METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DEVICE ON THE BASIS OF A MONODIRECTIONAL PROBE
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Abstract
In a method and a machine for testing an electronic device, in which the magnetic field emitted is measured by a monodirectional measurement probe, a first value of the component Bz of the magnetic field along axis ZZ′ is measured by the probe and recorded. The probe and the electronic device are displaced with respect to one another by relative pivoting about an axis XX′ orthogonal to axis ZZ′, according to an angular amplitude of less than 90° while maintaining distance d0 and, for each position (x, y) of axis ZZ′, a second value of component Bz of the magnetic field along axis ZZ′ is measured by the probe and recorded, then the value of component By of the magnetic field along axis YY′ orthogonal to axes ZZ′ and XX′ is determined and recorded on the basis of the first value and the second value which have been obtained.
12 Citations
35 Claims
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1-16. -16. (canceled)
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17. A method for testing an electronic device, in which the magnetic field emitted by at least one circulation of electric current in the electronic device is measured by a monodirectional measurement probe adapted to be able to deliver a signal representative of the value of a component Bz of said magnetic field along a predetermined axis ZZ′
- which is fixed with respect to said probe,
wherein; the probe being brought to a distance d0 in front of one face of the electronic device with the axis ZZ′
secant with the electronic device, and the electronic device being supplied with electrical energy and with predetermined input signals applied to input terminals of the electronic device, for each position (x, y) of the axis ZZ′
with respect to said face, a first value Bz1 of the component of the magnetic field Bz along the axis ZZ′
is measured by the probe and recorded,then the probe and the electronic device are displaced with respect to one another by relative pivoting about an axis XX′
orthogonal to the axis ZZ′
according to an angular amplitude a of less than 90°
, the probe being kept at the same distance d0 in front of the same face of the electronic device, and, the electronic device being supplied with electrical energy and with predetermined input signals, for each position (x, y) of the axis ZZ′
with respect to said face, a second value Bz2 of the component Bz of the magnetic field along the axis ZZ′
is measured by the probe and recorded,then the value of a component By of the magnetic field along an axis YY′
orthogonal to the axes ZZ′ and
XX′
is determined and recorded for each position (x, y) of the axis ZZ′
on the basis of the first value Bz1 and the second value Bz2 which have been obtained. - View Dependent Claims (18, 19, 21, 23, 24, 25, 33, 34, 35)
- which is fixed with respect to said probe,
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26. A machine for testing an electronic device, comprising:
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a monodirectional measurement probe adapted to be able to deliver a signal representative of the value of a component Bz, along a predetermined axis ZZ′
which is fixed with respect to said probe, of the magnetic field emitted in the vicinity of the probe by at least one circulation of electric current in the electronic device,a support for receiving an electronic device, and means for supplying this electronic device with electrical energy and with predetermined input signals applied to input terminals of the electronic device, a mechanism suitable for placing the probe and an electronic device received in the reception support with respect to one another, with the axis ZZ′
secant with the reception support,means for recording values corresponding to the signals delivered by the probe, wherein; said mechanism is configured to make it possible to modify, for each position (x, y) of the axis ZZ′
with respect to the electronic device, the orientation of the probe and the electronic device with respect to one another, by relative pivoting about an axis XX′
orthogonal to the axis ZZ′
according to an angular amplitude of less than 90°
, the probe being kept at a distance d0 in front of the same face of the electronic device,said test machine comprises calculation means configured to determine and record, for each position (x, y) of the axis ZZ′
, the value of a component By of the magnetic field along an axis YY′
orthogonal to the axes ZZ′ and
XX′
, on the basis of a first value Bz1 of the component Bz of the magnetic field along the axis ZZ′
as measured by the probe in a first relative angular position of the probe and of the electronic device with respect to the axis XX′
, and of a second value Bz2 of the component Bz of the magnetic field along the axis ZZ′
as measured by the probe in a second relative angular position of the probe and of the electronic device with respect to the axis XX′
, and at the same distance d0, said first and second angular positions with respect to the axis XX′
being separated from one another by an angle of less than 90°
. - View Dependent Claims (27, 28, 29, 30, 31, 32)
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Specification