector, a chip carrier, and a programmable termination chip. The probe tip is configured to contact the device-under-test. The voltage and control connector is in electrical communication with the probe tip. The programmable termination chip has a plurality of terminations interconnected with the voltage and control connector and the chip carrier through controlled collapsed chip connections.
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Citations
10 Claims
- 1. A circuit to reduce parasitics of programmable termination in a chip-based prober, comprising at least two biploar transistors in parallel.
Specification