CHUCKS FOR SUPPORTING SOLAR CELL IN HOT SPOT TESTING

• US 20110193561A1
• Filed: 02/10/2010
• Published: 08/11/2011
• Est. Priority Date: 02/10/2010
• Status: Active Grant

• Current Assignee: Maxeon Solar Pte Limited
• Original Assignee: Sunpower Corporation (Totalenergies Se)
• Inventors: Abas, Emmanuel, Capulong, Jose Francisco
• Granted Patent: US 8,519,729 B2
• Time in Patent Office: Days
• US Class Current: 324/501
• CPC Class Codes: B23Q 3/18 for positioning only
• CPC Class Codes: G01R 1/04 Housings; Supporting members; Arrangements of terminals
• CPC Class Codes: G01R 31/26 Testing of individual semiconductor devices testing or measuring during manufacture or treatment H01L22/00; testing of photovoltaic devices H02S50/10
• CPC Class Codes: H01L 21/67103 mainly by conduction
• CPC Class Codes: H01L 21/6838 with gripping and holding devices using a vacuum; Bernoulli devices
• CPC Class Codes: H01L 21/68757 characterised by a coating or a hardness or a material
• CPC Class Codes: H01L 21/68778 characterised by supporting substrates others than wafers, e.g. chips
• CPC Class Codes: H02S 50/10 Testing of PV devices, e.g. of PV modules or single PV cells testing of semiconductor devices during manufacturing H01L22/00
• CPC Class Codes: Y02E 10/50 Photovoltaic [PV] energy
• CPC Class Codes: Y10T 279/11 Vacuum

Abstract

In an embodiment, a chuck to support a solar cell in hot spot testing is provided. This embodiment of the chuck comprises a base portion and a support portion disposed above the base portion. The support portion is configured to support the solar cell above the base portion and to define a space between a bottom surface of the solar cell and the base portion that thermally separates a portion of the bottom surface of the solar cell from the base portion.

Claims

1. A chuck to support a solar cell having a top surface and a bottom surface in hot spot testing, the chuck comprising:

a base portion;

a support portion disposed above the base portion, the support portion to support the solar cell above the base portion and to define a space, between the bottom surface of the solar cell and the base portion, that thermally separates a portion of the bottom surface of the solar cell from the base portion, the portion of the bottom surface being thermally separated comprising between about 70% and about 90% of the bottom surface, the bottom surface having metal conductors, and the top surface being absent of any metal conductors; and

a bore through the base portion and the support portion, the bore to allow a probe to make contact with the metal conductors through the bore, the probe being to apply a negative bias voltage to the solar cell.

2. The chuck of claim 1, wherein the chuck is heated during the hot spot testing, and wherein the space reduces an amount of heat transferred from the base portion of the chuck to the solar cell.

3. The chuck of claim 2, wherein the amount of heat transferred is reduced to between about 0.020 W/(m*K) and 0.030 W/(m*K).

4. The chuck of claim 1, wherein a portion of the support portion comprises straight channels, and wherein a number of the straight channels is to contact a corner of the solar cell and to reduce surface contact of the support portion with the corner.

5. The chuck of claim 1, wherein the chuck comprises a vacuum tunnel having openings at two ends, one of the openings being located within substantially a same region of the bore and another of the openings being located at a side of the chuck.

6. The chuck of claim 1, wherein the chuck is comprised of a plastic polymer.

7. The chuck of claim 6, wherein the plastic polymer has a thermal conductivity between about 0.250 W/(m*k) and about 0.288 W/(m*k).

8. The chuck of claim 6, wherein the plastic polymer has a tensile strength between about 95 MPa and about 100 MPa.

9. A hot spot testing apparatus, comprising:

a thermal imaging camera to detect heat distribution over a top surface of a solar cell, the top surface being absent any metal conductors;

a chuck disposed below the thermal imaging camera, the chuck comprising a base portion and a support portion to support the solar cell above the base portion and to define a space, between a bottom surface of the solar cell and the base portion, that thermally separates a portion of the bottom surface of the solar cell from the base portion, the bottom surface having the metal conductors, and the chuck further having a bore through at least the base portion; and

a probe disposed below the chuck, the probe to make contact with the metal conductors through the bore and to apply a negative bias voltage to the solar cell.

10. The hot spot testing apparatus of claim 9, further comprising an additional chuck disposed below the thermal imaging camera, the additional chuck comprising an additional base portion and an additional support portion to support the solar cell above the additional base portion and to define an additional space, between the bottom surface of the solar cell and the additional base portion, that thermally separates an additional portion of the bottom surface of the solar cell from the additional base portion.

11. The hot spot testing apparatus of claim 10, wherein the chuck is separated from the additional chuck by a channel.

12. The hot spot testing apparatus of claim 10, wherein at least about 26% of the bottom surface of the solar cell is supported by the support portion and the additional support portion.

13. A chuck to support a solar cell in hot spot testing, the chuck comprising:

a base portion; and

a support portion disposed above the base portion, the support portion to support the solar cell above the base portion and to define a space, between a bottom surface of the solar cell and the base portion, that thermally separates a portion of the bottom surface of the solar cell from the base portion.

14. The chuck of claim 13, wherein a portion of the support portion comprises straight channels, and wherein a number of the straight channels is to contact a corner of the solar cell.

15. The chuck of claim 13, wherein the chuck has a bore through at least the base portion, and wherein the bore is to allow a probe to make contact with the bottom surface of the solar cell through the bore.

16. The chuck of claim 15, wherein the support portion comprises a surface to contact a different portion of the bottom surface of the solar cell, wherein the chuck further comprises a side portion, and wherein the chuck comprises a vacuum tunnel having openings at two ends, one of the openings being located within substantially a same region of the bore, another of the openings being located at the side portion.

17. The chuck of claim 13, wherein the chuck is comprised of a plastic polymer.

18. The chuck of claim 17, wherein the plastic polymer has a thermal conductivity between about 0.250 W/(m*K) and about 0.288 W/(m*K).

19. The chuck of claim 17, wherein the plastic polymer has a tensile strength between about 95 MPa and about 100 MPa.

20. The chuck of claim 13, wherein the portion of the bottom surface of the solar cell that is thermally separated comprises between about 70% to about 90% of the bottom surface.

21. A method of hot spot testing a solar cell having a top surface and a bottom surface, the method comprising:

transporting the solar cell over a chuck, the chuck comprising;

a base portion,

a support portion disposed above the base portion, the support portion to support the solar cell above the base portion and to define a space, between the bottom surface of the solar cell and the base portion, that thermally separates a portion of the bottom surface of the solar cell from the base portion, the portion of the bottom surface being thermally separated comprising between about 70% and about 90% of the bottom surface, the bottom surface having metal conductors, and the top surface being absent of any metal conductors,

a bore through the base portion and the support portion,

a side portion, and

a vacuum tunnel having openings at two ends, one of the openings being located within substantially a same region of the bore and another of the openings being located at the side portion;

applying a vacuum suction through the vacuum tunnel to hold the solar cell in place;

applying a negative bias voltage to the solar cell through the metal conductors; and

detecting a heat distribution of the top surface upon application of the negative bias voltage.