SS OCT INTERFEROMETRY FOR MEASURING A SAMPLE

• US 20110157552A1
• Filed: 06/12/2009
• Published: 06/30/2011
• Est. Priority Date: 06/13/2008
• Status: Active Grant

• Current Assignee: Carl Zeiss Meditec AG (Carl-Zeiss-Stiftung)
• Original Assignee: Carl Zeiss Meditec AG (Carl-Zeiss-Stiftung)
• Inventors: Krampert, Gerhard, Hacker, Martin, Bublitz, Daniel
• Granted Patent: US 8,632,181 B2
• Time in Patent Office: Days
• US Class Current: 351/209
• CPC Class Codes: A61B 3/1005 for measuring distances inside the eye, e.g. thickness of the cornea A61B3/11 takes precedence
• CPC Class Codes: A61B 3/102 for optical coherence tomography [OCT]
• CPC Class Codes: A61B 3/113 for determining or recording eye movement
• CPC Class Codes: A61B 3/1173 for examining the eye lens
• CPC Class Codes: A61B 3/12 for looking at the eye fundus, e.g. ophthalmoscopes A61B3/13 takes precedence
• CPC Class Codes: G01B 2290/45 Multiple detectors for detecting interferometer signals
• CPC Class Codes: G01B 2290/70 Using polarization in the interferometer
• CPC Class Codes: G01B 9/02004 using frequency scans
• CPC Class Codes: G01B 9/02007 Two or more frequencies or sources used for interferometric measurement using only beat G01B9/02003
• CPC Class Codes: G01B 9/02027 Two or more interferometric channels or interferometers
• CPC Class Codes: G01B 9/02077 of the object
• CPC Class Codes: G01B 9/02083 characterised by particular signal processing and presentation
• CPC Class Codes: G01B 9/02091 Tomographic interferometers, e.g. based on optical coherence
• CPC Class Codes: G01B 9/02097 Self-interferometers

Abstract

An SS OCT interferometry device for measuring a sample, in particular from an eye. The device interferometrically generates a measuring signal and from the signal a depth-resolved contrast signal of the sample by spectral tuning of the central wavelength of the measurement radiation of a measuring signal, and has a control unit for this purpose. The device includes a sample motion detector, which provides a motion signal indicating movement of or in the sample, the control unit uses the motion signal to correct the measuring signal with respect to measuring errors that are caused by a movement of or in the sample before or during the generation of the depth-resolved contrast signal.

Claims

1-23. -23. (canceled)

24. An SS-OCT interferometer apparatus for measuring a sample or an eye, the apparatus comprising:

a measurement radiation source emitting measurement radiation that is adapted to interferometrically generate a measurement signal and to generate a depth-resolved contrast signal of the sample from the measurement signal by spectral tuning of a central wavelength of the measurement radiation;

a control device;

a sample-motion detector that provides a motion signal to the control device, the motion signal indicating movement of the sample or movement within the sample;

wherein before or during the generation of the depth-resolved contrast signal, the control device corrects the measurement signal with relation to measurement errors that are caused by movements of the sample or movements within the sample that occurred during the tuning of the central wavelength by utilizing the motion signal.

25. The apparatus according to claim 24, wherein the motion signal indicates an optical contrast in a reference section which lies in the sample and at a fixed distance from the apparatus.

26. The apparatus according to claim 24, wherein the sample-motion detector detects the movement of a surface of the sample facing the interferometer apparatus selected from a group consisting of the corneal surface, a boundary surface in the sample, a boundary surface of the eye lens or a retina.

27. The apparatus according to claim 24, wherein the sample-motion detector comprises a correction radiation source emitting correction radiation having a spectrally fixed central wavelength to interferometrically generate a correction signal indicating the position of a reference section.

28. The apparatus according to claim 27, wherein the apparatus further comprises:

a sample beam path, through which a part of the measurement radiation emitted from the measurement radiation source illuminates the sample;

a detection beam path, which receives sample measurement radiation that is formed by measurement radiation reflected or scattered back from the sample; and

a detector device that detects the sample measurement radiation and provides a measurement signal; and

wherein the sample-motion detector comprises a correction radiation source which emits correction radiation, and

a part of the correction radiation is coupled into the sample beam path and illuminates the sample, and

the detection beam path receives sample correction radiation that is formed by correction radiation reflected or scattered back from the sample and wherein a detector device is adapted to detect the sample correction radiation separately from the sample measurement radiation, and

the control device generates the correction signal from the detection of the sample correction radiation.

29. The apparatus according to claim 28, wherein the correction radiation differs from the measurement radiation spectrally or in respect of polarization;

and

the detector device splits the sample correction radiations from the sample measurement radiation spectrally or in respect of the polarization, respectively.

30. The apparatus according to claim 27, wherein the control device is adapted to control modulations of the wavelength of the measurement radiation and of the correction radiation in each case around their central wavelength, and the control device is adapted to perform a heterodyne detection to determine the phase functions of the correction signal and of the measurement signal and the control device is further adapted to remove the phase function of the correction signal from the phase function of the measurement signal.

