×

VEHICLE REPAIR/REPLACEMENT INFORMATION MANAGEMENT SYSTEM, AND VEHICLE ABNORMALITY CAUSE INFORMATION MANAGEMENT SYSTEM

  • US 20110172879A1
  • Filed: 08/11/2009
  • Published: 07/14/2011
  • Est. Priority Date: 09/11/2008
  • Status: Abandoned Application
First Claim
Patent Images

1. A system for managing vehicle repair/replacement information comprising:

  • a repair/replacement information acquisition device that acquires repair/replacement information that represents a content of repair or parts replacement that has been actually performed to remove an abnormality of a vehicle;

    a vehicle state information acquisition device that acquires vehicle state information at an occurrence of abnormality of the vehicle, said vehicle state information representing a state of the vehicle;

    a storage device that stores the acquired vehicle state information and the acquired repair/replacement information as a plurality of units of supervised training data in each of which the vehicle state information and the repair/replacement information are associated; and

    an information processing device that detects a feature of the vehicle state information of each unit of supervised training data stored in the storage device, and that retains a unit of supervised training data if the content of repair or parts replacement described by the repair/replacement information contained in the unit of supervised training data accords with the content of repair or replacement described by the repair/replacement information contained in another unit of supervised training data stored whose detected feature is most closely correlated to the detected feature of the unit, and does not use a unit of supervised training data if the content of repair or parts replacement described by the repair/replacement information contained in the unit of supervised training data does not accord with the content of repair or replacement described by the repair/replacement information contained in another unit of supervised training data stored whose detected feature is most closely correlated to the detected feature of the unit.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×