LOGIC BUILT-IN SELF-TEST SYSTEM AND METHOD FOR APPLYING A LOGIC BUILT-IN SELF-TEST TO A DEVICE UNDER TEST
First Claim
1. A logic built-in self test system, comprisinga device under test having a first plurality of first bistable multivibrator circuits;
- a logic built-in self test (LBIST) controller; and
a second plurality of second bistable multivibrator circuits,each second bistable multivibrator circuit coupled to a corresponding first bistable multivibrator circuit and configured to swap a second state value kept by said second bistable multivibrator circuit with a first state value kept by said corresponding first bistable multivibrator circuit in response to a first control signal from said LBIST controller, andsaid second bistable multivibrator circuits coupled to form one or more scan chains when receiving a second control signal from said LBIST controller.
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Accused Products
Abstract
A logic built-in self test (LBIST) system comprises a device under test having a first plurality of first bistable multivibrator circuits an LBIST controller, and a second plurality of second bistable multivibrator circuits. Each second bistable multivibrator circuit is coupled to a corresponding first bistable multivibrator circuit to swap a second state value kept by the second bistable multivibrator circuit with a first state value kept by the corresponding first bistable multivibrator circuit depending on a first control signal from the LBIST controller and the second bistable multivibrator circuits are coupled to form one or more scan chains when receiving a second control signal from the LBIST controller.
25 Citations
20 Claims
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1. A logic built-in self test system, comprising
a device under test having a first plurality of first bistable multivibrator circuits; -
a logic built-in self test (LBIST) controller; and a second plurality of second bistable multivibrator circuits, each second bistable multivibrator circuit coupled to a corresponding first bistable multivibrator circuit and configured to swap a second state value kept by said second bistable multivibrator circuit with a first state value kept by said corresponding first bistable multivibrator circuit in response to a first control signal from said LBIST controller, and said second bistable multivibrator circuits coupled to form one or more scan chains when receiving a second control signal from said LBIST controller. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 14, 15, 20)
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13. A method for applying a logic built-in self-test to a device under test having a first plurality of first bistable multivibrator circuits, the method comprising:
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writing second state values into a second plurality of second bistable multivibrator circuits, each second bistable multivibrator circuit coupled to a corresponding first bistable multivibrator circuit; swapping said second state values with first state values kept by said corresponding first bistable multivibrator circuits; applying said second state values kept in said first bistable multivibrator circuits to said device under test; capturing a test result in said second state values by applying a first clock signal to said first bistable multivibrator circuits; swapping said second state values kept by said corresponding first bistable multivibrator circuits with said first state values kept by said second bistable multivibrator circuits; and reading said second state values kept by said second bistable multivibrator circuits. - View Dependent Claims (17, 18, 19)
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16. A non-transitory computer-readable storage medium storing instructions executable by a processor and configured to:
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write second state values into a second plurality of second bistable multivibrator circuits, wherein each second bistable multivibrator circuit is coupled to a corresponding first bistable multivibrator circuit; swap said second state values with first state values kept by said corresponding first bistable multivibrator circuits; apply said second state values kept in said first bistable multivibrator circuits to a device under test; capture a test result in said second state values by applying a first clock signal to said first bistable multivibrator circuits; swap said second state values kept by said corresponding first bistable multivibrator circuits with said first state values kept by said second bistable multivibrator circuits; and read said second state values kept by said second bistable multivibrator circuits.
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Specification