SYSTEMS, METHODS, AND APPARATUSES FOR DETECTING OPTICAL SIGNALS FROM A SAMPLE
First Claim
1. A workstation configured to detect optical signals from samples, the samples including first and second types of samples, the optical system comprising:
- a detector assembly configured to detect the optical signals from the samples;
an optical assembly configured to receive and direct the optical signals to the detector assembly, the optical assembly including a selectively moveable component;
an excitation light source assembly;
a protocol module configured to subject the first and second types of samples to first and second imaging protocols, respectively, wherein each of the first and second imaging protocols includes illuminating the corresponding sample with the excitation light source assembly and detecting the corresponding optical signals; and
an optics adjustment system configured to selectively move the moveable component of the optical assembly, wherein the optics adjustment system is configured to change the optical assembly between a first collective arrangement for the first imaging protocol and a different second collective arrangement for the second imaging protocol.
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Accused Products
Abstract
An optical system configured to detect optical signals during imaging sessions. The optical system includes an objective lens that has a collecting end that is positioned proximate to a sample and configured to receive optical signals therefrom. The optical system also includes a removable path compensator that is configured to be located at an imaging position between the collecting end of the objective lens and the sample. The path compensator adjusts an optical path of the light emissions when in the imaging position. Also, the optical system includes a transfer device that is configured to move the path compensator. The transfer device locates the path compensator at the imaging position for a first imaging session and removes the path compensator from the imaging position for a second imaging session.
74 Citations
37 Claims
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1. A workstation configured to detect optical signals from samples, the samples including first and second types of samples, the optical system comprising:
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a detector assembly configured to detect the optical signals from the samples; an optical assembly configured to receive and direct the optical signals to the detector assembly, the optical assembly including a selectively moveable component; an excitation light source assembly; a protocol module configured to subject the first and second types of samples to first and second imaging protocols, respectively, wherein each of the first and second imaging protocols includes illuminating the corresponding sample with the excitation light source assembly and detecting the corresponding optical signals; and an optics adjustment system configured to selectively move the moveable component of the optical assembly, wherein the optics adjustment system is configured to change the optical assembly between a first collective arrangement for the first imaging protocol and a different second collective arrangement for the second imaging protocol. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for detecting optical signals from first and second types of samples, comprising:
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(a) providing a device comprising; (i) a sample stage having different first and second interfaces, the first interface configured to orient an open-faced support for surface imaging and the second interface configured to orient a flow cell for surface imaging; (ii) a detector assembly configured to detect the optical signals from the samples; (iii) an optical assembly configured to receive and direct the optical signals to the detector assembly, the optical assembly including a plurality of optical components including a selectively moveable component; and (iv) an excitation light source assembly; (b) subjecting the open-faced support to a first imaging protocol, wherein the first imaging protocol comprises illuminating the corresponding sample with the excitation light source assembly, directing the optical signals to the detector assembly with the optical assembly and detecting the optical signals with the detector assembly; (c) selectively moving the moveable component to change the optical assembly from a first collective arrangement for the first imaging protocol to a different second collective arrangement for a second imaging protocol; and (d) subjecting the flow cell to a second imaging protocol, wherein the second imaging protocol comprises illuminating the corresponding sample with the excitation light source assembly, directing the optical signals to the detector assembly with the optical assembly and detecting the optical signals with the detector assembly. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30)
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31. A workstation configured to detect optical signals from samples, the workstation comprising:
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a sample stage having different first and second interfaces, the first interface configured to orient a chip-based support structure for surface-imaging and the second interface configured to fluidicly couple a fluidic support structure to the sample stage; a detector assembly configured to detect optical signals from the chip-based and fluidic support structures; an optical assembly configured to direct the optical signals to the detector assembly, the optical assembly including an objective lens and a plurality of optical components; and an optics adjustment system configured to selectively move at least one optical component to form one of a first collective arrangement and a second collective arrangement, the first collective arrangement being configured for surface-imaging of the chip-based support structure and the second collective arrangement being configured for imaging the fluidic support structure.
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32. An optical system configured to detect optical signals from a sample stage configured to receive at least two types of samples, the optical system comprising:
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an objective lens having a collecting end that is configured to receive optical signals from the at least two types of samples; and an optical path compensator configured to be removably located at an imaging position between the objective lens and the sample stage, the path compensator adjusting a focal region associated with the objective lens when in the imaging position.
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33. A method of operating an optical system having an objective lens configured to receive optical signals from a sample stage configured to receive first and second types of samples, the method comprising:
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locating an optical path compensator at an imaging position proximate to a collecting end of the objective lens, the path compensator adjusting a focal region associated with the objective lens when in the imaging position; performing a first imaging session to detect optical signals from the first type of sample; removing the path compensator from the imaging position; and performing a second imaging session to detect optical signals from the second type of sample.
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34. An optical system configured to detect light emissions from a sample, the optical system comprising:
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an optical assembly including an objective lens configured to receive the light emissions; a sample detector configured to detect the light emissions, the light emissions being directed by the optical assembly along an optical path between the sample detector and the objective lens, the light emissions propagating in a beam direction; and an optical device having a rotation axis and comprising first and second bandpass filters, the rotation axis extending in a non-parallel manner with respect to the beam direction, the first and second bandpass filters having fixed orientations with respect to the rotation axis, the optical device selectively rotating about the rotation axis to position at least one of the first and second bandpass filters within the optical path.
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35. A method of detecting light emissions from a sample, the method comprising:
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directing light emissions from a sample along an optical path between an objective lens and a sample detector of the optical system; selectively rotating an optical device about a rotation axis, the optical device comprising first and second bandpass filters, the first and second bandpass filters having fixed orientations with respect to the rotation axis, wherein at least one of the first and second bandpass filters is positioned within the optical path to filter the light emissions, the light emissions propagating in along a beam direction that is non-parallel with respect to the rotation axis.
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36. An optical system comprising:
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a sample detector configured to detect light emissions from a sample, the light emissions including first and second optical signals having different emission spectra; an optical train comprising an objective lens located proximate to the sample and a removable optical wedge, the optical train directing the light emissions along an optical path to the sample detector; and an optical device configured to position the optical wedge in the optical path for detecting the first optical signals and remove the optical wedge from the optical path for detecting the second optical signals, the optical wedge directing the first optical signals when positioned in the optical path so that the first optical signals are incident upon the sample detector, the second optical signals being incident upon the sample detector when the optical wedge is removed from the optical path.
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37. A method of operating an optical system, the method comprising:
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illuminating a sample to generate light emissions that include first and second light emissions having different emission spectra; directing the first and second light emissions along a common optical path; positioning an optical wedge in the common optical path when the first light emissions propagate therealong, the optical wedge directing the first light emissions so that the first light emissions are incident upon the sample detector; and removing the optical wedge from the common optical path when the second light emissions propagate therealong, the second light emissions being incident upon the sample detector when the optical wedge is removed from the optical path.
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Specification