EXTENDED RANGE INTERFEROMETRIC METHODS AND SYSTEMS
First Claim
1. An interferometer for estimating at least one interferometric parameter of one or more signals received from a source, the interferometer comprising:
- at least one phase measurement module configured to determine a plurality of phase measurements of the one or more signals received from a source;
at least one coarse sought parameter estimator configured to determine at least one coarse sought parameter representing the at least one interferometric parameter by processing the one or more signals received from the source;
a fine sought parameter estimator configured to process the at least one coarse sought parameter received from the at least one coarse sought parameter estimator, using the plurality of phase measurements received from the at least one phase measurement module, to determine at least one fine sought parameter representing the at least one interferometric parameter with greater accuracy than the at least one coarse sought parameter.
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Accused Products
Abstract
An interferometer estimates at least one interferometric parameter of one or more signals emitted from a source. The interferometer includes at least one phase measurement module for measuring phase differences between the source signals received at different signal receiving sensors. At least one coarse estimate of a sought parameter used to represent the at least one interferometric parameter is generated by processing the one or more signals received from the source. At least one fine estimate of the sought parameter is also generated by processing the at least one coarse sought parameter using the plurality of phase measurements received from the at least one phase measurement module. The at least one fine sought parameter represents the at least one interferometric parameter with greater accuracy than the at least one coarse sought parameter and over an extended range of values in which the sought parameter is not unambiguously determinable using only the plurality of phase measurements.
62 Citations
39 Claims
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1. An interferometer for estimating at least one interferometric parameter of one or more signals received from a source, the interferometer comprising:
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at least one phase measurement module configured to determine a plurality of phase measurements of the one or more signals received from a source; at least one coarse sought parameter estimator configured to determine at least one coarse sought parameter representing the at least one interferometric parameter by processing the one or more signals received from the source; a fine sought parameter estimator configured to process the at least one coarse sought parameter received from the at least one coarse sought parameter estimator, using the plurality of phase measurements received from the at least one phase measurement module, to determine at least one fine sought parameter representing the at least one interferometric parameter with greater accuracy than the at least one coarse sought parameter. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
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38. A fine sought parameter estimator for use in an interferometer to estimate at least one interferometric parameter, the fine sought parameter estimator comprising a processor configured to:
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receive a vector φ
of N phase measurements and a vector Θ
C of M coarse sought parameters;estimate a vector Θ
of M partial sought parameters by processing the vector φ
of phase measurements, where N is greater than M, each element of the vector φ
of phase measurements defined within one phase cycle, and the vector φ
of phase measurements related to the vector Θ
of partial sought parameters by;
a vector of N integer numbers k of phase cycles missed in the N phase measurements φ
, a vector n of N phase errors associated with the N phase measurements φ
, and a matrix A with dimensions N×
M comprising M column vectors ai that are N-dimensional linearly independent vectors of relatively prime numbers; andprocess the vector Θ
of M partial sought parameters and the vector Θ
C of M coarse sought parameters to generate a vector Θ
F of M fine sought parameters representing the at least one interferometric parameter with greater accuracy than the vector Θ
C of M coarse sought parameters and over a greater range of values than the vector Θ
of M partial sought parameters.
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39. A method of estimating at least one interferometric parameter of one or more signals from a source, the method comprising:
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determining a plurality of phase measurements of the one or more signals received from a source; determining at least one coarse sought parameter representing the at least one interferometric parameter by processing the one or more signals received from the source; and processing the at least one coarse sought parameter using the plurality of phase measurements to determine at least one fine sought parameter representing the at least one interferometric parameter with greater accuracy than the at least one coarse sought parameter.
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Specification