Mobile Apparatus Capable of Surface Measurements

• US 20110235058A1
• Filed: 06/10/2011
• Published: 09/29/2011
• Est. Priority Date: 03/07/2006
• Status: Abandoned Application

• Current Assignee: Sensory Analytics, LLC
• Original Assignee: Sensory Analytics, LLC
• Inventors: Pavelka, Jeff, Price, Joseph K.
• Application Number:
  US13/157,545
• Publication Number:
  US 20110235058A1
• Time in Patent Office: Days
• US Class Current: 356/630
• CPC Class Codes: C25D 11/02 Anodisation
• CPC Class Codes: C25D 21/12 Process control or regulation controlling or regulating in general G05
• CPC Class Codes: G01B 11/0625 with measurement of absorption or reflection
• CPC Class Codes: G01B 11/0683 measurement during deposition or removal of the layer

Abstract

The present invention relates to a mobile apparatus and/or system that measures the thickness at one or more locations of a surface on at least a part of a substrate and methods of using the apparatus and/or system. The mobile apparatus and/or system in one embodiment includes an apparatus and/or system having a coating thickness monitor and, optionally, an apparatus and/or system for simultaneously regulating the coating thickness applied on a substrate. Under certain conditions, the apparatus and system has the ability to measure coating thickness subsequent to the coating'"'"'s formation.

Claims

1. A mobile apparatus for measuring thickness of a coating on a surface of a substrate comprising:

a coating thickness monitor for measuring the thickness of at least a portion of the coating on the substrate, said coating thickness monitor including;

(i) at least one radiation source for providing radiation to be directed towards at least a portion of the coated substrate,

(ii) at least one probe for directing said radiation at said at least a portion of the coated substrate and for capturing at least a portion of the radiation reflected and refracted by the coating on the coated substrate, the captured radiation being at least a portion of the radiation directed towards the coated substrate from said radiation source,

(iii) at least one detector in communication with said at least one probe, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the coating on the substrate; and

(iv) an optical switching system capable of transmitting said provided radiation to said at least one probe and said captured radiation from said at least one probe to said at least one detector

wherein the mobile apparatus is portable.

2. The mobile apparatus of claim 1, further comprising an anodized surface measuring device.

3. The mobile apparatus of claim 1, wherein the coating thickness monitor is designed to measure one or more members selected from the group consisting of an anodized coating, a paint coating, a dye coating, an organic layer coating, an inorganic layer coating, a biological layer coating, a polymeric film coating, a metallic coating, and mixtures thereof.

4. The mobile apparatus of claim 1, wherein the mobile apparatus has one or more of the following features:

the mobile apparatus has one or more wheels, the mobile apparatus is on a rack, the mobile apparatus can be positioned remotely, the mobile apparatus can be hand-carried, the mobile apparatus is robotic, the mobile apparatus has a coordinate measuring machine (CMM) and the mobile apparatus has a plurality of probes.

5. The mobile apparatus of claim 4, wherein the coating thickness monitor is designed to measure the thickness of an anodized surface.

6. The mobile apparatus of claim 4, wherein the mobile apparatus has a plurality of probes.

7. The mobile apparatus of claim 4, wherein the mobile apparatus is positioned remotely by a wireless COM link.

8. The mobile apparatus of claim 7, wherein the mobile apparatus has a plurality of probes.

9. The mobile apparatus of claim 8, wherein the mobile apparatus further comprises a means of anodizing a substrate.

10. The mobile apparatus of claim 9, wherein the means of anodizing comprises different zones wherein different current levels can be applied to each of said different zones.

11. The mobile apparatus of claim 10, wherein the different current levels are applied via electronic switches.

12. A method for measuring a thickness of a coated substrate comprising the steps:

(i) providing a coating thickness apparatus for measuring the thickness of at least a portion of a coating on a substrate, said coating thickness apparatus having at least one radiation source, at least one probe, at least one detector and at least one switching system;

(ii) providing radiation via the at least one radiation source and directing said radiation towards the at least one probe,

(iii) directing said radiation from said at least one probe to at least a portion of the coated substrate,

(iv) capturing at least a portion of the radiation reflected and refracted by the coated substrate at the at least one probe, and transmitting said radiation reflected and refracted to said at least one detector,

(v) processing said radiation reflected and refracted to determine a thickness of the coated substrate;

(vi) moving said coating thickness apparatus to a new location; and

(vii) repeating one or more of steps (ii)-(vi)

wherein the coating thickness apparatus is portable.

13. The method of claim 12, further comprising moving said coating thickness apparatus by a wireless communication link.

14. The method of claim 12, wherein a plurality of probes are used.

15. The method of claim 12, wherein the at least one probe comprise optical fibers.

16. The method of claim 12, wherein the coated substrate is coated with an anodized layer.

17. The method of claim 12, wherein the coating thickness apparatus is moved via a tract.

18. The method of claim 12, wherein an operator can iteratively move said coating thickness apparatus.

19. The method of claim 12, wherein said coating thickness apparatus is moved via a preprogrammed algorithm.

20. The method of claim 12, wherein the switching system is an optical switching system.