RELIABILITY AND PERFORMANCE OF A SYSTEM-ON-A-CHIP BY PREDICTIVE WEAR-OUT BASED ACTIVATION OF FUNCTIONAL COMPONENTS
First Claim
1. A processor-implemented method for determining aging of a processing unit in a processor the method comprising:
- calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit;
combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and
determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.
2 Assignments
0 Petitions
Accused Products
Abstract
A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.
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Citations
24 Claims
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1. A processor-implemented method for determining aging of a processing unit in a processor the method comprising:
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calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A processor-implemented method for determining aging of a processing unit in a processor the method comprising:
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calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; exposing an aging analyzer to analogous workload factors as the processing unit wherein the age analyzer mimics a critical timing path of the processing unit the age analyzer measures; combining the effective aging profile, process variation data and aging analyzer data; and determining aging through the aging analyzer of the processing unit using the effective aging profile, the process variation data and the aging sensor data. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A computer system for determining aging of a processing unit in a processor, the system comprising:
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a memory; a processor in communications with the computer memory, wherein the computer system is capable of performing a method comprising; calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit. - View Dependent Claims (16, 17, 18)
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19. A computer program product for determining aging of a processing unit in a processor, the computer program product comprising:
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a storage medium readable by a processing circuit and storing instructions for execution by the processing circuit for performing a method comprising; calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.
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20. A computer system for determining aging of a processing unit in a processor, the system comprising:
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a memory; a processor in communications with the computer memory, wherein the computer system is capable of performing a method comprising; calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; exposing an aging analyzer to analogous workload factors as the processing unit wherein the age analyzer mimics a critical timing path of the processing unit the age analyzer measures; combining the effective aging profile, process variation data and aging analyzer data; and determining aging through the aging analyzer of the processing unit using the effective aging profile, the process variation data and the aging sensor data. - View Dependent Claims (21, 22, 23)
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24. A computer program product for determining aging of a processing unit in a processor, the computer program product comprising:
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a storage medium readable by a processing circuit and storing instructions for execution by the processing circuit for performing a method comprising; calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; exposing an aging analyzer to analogous workload factors as the processing unit wherein the age analyzer mimics a critical timing path of the processing unit the age analyzer measures; combining the effective aging profile, process variation data and aging analyzer data; and determining aging through the aging analyzer of the processing unit using the effective aging profile, the process variation data and the aging sensor data.
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Specification