ANALYSIS APPARATUS

• US 20110198501A1
• Filed: 12/18/2009
• Published: 08/18/2011
• Est. Priority Date: 12/25/2008
• Status: Active Grant

• Current Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Original Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Inventors: Takeda, Toshihiko, Ouchi, Toshihiko
• Granted Patent: US 8,698,085 B2
• Time in Patent Office: Days
• US Class Current: 250/343
• CPC Class Codes: A61B 2010/0083 for taking gas samples
• CPC Class Codes: A61B 2562/0238 Optical sensor arrangements for performing transmission measurements on body tissue
• CPC Class Codes: A61B 5/0059 using light, e.g. diagnosis by transillumination, diascopy, fluorescence A61B5/0093, A61B5/1455, A61B5/02416 and A61B5/0261 take precedence
• CPC Class Codes: A61B 5/444 Evaluating skin marks, e.g. mole, nevi, tumour, scar
• CPC Class Codes: A61B 5/6825 Hand
• CPC Class Codes: A61B 5/726 using Wavelet transforms
• CPC Class Codes: G01N 1/405 by adsorption or absorption
• CPC Class Codes: G01N 21/3504 for analysing gases, e.g. multi-gas analysis
• CPC Class Codes: G01N 21/3581 using far infrared light; using Terahertz radiation
• CPC Class Codes: G01N 33/497 of gaseous biological material, e.g. breath

Abstract

An analysis apparatus for analyzing a gas by a terahertz wave or an infrared ray comprises a generator for generating the terahertz wave or the infrared ray; a trapping unit having a trapping film for trapping a gas and being placed to be capable of causing interaction between the gas trapped by the trapping film and the terahertz wave or infrared ray generated by the generator; and a detector for detecting the interaction of the gas with the terahertz wave or infrared ray; wherein the trapping unit comprises a structure for contact with a site evolving the gas; and the structure holds the trapping film separately from the site.

Claims

1. An analysis apparatus for analyzing a gas by a terahertz wave or an infrared ray comprising:

a generator for generating the terahertz wave or the infrared ray;

a trapping unit having trapping films for trapping a gas and being capable of placing the trapping films to cause interaction between the gas trapped by the trapping films and the terahertz wave or infrared ray generated by the generator; and

a detector for detecting the interaction of the gas with the terahertz wave or infrared ray;

wherein the trapping unit comprises a structure for contact with a site evolving the gas;

the structure is provided to hold the trapping films separately from the site; and

each of the trapping films are provided to selectively trap different gases from each other.

3. The analysis apparatus according to claim 1, wherein a part of the trapping films contain a water-repelling porous material or a hygroscopic material for trapping water vapor.

4. The analysis apparatus according to claim 1, wherein the structure is capable of forming a space for collecting the gas to be trapped by the trapping films between the trapping films and the site, and the terahertz wave generated by the generator transmits outside the space.

5. The analysis apparatus according to claim 1, wherein the analysis apparatus has a waveguide for transmitting the terahertz wave or infrared ray generated by the generator, and the trapping films are placed in the region in which the electric field of the terahertz wave or infrared ray transmitting in the waveguide is influential.

6. The analysis apparatus according to claim 4, which further comprises a reflection unit for reflecting the transmitting terahertz wave or infrared ray, and the reflection unit is placed to reflect the transmitting terahertz wave or infrared ray plural times.

7. The analysis apparatus according to claim 1, wherein the structure has a first flow path for introducing a gas from outside the structure, and a second flow path for discharging a gas existing between the structure and the site by the gas introduced from the first flow path.

8. The analysis apparatus according to claim 1, which further comprises a processing unit, wherein

the trapping films comprise a first trapping film for selectively trapping a first gas and a second trapping film for selectively trapping a second gas that is different from the first gas;

and

the processing unit analyzes the first gas and the second gas based on a detecting result of the detector.

2. (canceled)

9. An analysis apparatus for analyzing a gas by a terahertz wave comprising:

a generator for generating the terahertz wave;

a trapping film for trapping the gas; and

a detector for detecting the terahertz wave which has transmitted through or reflected at the trapping film.

10. An analysis apparatus for analyzing a gas evolved from a skin by a terahertz wave or an infrared ray comprising:

a generator for generating the terahertz wave or the infrared ray;

a trapping film for trapping the gas;

a detector for detecting the terahertz wave or infrared ray which has transmitted through or reflected at the trapping film; and

a structure for providing a space between the trapping film and the skin.

11. The analysis apparatus according to claim 10, further comprising:

a film positioned between the trapping film and the skin, which film containing a water-repelling material or a hygroscopic material.