Enclosed Operating Area for Storage Device Testing Systems

• US 20110172807A1
• Filed: 04/17/2009
• Published: 07/14/2011
• Est. Priority Date: 04/17/2008
• Status: Active Grant

• Current Assignee: Teradyne Incorporated
• Original Assignee: Teradyne Incorporated
• Inventors: Merrow, Brian S.
• Granted Patent: US 8,655,482 B2
• Time in Patent Office: Days
• US Class Current: 700/213
• CPC Class Codes: G11B 17/225 wherein the disks are transferred from a fixed magazine to a fixed playing unit using a moving carriage
• CPC Class Codes: G11B 20/1816 Testing
• CPC Class Codes: G11B 2220/2516 Hard disks
• CPC Class Codes: G11B 27/36 Monitoring, i.e. supervising the progress of recording or reproducing for digital recording G11B20/00 and s.gr.; for monitoring, testing or measuring of TV recorders of the type covered by H04N5/76 and subgroups, see H04N17/06
• CPC Class Codes: G11B 33/144 by detection, control, regulation of the temperature

Abstract

A storage device testing system includes one or more test racks, and one or more test slots housed by the one or more test racks, each test slot being configured to receive a storage device for testing. The storage device testing system also includes a transfer station for supplying storage devices to be tested. The one or more test racks and the transfer station at least partially define an operating area. The storage device testing system can also include automated machinery that is disposed within the operating area and is configured to transfer storage devices between the transfer station and the one or more test slots, and a cover at least partially enclosing the operating area, thereby at least partially inhibiting air exchange between the operating area and an environment surrounding the test racks.

Claims

1. A storage device testing system comprising:

one or more test racks;

one or more test slots housed by the one or more test racks, each test slot being configured to receive a storage device for testing;

a transfer station for supplying storage devices to be tested, wherein the one or more test racks and the transfer station at least partially define an operating area;

automated machinery disposed within the operating area and configured to transfer storage devices between the transfer station and the one or more test slots; and

a cover at least partially enclosing the operating area, thereby at least partially inhibiting air exchange between the operating area and an environment surrounding the test racks.

2. The storage device testing system of claim 1, wherein the cover substantially encloses the operating area, thereby substantially inhibiting air exchange between the operating area and an environment surrounding the test racks.

3. The storage device testing system of claim 1, wherein the cover is connected to the test racks.

4. The storage device testing system of claim 1, wherein the cover is connected to the transfer station.

5. The storage device testing system of claim 1, further comprising a seal disposed between the cover and the test racks, the seal being arranged to inhibit air exchange between the operating area and an environment surrounding the test racks.

6. The storage device testing system of claim 1, further comprising a seal disposed between adjacent ones of the test racks, the seal being arranged to inhibit air exchange between the operating area and an environment surrounding the test racks.

7. The storage device testing system of claim 1, further comprising a seal disposed between the transfer station and an adjacent one of the test racks, the seal being arranged to inhibit air exchange between the operating area and an environment surrounding the test racks.

8. The storage device testing system of claim 1, further comprising a seal disposed between the cover and the transfer station, the seal being arranged to inhibit air exchange between the operating area and an environment surrounding the test racks.

9. The storage device testing system of claim 1, wherein at least one of the test racks comprises:

a test slot compartment comprising at least one of the test slots;

a test electronics compartment comprising test electronics configured to communicate with at least one of the test slots for executing a test algorithm; and

an air mover arranged to move an air flow between the operating area and the test electronics compartment for cooling the test electronics.

10. The storage device testing system of claim 9, wherein the air mover is disposed within the test electronics compartment.

11. The storage device testing system of claim 9, further comprising a heat exchanger disposed within the test electronics compartment, wherein the air mover is configured to direct an air flow across the heat exchanger, and wherein the heat exchanger is configured to cool the air flow.

12. The storage device testing system of claim 11, further comprising a drip pan disposed within the test electronics compartment and arranged to collect condensed moisture from the heat exchanger.

13. The storage device testing system of claim 12, further comprising a float sensor disposed within the drip pan and configured to detect a liquid level in the drip pan.

14. The storage device testing system of claim 13, further comprising at least one computer in communication with the test electronics and the float sensor, wherein the computer is configured to control operation of the test rack based, at least in part, on signals received from the float sensor.

15. The storage device testing system of claim 9, wherein the test electronics compartment is substantially isolated from the test slot compartment such that air flow between the test electronics compartment and the test slot compartment is substantially inhibited.

16. The storage device testing system of claim 9, further comprising an air filter disposed within the test slot compartment arranged to filter air flow passing between the operating area and the test electronics compartment.

17. The storage device testing system of claim 1, wherein the automated machinery comprises at least one robotic arm.

18. The storage device testing system of claim 1, wherein the one or more test racks and the transfer station are supported on a floor surface, and wherein the cover, the test racks, the transfer station, and the floor surface substantially enclose the operating area such that air exchange between the operating area and an environment surrounding the test racks is substantially inhibited.

19. The storage device testing system of claim 1, wherein the test racks and the transfer station are arranged in at least a partially closed polygon about the automated machinery.