High-Energy X-Ray-Spectroscopy-Based Inspection System and Methods to Determine the Atomic Number of Materials
First Claim
1. An X-ray scanning system for identifying material composition of an object being scanned comprising:
- a. at least one X-ray source for projecting an X-ray beam on the object, at least a portion of the projected X-ray beam being transmitted through the object;
b. at least one array of detectors for measuring energy spectra of the transmitted X-rays; and
c. a processor for identifying the material composition of said object wherein said processor determines the material composition using said spectra.
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Abstract
The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.
79 Citations
37 Claims
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1. An X-ray scanning system for identifying material composition of an object being scanned comprising:
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a. at least one X-ray source for projecting an X-ray beam on the object, at least a portion of the projected X-ray beam being transmitted through the object; b. at least one array of detectors for measuring energy spectra of the transmitted X-rays; and c. a processor for identifying the material composition of said object wherein said processor determines the material composition using said spectra. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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23. An X-ray scanning system for identifying material composition of an object being scanned comprising:
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a. at least one X-ray source for projecting an X-ray beam on the object, at least a portion of the projected X-ray beam being transmitted through the object; b. at least two arrays of detectors, wherein one of said at least two arrays of detectors measures energy spectra of the transmitted X-rays; and c. a processor for identifying the material composition of said object wherein said processor determines the material composition using said spectra. - View Dependent Claims (24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
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Specification