METHOD FOR EJECTING A TEST STRIP FROM A TEST METER

• US 20110186588A1
• Filed: 02/04/2010
• Published: 08/04/2011
• Est. Priority Date: 02/04/2010
• Status: Abandoned Application

• Current Assignee: LifeScan Scotland Limited (Johnson & Johnson)
• Original Assignee: LifeScan Scotland Limited (Johnson & Johnson)
• Inventors: DeANGELI, Marco, VALSECCHI, Luca
• Application Number:
  US12/700,570
• Publication Number:
  US 20110186588A1
• Time in Patent Office: Days
• US Class Current: 221/1
• CPC Class Codes: G01N 33/4875 Details of handling test elements, e.g. dispensing or storage, not specific to a particular test method test-elements per se B01L, automatic analysers G01N35/00, in-vivo analysis on the human body for medical diagnosis A61B

Abstract

A method for ejecting a test strip from a test meter includes initiating activation of a test strip ejection mechanism that is in a pre-ejection state. In the method, the test strip ejection mechanism includes a shape memory alloy strip that exhibits a solid state transition temperature and has a programmed configuration and a deformed configuration. In the test strip ejection mechanism pre-ejection state, a test strip has been received within a test strip receiving port of the test meter and the shape memory alloy strip is in the deformed configuration. The method also includes heating, in response to the initiation step, the shape memory alloy strip from below the solid state transition temperature to above the solid state transition temperature. The heating results in the shape memory alloy strip undergoing a transformation from the deformed configuration to the programmed configuration. The method also includes applying a force produced by the transformation from the deformed configuration to the programmed configuration to the test strip and, thereby, ejecting the test strip from the test strip receiving port.

Claims

1. A method for ejecting a test strip from a test meter comprising:

initiating activation of a test strip ejection mechanism in a pre-ejection state, the test strip activation mechanism including a shape memory alloy strip that exhibits a solid state transition temperature and that has a programmed configuration and a deformed configuration, wherein in the pre-ejection state a test strip has been received within a test strip receiving port of the test meter and the shape memory alloy strip is in the deformed configuration;

heating, in response to the initiation step, the shape memory alloy strip from below the solid state transition temperature to above the solid state transition temperature such that the shape memory alloy strip undergoes a transformation from the deformed configuration to the programmed configuration, wherein the transformation produces a force; and

applying the force produced by the transformation to the test strip and thereby ejecting the test strip from the test meter.

2. The method of claim 1 further including the steps of:

cooling, subsequent to the transferring step, the shape memory alloy strip from above the solid state transition temperature to below the solid state transition temperature.

4. The method of claim 2 further including the step of:

returning the shape memory allow strip to the deformed configuration of the pre-ejection state.

5. The method of claim 1 wherein the heating step is accomplished by forcing a current through the shape memory alloy strip using a heating module of the test strip ejection mechanism.

6. The method of claim 1 wherein the heating step transforms the applying step is accomplished via a slider of the test strip ejection mechanism.

7. The method of claim 1 wherein the shape memory alloy strip is a shape memory alloy wire.

8. The method of claim 7 wherein the shape memory alloy wire is formed of a Nickel-Titanium shape memory alloy.

9. The method of claim 1 wherein the heating step produces a force as the shape memory alloy strip transforms from an essentially bowed configuration to an essentially a straight-line programmed configuration.

10. The method of claim 9 wherein the straight-line programmed configuration is essentially perpendicular to a test strip ejection direction.

3. The method of step 2 wherein the cooling is accomplished by natural convection in the absence of heating by a heating module of the test strip ejection mechanism and the shape memory alloy strip is cooled to ambient room temperature.