31. The apparatus according to claim 30, wherein, for the modulations, the control device modulates supply currents of the measurement and correction radiation sources.

32. The apparatus according to claim 31, wherein the control device modulates the supply currents with a stability of supply current generation better than 0.8 μ

A.

33. The apparatus according to claim 27, wherein the detector device is adapted for a balanced detection of the sample measurement radiation and the sample correction radiation and the control device determines phase functions of the correction signal and of the measurement signal from results of the balanced detection and removes the phase function of the correction signal from the phase function of the measurement signal.

34. The apparatus according to claim 31, wherein the control device determines an amplitude function of the measurement signal and rescales the amplitude function of the measurement signal such that there is a temporally constant amplitude, and generates the contrast signal by application of Fourier transform to the thus-corrected measurement signal.

35. The apparatus according to claim 33, wherein the control device determines an amplitude function of the measurement signal and rescales the amplitude function of the measurement signal such that there is a temporally constant amplitude to create a corrected measurement signal, and generates the contrast signal by application of Fourier transform to the thus-corrected measurement signal.

36. The apparatus according to claim 24, wherein the apparatus comprises one of the following radiation sources providing the measurement radiation:

an External Cavity Diode Laser, a Distributed Feedback Laser, a Distributed Bragg Reflector Laser, a Vertical Cavity Surface Emitting Laser and a Vertical External Cavity Emitting Laser.

37. The apparatus according to claim 24, wherein the apparatus comprises a radiation source providing the measurement radiation, the source having an operating temperature adjustment device for tuning the central wavelength, wherein the operating temperature adjustment device is controlled by the control device.

38. An SS-OCT method for measuring a sample, or an eye, comprising:

spectrally tuning a central wavelength of a measurement radiation;

generating a measurement signal utilizing interference;

generating a depth-resolved contrast signal of the sample from the measurement signal, detecting movements of the sample or in the sample and generating a motion signal indicating these movements;

correcting the measurement signal in respect of measurement errors which are caused by movements of the sample occurring during the tuning of the control wavelength, wherein the measurement signal is corrected by use of the motion signal and before or during the generation of the depth-resolved contrast signal.

39. The method according to claim 38, wherein the motion signal indicates an optical contrast in a reference section which lies in the sample and at a fixed distance from the apparatus.

40. The method according to claim 38, further comprising detecting a surface of the sample facing the apparatus or a boundary surface in the sample to detect the movements of the sample or in the sample.

41. The method according to claim 38, further comprising using the correction radiation spectrally fixed in its central wavelength to interferometrically generate a correction signal indicating the position of a reference section lying in the sample, the section having a fixed distance to the apparatus and correcting the measurement signal based on changes of the correction signal that occur during the tuning.

42. The method according to claim 40, further comprising

illuminating the sample by a part of the measurement radiation;

and

detecting sample measurement radiation that is formed by measurement radiation reflected or scattered back from the sample to obtain a measurement signal, wherein a part of the correction radiation also illuminates the sample;

detecting sample correction radiation formed by correction radiation reflected or scattered back from the sample independently from the detection of the sample measurement radiation; and

generating the correction signal from the detected sample correction radiation.

43. The method according to claim 42, wherein the correction radiation differs from the measurement radiation spectrally or in respect of the polarization and further comprising splitting the reflected sample correction radiation from the sample measurement radiation spectrally or in respect of the polarization, respectively.

44. The method according to claim 41, further comprising

modulating the wavelengths of the measurement radiation and of the correction radiation around their central wavelengths;

determining the phase functions of the correction signal and of the measurement signal by a heterodyne detection; and

removing the phase function of the correction signal from the phase function of the measurement signal.

45. The method according to claim 44, further comprising modulating supply currents of measurement and correction radiation sources providing the measurement and correction radiations.

46. The method according to claim 45, further comprising modulating the supply currents with a stability of supply current generation better than 0.8 μ

A.

47. The method according to claim 41, further comprising

detecting the sample measurement radiation and the sample correction radiation in a balanced detection;

and

determining the phase functions of the correction signal and of the measurement signal utilizing results of the balanced detection and

removing the phase function of the correction signal from the phase function of the measurement signal.

48. The method according to claim 45, further comprising rescaling an amplitude

function of the measurement signal to comprise a temporally constant amplitude, and generating the contrast signal by calculating and utilizing a Fourier transform of the thus-corrected measurement signal.

49. The method according to claim 47, further comprising rescaling an amplitude

function of the measurement signal to comprise a temporally constant amplitude, and generating the contrast signal by calculating and utilizing a Fourier transform of the thus-corrected measurement signal.

50. The method according to claim 41, further comprising tuning a central wavelength of the measurement radiation via a variation in an operating temperature of a radiation source emitting the measurement radiation.

51. The method according to claim 38, further comprising correcting the measurement signal prior to generating an A-scan contrast signal.