MODE SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SENSING
First Claim
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1. An analysis system comprising:
- a sample;
a first excitation source that applies to a sample a first set of energies at a first set of frequencies;
a second excitation source, independent of said first excitation source, that applies a second set of energies at a second set of frequencies to a probe, wherein said first set of energies and said second set of energies are simultaneously applied to said sample and said probe, respectively, and form a multi-mode coupling effect; and
a detector that detects dynamics of said probe from which an effect of said multi-mode coupling effect can be obtained.
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Abstract
A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.
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Citations
36 Claims
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1. An analysis system comprising:
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a sample; a first excitation source that applies to a sample a first set of energies at a first set of frequencies; a second excitation source, independent of said first excitation source, that applies a second set of energies at a second set of frequencies to a probe, wherein said first set of energies and said second set of energies are simultaneously applied to said sample and said probe, respectively, and form a multi-mode coupling effect; and a detector that detects dynamics of said probe from which an effect of said multi-mode coupling effect can be obtained. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method of analyzing a sample comprising:
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applying a first set of energies at a first set of frequencies to a sample; applying, simultaneously with said applying said first set of energies, a second set of energies at a second set of frequencies to a probe, wherein said first set of energies and said second set of energies form a multi-mode coupling; and detecting an effect of said multi-mode coupling. - View Dependent Claims (14, 15, 16)
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17. A sensor system comprising:
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a first cantilever comprising a first end; a first excitation source that applies to said first cantilever a first set of energies at a first set of frequencies; a second cantilever comprising a second end, wherein said second end is adjacent to said first end; a second excitation source, independent of said first excitation source, that applies a second set of energies at a second set of frequencies, wherein said first set of energies and said second set of energies are simultaneously applied to said first cantilever and said second cantilever, respectively, and form a multi-mode coupling; and a detector that detects an effect of said multi-mode coupling. - View Dependent Claims (18, 19, 20, 21, 22)
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23. A method of analyzing a sample comprising:
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applying a first set of energies at a first set of frequencies to a sample via a first cantilever; applying a second set of energies at a second set of frequencies to said sample via a second cantilever, wherein said first cantilever is adjacent to said second cantilever, wherein said first set of energies and said second set of energies are simultaneously applied to said first cantilever and said second cantilever, respectively, and form a multi-mode coupling; and detecting an effect of said multi-mode coupling. - View Dependent Claims (24, 25)
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26. An analysis system comprising:
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a first excitation source that applies to a sample a first set of energies at a first set of frequencies; a second excitation source, independent of said first excitation source, that applies a second set of energies at a second set of frequencies to said sample, wherein said first set of energies and said second set of energies are simultaneously applied to said sample, and form a multi-mode coupling; a probe that contacts said sample; a detector that detects dynamics of said probe from which an effect of said multi-mode coupling can be obtained. - View Dependent Claims (27, 28, 29, 30, 31, 32)
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33. A method of analyzing a sample comprising:
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applying a first set of energies at a first set of frequencies to a sample; applying simultaneously with said applying said first set of energies a second set of energies at a second set of frequencies to said sample, wherein said first set of energies and said second set of energies form a multi-mode coupling; and detecting an effect of said multi-mode coupling effect via a probe that contacts said sample. - View Dependent Claims (34, 35, 36)
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Specification