METHOD AND IMAGE SENSOR PIXEL WITHOUT ADDRESS TRANSISTOR

• US 20110205417A1
• Filed: 05/03/2011
• Published: 08/25/2011
• Est. Priority Date: 12/22/2006
• Status: Active Grant

• Current Assignee: Intellectual Ventures II LLC (Intellectual Ventures LLC)
• Original Assignee: Crosstek Capital LLC (Intellectual Ventures LLC)
• Inventors: Hynecek, Jaroslav
• Granted Patent: US 8,558,931 B2
• Time in Patent Office: Days
• US Class Current: 348/308
• CPC Class Codes: H01L 27/14603 Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
• CPC Class Codes: H04N 25/00 Circuitry of solid-state image sensors [SSIS]; Control thereof

Abstract

The invention describes in detail a solid-state CMOS image sensor, specifically the CMOS image sensor pixel that has only two row lines per pixel, pinned photodiode for sensing light, and one or two column lines. The pixel does not have an address transistor and the sensing and reset transistors are both MOS p-channel type. This architecture results in a low noise operation with a very small output transistor random noise. In addition this new pixel architecture allows for the standard CDS signal processing operation, which reduces the pixel to pixel non-uniformities and minimizes kTC reset noise. The pixel has high sensitivity, high conversion gain, high response uniformity, and low noise, which is enabled by the efficient 3T pixel layout.

Claims

1-22. -22. (canceled)

23. A method, comprising:

deactivating a reset control line associated with an image sensor pixel;

pulsing a reference voltage line associated with the image sensor pixel while the reset control line is deactivated; and

generating, in response to said pulsing a reference voltage line, an output signal representative of charge for a floating diffusion node of the image sensor pixel.

24. The method of claim 23, further comprising lowering, in response to said pulsing a reference voltage line, the floating diffusion node to a lower voltage level than floating diffusion nodes of other image sensor pixels associated with the reset control line.

25. The method of claim 24, further comprising turning on, in response to said lowering the floating diffusion node to a lower voltage level, a source follower transistor of the image sensor pixel that is configured to generate the output signal when turned on.

26. The method of claim 23, further comprising:

transferring charge collected by a photodiode of the image sensor pixel to the floating diffusion node;

sampling the output signal prior to said transferring to obtain a first sample;

sampling the output signal after said transferring to obtain a second sample; and

determining a sensed value for the image sensor pixel based on the first sample and the second sample.

27. The method of claim 26, further comprising:

activating a transfer control line associated with the image sensor pixel;

wherein said transferring includes transferring, in response to said activating a transfer control line, the charge collected by the photodiode.

28. The method of claim 23, further comprising:

activating a transfer control line associated with the image sensor pixel while the reset control line is deactivated;

wherein said transferring includes transferring, in response to said activating a transfer control line, the charge collected by the photodiode.

29. The method of claim 23, wherein said deactivating a reset control line comprises:

raising a signal level of the reset control line; and

turning off, in response to said raising a signal level, a reset transistor of the image sensor pixel that is configured to reset the floating diffusion node when turned on.

30. A method, comprising:

deactivating a reset control line associated with a row of image sensor pixels;

pulsing a reference voltage line associated with a column of image sensor pixels while the reset control line is deactivated; and

generating, in response to said pulsing a reference voltage line, an output signal representative of charge for a floating diffusion node of a selected image sensor pixel in both the row of image sensor pixels and the column of image sensor pixels.

31. The method of claim 30, further comprising lowering, in response to said pulsing a reference voltage line, the floating diffusion node of the selected image sensor pixel to a lower voltage level than floating diffusion nodes of other image sensor pixels in the row of image sensor pixels.

32. The method of claim 30, further comprising turning on, in response to said pulsing a reference voltage line, a source follower transistor of the selected image sensor pixel that is configured to generate the output signal when turned on.

33. The method of claim 30, further comprising:

transferring charge collected by a photodiode of the selected image sensor pixel to the floating diffusion node;

sampling the output signal prior to said transferring to obtain a first sample;

sampling the output signal after said transferring to obtain a second sample; and

determining a sensed value for the selected image sensor pixel based on the first sample and the second sample.

34. The method of claim 33, further comprising:

activating a transfer control line associated with the row of image sensor pixels;

wherein said transferring includes transferring, in response to said activating a transfer control line, the charge collected by the photodiode.

35. The method of claim 33, further comprising:

activating a transfer control line associated with the row of image sensor pixels while the reset control line is deactivated;

wherein said transferring includes transferring, in response to said activating a transfer control line, the charge collected by the photodiode.

36. The method of claim 30, wherein said deactivating a reset control line comprises:

raising a signal level of the reset control line; and

turning off, in response to said raising a signal level, a reset transistor of the image sensor pixel that is configured to reset the floating diffusion node when turned on.

37. A method, comprising:

turning off reset transistors of image sensor pixels in a row of image sensor pixels, wherein the reset transistors are configured to reset respective image sensor pixels when turned on;

selecting an image sensor pixel in the row of image sensor pixels by pulsing a reference voltage line associated with a column of image sensor pixels while the reset transistors for the row of image sensor pixels are turned off; and

generating, in response to said pulsing a reference voltage line, an output signal representative of charge for a floating diffusion node of the selected image sensor.

38. The method of claim 37, further comprising turning on, in response to said pulsing a reference voltage line, a source follower transistor of the selected image sensor pixel that is configured to generate the output signal when turned on.

39. The method of claim 37, further comprising:

transferring charge collected by a photodiode of the selected image sensor pixel to the floating diffusion node;

sampling the output signal prior to said transferring to obtain a first sample;

sampling the output signal after said transferring to obtain a second sample; and

determining a sensed value for the selected image sensor pixel based on the first sample and the second sample.

40. The method of claim 37, further comprising:

turning on transfer transistors of the image sensor pixels in the row of image sensor pixels;

transferring, in response to said turning on transfer transistors, charge collected by a photodiode of the selected image sensor pixel to the floating diffusion node;

sampling the output signal prior to said transferring to obtain a first sample;

sampling the output signal after said transferring to obtain a second sample; and

determining a sensed value for the selected image sensor pixel based on the first sample and the second sample.

41. The method of claim 37, further comprising:

turning on transfer transistors of the image sensor pixels in the row of image sensor pixels while the reset transistors for the image sensor pixels in the row of image sensor pixels are turned off;

transferring, in response to said turning on transfer transistors, charge collected by a photodiode of the selected image sensor pixel to the floating diffusion node;

sampling the output signal prior to said transferring to obtain a first sample;

sampling the output signal after said transferring to obtain a second sample; and

determining a sensed value for the selected image sensor pixel based on the first sample and the second sample.

42. The method of claim 41, wherein said turning on transfer transistors comprises activating a transfer control line associated with the row of image sensor pixels.

43. The method of claim 37, wherein said turning off reset transistors comprises deactivating a reset control line associated with the row of image sensor pixels.