Apparatus for High Precision Measurement of Varied Surface and Material Levels

• US 20110231127A1
• Filed: 11/30/2009
• Published: 09/22/2011
• Est. Priority Date: 11/28/2008
• Status: Abandoned Application

• Current Assignee: Ametek Incorporated
• Original Assignee: Ametek Incorporated
• Inventors: DiRienzo, Jules J., Naghski, John E., Hopkins, Travis D., Hafer, Kevin G.
• Application Number:
  US13/131,684
• Publication Number:
  US 20110231127A1
• Time in Patent Office: Days
• US Class Current: 702/65
• CPC Class Codes: G01F 23/265 for discrete levels
• CPC Class Codes: G01F 23/268 mounting arrangements of probes

Abstract

An apparatus and method for measuring the level of a wide range of varied surfaces or materials housed within vessels, and for detecting contact with a solid surface within the vessel is disclosed. A high precision radio frequency admittance measuring system, using capacitance to measure levels of process materials, coupled with detection element to sense contact of the detection element with a solid surface, such as a floating roof. An active element and ground element in coaxial relationship provides means for measuring the level of process materials including water, oil, kerosene, jet fuel, gasoline. Along with detecting the level of a solid surface within the vessel such as a floating roof. One preferred application of the inventive apparatus is to provide vessel or tank overfill protection. The apparatus detection element is capable of sensing level and non-level solid surfaces.

Claims

1. An apparatus for measuring the level of a material within a vessel and for detecting the level of a solid surface within said vessel, comprising:

a capacitance probe for measuring the level of the material within the vessel to a high degree of precision, said capacitance probe having an active element and a ground element in close lateral proximity to each other, said capacitance probe further having a proximate end and a distal end; and

a detection element incorporated into the distal end of the capacitance probe for detecting the level of a solid surface within the vessel.

2. The apparatus for measuring the level of a material within a vessel, as provided in claim 1, wherein the capacitance probe has a fixed height within the vessel.

3. The apparatus for measuring the level of a material within a vessel, as provided in claim 1, wherein the capacitance probe may be positioned at varied heights within the vessel.

4. The apparatus for measuring the level of a material within a vessel, as provided in claim 1, further comprising a cable coiling device to permit the capacitance probe to be placed at varied depths within the vessel.

7. The apparatus for measuring the level of a material within a vessel, as provided in claim 1, further comprising a cover to protect the capacitance probe from weather elements.

8. The apparatus for measuring the level of a material within a vessel, as provided in claim 1, further comprising a cover to protect the detection element from weather elements.

9. The apparatus for measuring the level of a material within a vessel, as provided in claim 1, further comprising a heating element to heat the capacitance probe.

10. The apparatus for measuring the level of a material within a vessel, as provided in claim 1, further comprising a heating element to heat the detection element.

5. A system for measuring the surface level of a material stored within a vessel, comprising:

a capacitance probe for measuring the level a material within the vessel, said capacitance probe having a proximate end and a distal end;

a detection element coupled with the distal end of the capacitance probe for detecting the level of a solid surface within the vessel; and

a computer processor to calibrate and monitor the capacitance probe.

6. The system for measuring the level of a material within a vessel, as provided in claim 5, wherein the capacitance probe and detection element communicate with the computer processor wirelessly.

11. An apparatus for measuring the level of a material within a vessel and for detecting the level of a solid surface within said vessel, comprising:

a capacitance probe for measuring the level of the material within the vessel, said capacitance probe having an active element and a ground element, wherein the active element and ground element are in a co-axial relationship with each other; and

said active element detects the level of a solid surface within the vessel.

12. The apparatus for measuring the level of a material within a vessel, as provided in claim 11, wherein the capacitance probe has a fixed height within the vessel.

13. The apparatus for measuring the level of a material within a vessel, as provided in claim 11, wherein the capacitance probe may be positioned at varied heights within the vessel.

14. The apparatus for measuring the level of a material within a vessel, as provided in claim 11, further comprising a cable coiling device to permit the capacitance probe to be placed at varied depths within the vessel.

17. The apparatus for measuring the level of a material within a vessel, as provided in claim 11, further comprising a heating element to heat the capacitance probe.

15. A system for measuring the surface level of a material stored within a vessel, comprising:

a capacitance probe for measuring the level of the material within the vessel, said capacitance probe having an active element and a ground element, wherein the active element and ground element are in a co-axial relationship with each other; and

said active element detects the level of a solid surface within the vessel; and

a computer processor to calibrate and monitor the capacitance probe.

16. The system for measuring the level of a material within a vessel, as provided in claim 15, wherein the capacitance probe communicates with the computer processor wirelessly.

18. A method for measuring the level of a material or distinct solid surface within a vessel using a capacitance probe coupled with a detection element, and a computer processor, comprising the steps of:

(a) calibrating the level of the capacitance probe through the computer processor;

(b) monitoring the level of the material within the vessel, and monitoring any contacts of solid surfaces with the detection element, through the computer processor; and

(c) providing output data of the material level as measured by the capacitance probe or if a solid surface contacts the detection element.

19. The method for measuring the level of a material or distinct solid surface within a vessel using a capacitance probe coupled with a detection element, and a computer processor, as provided in claim 18, wherein the capacitance probe has a fixed height within the vessel.

20. The method for measuring the level of a material or distinct solid surface within a vessel using a capacitance probe coupled with a detection element, and a computer processor, as provided in claim 18, wherein the capacitance probe may be positioned at varied heights within the vessel.

21. The method for measuring the level of a material or distinct solid surface within a vessel using a capacitance probe coupled with a detection element, and a computer processor, as provided in claim 18, further comprising a cable coiling device to permit the capacitance probe to be placed at varied depths within the vessel.

22. The method for measuring the level of a material or distinct solid surface within a vessel using a capacitance probe coupled with a detection element, and a computer processor, as provided in claim 18, wherein the capacitance probe and detection element communicate wirelessly with the computer processor.

23. A method for measuring the level of a material or distinct solid surface within a vessel using a capacitance probe coupled with a detection element, and a computer processor, comprising the steps of:

(a) calibrating the level of the capacitance probe through the computer processor;

(b) monitoring the level of the material within the vessel through the computer processor;

(c) providing output data of the material level as measured by the capacitance probe;

(d) monitoring any contacts of solid surfaces with the detection element through the computer processor; and

(e) providing output data if a solid surface contacts the detection element.