CIRCUIT ARRANGEMENT WITH TEMPERATURE COMPENSATION

• US 20110234301A1
• Filed: 03/24/2011
• Published: 09/29/2011
• Est. Priority Date: 03/24/2010
• Status: Active Grant

• Current Assignee: Dspace GmbH
• Original Assignee: Dspace Digital Signal Processing And Control Engineering Gmbh
• Inventors: GRUBER, Paul
• Granted Patent: US 8,446,208 B2
• Time in Patent Office: Days
• US Class Current: 327/513
• CPC Class Codes: H03K 17/145 in field-effect transistor switches

Abstract

A circuit arrangement having at least one analog switch, which is operated by a supply voltage and which comprises a switching signal contact and a pair of switch contacts, whereby applied to the switching signal contact is an electrical switching signal depending on which an electrical connection can be switched between the switch contacts whose internal on-resistance is temperature dependent, whereby the circuit arrangement has in the vicinity of the at least one analog switch at least one additional similar reference analog switch, which is operated with the same common supply voltage and which is controlled such that the switch contacts thereof are/can be connected continuously via the internal temperature-dependent on-resistance thereof, whereby at least one comparison circuit is provided by means of which depending on the comparison of the internal on-resistance of the at least one reference analog switch with at least one external reference resistance or an otherwise setpoint setting of the reference analog switch(es), at least one control signal can be/is generated, by means of which the internal on-resistance of the at least one reference analog switch can be kept constant by changing the common supply voltage of all analog switches depending on the control signal, particularly can be adjusted to the at least one reference resistance, or the otherwise formed setpoint setting of the reference analog switch(es).

Claims

1. A circuit arrangement having at least one analog switch, which is operated with a supply voltage and comprises a switching signal contact and a pair of switch contacts, whereby applied to the switching signal contact is an electrical switching signal depending on which an electrical connection can be switched between the switch contacts whose internal on-resistance is temperature dependent, wherein the circuit arrangement has in the vicinity of the at least one analog switch at least one additional similar reference analog switch, which is operated with the same common supply voltage and which is controlled such that the switch contacts thereof are connectable continuously via the internal temperature-dependent on-resistance thereof, whereby at least one comparison circuit is provided by means of which depending on the comparison of the internal on-resistance of the at least one reference analog switch with at least one external reference resistance or another setpoint setting of the reference analog switch(es), at least one control signal is generated, by means of which the internal on-resistance of the at least one reference analog switch is kept constant by changing the common supply voltage of all analog switches depending on the control signal, particularly can be adjusted to the at least one reference resistance or the otherwise formed setpoint setting of the reference analog switch(es).

2. The circuit arrangement according to claim 1, wherein a voltage regulator is controlled with the at least one control signal, wherein the regulator with which the internal on-resistance of the at least one reference analog switch is kept constant by changing the common supply voltage of all analog switches depending on the control signal, particularly can be adjusted to the at least one reference resistance or the otherwise formed setpoint setting of the reference analog switch(es).

3. The circuit arrangement according to claim 1, wherein the at least one comparison circuit comprises a differential amplifier with at least two voltage inputs, to which two voltages to be compared are applied, and with a voltage output, at which depending on the comparison a control signal, particularly a control voltage, is present to control the voltage regulator, wherein a voltage to be compared in a voltage divider chain with at least one additional resistor is tapped via the internal on-resistance of the at least one reference analog switch and the other voltage in a voltage divider chain with at least an additional resistor is tapped via the at least one reference resistance.

4. The circuit arrangement according to claim 3, wherein the ratio of the resistance values of the resistors on both sides of the tap site of the voltages in both voltage divider chains is the same, particularly that in the regulated state the ratio of R1 to the reference analog switch is the same as the ratio of R2 to the setpoint value of the resistance of the reference analog switch(es).

5. The circuit arrangement according to claim 1, wherein the circuit arrangement contains at least one analog or digital control circuit, which measures the on-resistance of the at least one reference analog switch and compares it with a setpoint value of the same, and based on this comparison generates a control signal for controlling the voltage regulator.

6. The circuit arrangement according to claim 1, wherein the internal on-resistance, used for comparison, is formed by the mean or the sum, particularly in a series connection, or the quotient of the quotient sum, particularly in a parallel circuit of the individual internal on-resistances of a plurality of reference analog switches.

7. The circuit arrangement according to claim 1, wherein the positive and/or the negative supply voltage of the analog switches can be changed, particularly can be regulated/is regulated, with the voltage regulator depending on the control signal, particularly the comparison voltage.

9. The circuit arrangement according to claim 1, wherein the circuit arrangement comprises at least two electrical contacts, which are connected by a parallel circuit of a plurality of analog switches, whereby each analog switch of the parallel circuit is connected in series to a resistor with a different resistance value.

10. A method for compensating the temperature dependence of the on-resistance of at least one analog switch, operated with a supply voltage, wherein the internal temperature-dependent on-resistance is continuously compared by at least one additional similar reference analog switch, arranged in a vicinity of the at least one analog switch, with at least one external temperature-independent reference resistance or with an otherwise predefined setpoint value for the resistance of the reference analog switch, and with a control signal dependent on the comparison result, particularly by control of a voltage regulator with the control signal, the common supply voltage of the at least one analog switch and of the at least one reference analog switch is adjusted so that the internal temperature-dependent on-resistance of the at least one reference analog switch corresponds to a predefined setpoint value, particularly the at least one reference resistance.

11. A method according to claim 10, wherein the supply voltage is adjusted so that the control deviation, therefore the difference between the setpoint value and actual value, becomes at least approximately zero.

12. A circuit arrangement comprising:

a testing component comprising at least one analog switch having an internal resistance that is temperature dependent; and

a comparison circuit comprising a reference analog switch having an internal resistance that is temperature dependent and comprising a reference resistance, the comparison circuit being arranged in a vicinity of the testing component such that the reference analog switch obtains substantially a same temperature as the analog switch during operation thereof,

wherein the analog switch and the reference analog switch is supplied with the same supply voltage,

wherein the internal resistance of the reference analog switch is compared to an internal resistance of the reference resistance, and

wherein the internal resistance of the analog switch and the internal resistance of the reference analog switch are adjusted via a change to the supply voltage such that the internal resistances of the analog switch and the reference analog switch become substantially the same as the internal resistance of the reference resistance.

13. The circuit according to claim 12, wherein the testing component comprises a plurality of analog switches.

14. The circuit according to claim 12, wherein the internal resistance of the analog switch and the internal resistance of the reference analog switch changes based on temperature and/or a value of the supply voltage.

15. The circuit according to claim 12, further comprising a resistor connected in series with the analog switch.

16. The circuit according to claim 15, wherein the resistor is connectable to a vehicle control device to test resistance values.

17. The circuit according to claim 12, wherein the comparison circuit further comprises a differential amplifier that is configured to provide a control signal,

18. The circuit according to claim 17, wherein the control signal indicates whether a value of a voltage based on the reference analog switch is the same, greater, or smaller than a value of a voltage based on the reference resistance.

19. The circuit according to claim 17, wherein the supply voltage is adjusted based on the control signal.

20. The circuit according to claim 12, wherein the reference resistance is a resistor.