SUPER JUNCTION DEVICE WITH DEEP TRENCH AND IMPLANT
First Claim
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1. A device, comprising:
- a substrate;
a plurality of first regions of a first conductivity type formed on the substrate; and
a plurality of second regions of a second conductivity type formed on the substrate and interleaved with the plurality of first regions, wherein each of the second regions includes;
an implant region implanted between the substrate and a trenched region;
a conductive column formed into the trenched region; and
an insulative barrier configured to insulate the conductive column from the implant region and from the first regions adjacent to the second region.
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Abstract
RESURF effect devices with both relatively deep trenches and relatively deep implants are described herein. Also, methods of fabricating such devices are described herein. A RESURF effect device may include alternating regions of first and second conductivity types where each of the second regions includes an implant region formed into a trench region of the second region.
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Citations
22 Claims
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1. A device, comprising:
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a substrate; a plurality of first regions of a first conductivity type formed on the substrate; and a plurality of second regions of a second conductivity type formed on the substrate and interleaved with the plurality of first regions, wherein each of the second regions includes; an implant region implanted between the substrate and a trenched region; a conductive column formed into the trenched region; and an insulative barrier configured to insulate the conductive column from the implant region and from the first regions adjacent to the second region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A transistor, comprising:
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a substrate; a drift region in contact with the substrate, wherein the drift region includes; a plurality of first regions of a first conductivity type; and a plurality of second regions of a second conductivity type interleaved with the plurality of first regions, wherein each of the second regions includes; an implant region implanted between the substrate and a trenched region; a conductive column formed into the trenched region; and an insulative barrier configured to insulate the conductive column from the implant region and from the first regions adjacent to the second region. - View Dependent Claims (15, 16)
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17. A method for fabricating a semiconductor device, comprising:
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forming a layer of semiconductor material onto a substrate; forming a sequence of trenches into and partially through the semiconductor material; implanting implant regions into the semiconductor material through the trenches; forming insulating materials onto one or more surfaces of the trenches; and filling at least a portion of the trenches with a first material. - View Dependent Claims (18, 19, 20, 21, 22)
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Specification