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Enclosed Operating Area for Storage Device Testing Systems

  • US 20110172807A1
  • Filed: 04/17/2009
  • Published: 07/14/2011
  • Est. Priority Date: 04/17/2008
  • Status: Active Grant
First Claim
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1. A storage device testing system comprising:

  • one or more test racks;

    one or more test slots housed by the one or more test racks, each test slot being configured to receive a storage device for testing;

    a transfer station for supplying storage devices to be tested, wherein the one or more test racks and the transfer station at least partially define an operating area;

    automated machinery disposed within the operating area and configured to transfer storage devices between the transfer station and the one or more test slots; and

    a cover at least partially enclosing the operating area, thereby at least partially inhibiting air exchange between the operating area and an environment surrounding the test racks.

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