EXAMINATION SYSTEM AND METHOD THEREOF

• US 20110217687A1
• Filed: 07/12/2010
• Published: 09/08/2011
• Est. Priority Date: 03/08/2010
• Status: Abandoned Application

• Current Assignee: E Ink Holdings Incorporated
• Original Assignee: E Ink Holdings Incorporated
• Inventors: PENG, YAO, WANG, TZU-MING, WANG, HENRY, YEH, CHIA-CHUN
• Application Number:
  US12/834,318
• Publication Number:
  US 20110217687A1
• Time in Patent Office: Days
• US Class Current: 434/362
• CPC Class Codes: G09B 7/00 Electrically-operated teaching apparatus or devices working with questions and answers mechanically operated G09B3/00; computing arrangements G06F
• CPC Class Codes: G09B 7/02 of the type wherein the student is expected to construct an answer to the question which is presented or wherein the machine gives an answer to the question presented by a student
• CPC Class Codes: G09B 7/06 of the multiple-choice answer-type, i.e. where a given question is provided with a series of answers and a choice has to be made from the answers
• CPC Class Codes: G16H 10/20 for electronic clinical trials or questionnaires

Abstract

An examination system and an examination method are disclosed. The examination method includes: generating a first test data by a host device, in which the first test data has a plurality of questions; rearranging the questions of the first test data in order to generate a second test data; and sending the second test data to a corresponding examination device for taking the examination. An anti-cheating module is provided for detecting distances between the examination devices or detecting a deviation angle of a character image of the examinee. When the distance is less than a predetermined value or the deviation angle is greater than a predetermined value, an anti-cheating signal is then generated for avoiding cheating actions.

Claims

1. An examination system, comprising:

a host device including;

a data base for storing a plurality of questions and a plurality of answers, in which the answers are respectively associated with the questions;

a randomizing module having a rearrangement function;

a first communication module for sending and receiving data;

a first verification module for verifying according to a set of verification data, and generating a verification signal according to the verification data; and

a first processing unit coupled with the data base, the randomizing module, the first communication module, and the first verification module, for generating a first test data which includes some of the questions from the data base according to the verification signal received from the first verification module, for controlling the randomizing module for rearranging the questions of the first test data so as to generate a second test data, and for controlling the communication module in order to send the second test data;

an examination device including;

an input unit for receiving an input signal;

a second communication module for sending and receiving data;

a display unit for displaying the second test data;

a second verification module for generating the verification data;

an anti-cheating module for generating an anti-cheating signal;

a storage unit for storing the input signal and the second test data; and

a second processing unit coupled with the second communication module, the display module, the second verification module, the anti-cheating module, the input unit, and the storage unit, for controlling the second communication module for sending the verification data and the input signal to the host device, for receiving the second test data and displaying the second test data at the display unit, and for generating an anti-cheating action according to the anti-cheating signal.

2. The examination system as in claim 1, wherein the randomizing module rearranges the questions of the first test data for generating the second test data according to at least one of an identity verification key, a machine code serial number and a program code serial number of the examination device, in which the questions in the second test data are the same as the questions of the first test data but in different order.

3. The examination system as in claim 1, wherein the anti-cheating module detects a distance between the examination device and the other examination device, and when the distance is less than a predetermined value, the anti-cheating module generates the anti-cheating signal, and the examination device then generates the anti-cheating action according to the anti-cheating signal.

4. The examination system as in claim 1, wherein the anti-cheating module has a image system for generating a character image, and when a deviation angle of the character image is greater than a predetermined value, the anti-cheating module generates the anti-cheating signal, and the examination device then generates the anti-cheating action according to the anti-cheating signal.

5. An examination method, comprising:

generating a first test data by a host device, in which the first test data has a plurality of questions;

rearranging the questions of the first test data for generating a second test data by a randomizing module; and

sending the second test data to a corresponding examination device by a first communication module.

6. The examination method as in claim 5, wherein the randomizing module rearranges the questions of the first test data for generating the second test data according to at least one of an identity verification key, a machine code serial number and a program code serial number of the examination device.

7. An examination method, comprising:

generating a test data by a host device, and sending the test data to an examination device for displaying;

generating an anti-cheating signal by an anti-cheating module; and

generating a reply data by the examination device, and sending the reply data to the host device for generating an examination score by the host device.

8. The examination method as in claim 7, wherein the anti-cheating module detects a distance between the examination device and the other examination device, and when the distance is less than a predetermined value, the anti-cheating module generates the anti-cheating signal.

9. The examination method as in claim 8, wherein the anti-cheating module is one of an infrared distance detection module and a radio signal distance detection module, and the examination device generates an anti-cheating action according to the anti-cheating signal.

10. The examination method as in claim 7, wherein the anti-cheating module detects a character image, and when a deviation angle of the character image is greater than a predetermined value, the anti-cheating signal is then generated.

11. The examination method as in claim 10, wherein the anti-cheating module is one of a complementary metal-oxide-semiconductor (CMOS) image module and a charge-coupled device (CCD) image module, and the examination device generates an anti-cheating action according to the anti-cheating signal.