PROGRAMMABLE METALLIZATION CELL WITH ION BUFFER LAYER
First Claim
1. A programmable metallization device, comprising:
- a first electrode;
a memory layer electrically coupled to the first electrode;
an ion-supplying layer containing a source of ions of a first metal element capable of diffusion into and out of the memory layer;
a conductive ion buffer layer between the ion-supplying layer and the memory layer, and which allows diffusion therethrough of said ions; and
a second electrode electrically coupled to the ion-supplying layer.
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Accused Products
Abstract
A programmable metallization device, comprises a first electrode; a memory layer electrically coupled to the first electrode and adapted for electrolytic formation and destruction of a conducting bridge therethrough; an ion-supplying layer containing a source of ions of a first metal element capable of diffusion into and out of the memory layer; a conductive ion buffer layer between the ion-supplying layer and the memory layer, and which allows diffusion therethrough of said ions; and a second electrode electrically coupled to the ion-supplying layer. Circuitry is coupled to the device to apply bias voltages to the first and second electrodes to induce creation and destruction of conducting bridges including the first metal element in the memory layer. The ion buffer layer can improve retention of the conducting bridge by reducing the likelihood that the first metallic element will be absorbed into the ion supplying layer.
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Citations
31 Claims
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1. A programmable metallization device, comprising:
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a first electrode; a memory layer electrically coupled to the first electrode; an ion-supplying layer containing a source of ions of a first metal element capable of diffusion into and out of the memory layer; a conductive ion buffer layer between the ion-supplying layer and the memory layer, and which allows diffusion therethrough of said ions; and a second electrode electrically coupled to the ion-supplying layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method for manufacturing a programmable metallization device, comprising:
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forming a first electrode; forming a memory layer electrically coupled to the first electrode; forming an ion-supplying layer containing a source of ions of a first metal element capable of diffusion into and out of the memory layer; forming a conductive ion buffer layer between the ion supplying layer and the memory layer, and which allows diffusion therethrough of said ions; and forming a second electrode electrically coupled to the ion supplying layer. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. A method for manufacturing a programmable metallization device, comprising:
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forming a first electrode; forming a memory layer electrically coupled to the first electrode and adapted for electrolytic formation and destruction of a conducting bridge therethrough by an electrolytic reaction with an ion of a first metal element; depositing a metal layer on the memory layer, said metal layer not including the first metal element; depositing a chalcogenide on the metal layer; forming a second electrode electrically coupled to the chalcogenide; and annealing the metal layer and chalcogenide to form a compound between the memory layer and the chalcogenide including the metal from the metal layer and a chalcogen from the chalcogenide. - View Dependent Claims (26, 27, 28, 29, 30, 31)
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Specification