NAND FLASH MEMORY
First Claim
1. A NAND flash memory that is read while a selected bit line and a non-selected bit line are adjacent to each other, comprisinga memory cell array having a plurality of blocks each including a plurality of memory cell units, each of the memory cell units having a plurality of electrically rewritable memory cells that are connected to each other and disposed on a p-type well surrounded by an n-type well formed in a p-type semiconductor substrate, drain-side select gate transistors each of which connects a memory cell unit to a bit line and is connected to a drain-side select gate line at a first gate thereof, and source-side select gate transistors each of which connects a memory cell unit to a source line and is connected to a source-side select gate line at a second gate thereof;
- wherein a first bit line that is selected is charged to a first potential while the p-type semiconductor substrate is being set at a ground potential, and the source lines, the n-type wells, the p-type wells, and a second bit line that is not selected are being charged to a second potential that is between said first potential and said ground potential at the same time as the select bit line is charged.
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Abstract
A NAND flash memory that is read while a selected bit line and a non-selected bit line are adjacent to each other, has a memory cell array having a plurality of blocks each of which is composed of a plurality of memory cell units, each of said memory cell units having a plurality of electrically rewritable memory cells that are connected to each other and composed of a p-type well surrounded by an n-type well formed in a p-type semiconductor substrate, drain-side select gate transistors each of which connects a memory cell unit to a bit line and is connected to a drain-side select gate line at the gate thereof, and source-side select gate transistors each of which connects a memory cell unit to a source line and is connected to a source-side select gate line at the gate thereof; a row decoder that is connected to word lines, the drain-side select gate lines and the source-side gate line of said memory cell array, and applies a signal voltage to word lines, the drain-side select gate lines and the source-side gate line of said memory cell array for selecting a block; and a sense amplifier that is controlled by a column decoder and makes a selection from said bit lines of said memory cell array, wherein, in a block that is not selected by said row decoder, said bit line selected by said sense amplifier is charged in a state where the drain-side select gate line, the source-side select gate line and the p-type semiconductor substrate are set at a ground potential, and the source lines, the n-type wells, the p-type wells and a bit line that is not selected by said sense amplifier are in a floating state.
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Citations
11 Claims
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1. A NAND flash memory that is read while a selected bit line and a non-selected bit line are adjacent to each other, comprising
a memory cell array having a plurality of blocks each including a plurality of memory cell units, each of the memory cell units having a plurality of electrically rewritable memory cells that are connected to each other and disposed on a p-type well surrounded by an n-type well formed in a p-type semiconductor substrate, drain-side select gate transistors each of which connects a memory cell unit to a bit line and is connected to a drain-side select gate line at a first gate thereof, and source-side select gate transistors each of which connects a memory cell unit to a source line and is connected to a source-side select gate line at a second gate thereof; wherein a first bit line that is selected is charged to a first potential while the p-type semiconductor substrate is being set at a ground potential, and the source lines, the n-type wells, the p-type wells, and a second bit line that is not selected are being charged to a second potential that is between said first potential and said ground potential at the same time as the select bit line is charged. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
Specification