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High-Energy X-Ray-Spectroscopy-Based Inspection System and Methods to Determine the Atomic Number of Materials

  • US 20110235777A1
  • Filed: 02/23/2011
  • Published: 09/29/2011
  • Est. Priority Date: 02/25/2010
  • Status: Active Grant
First Claim
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1. An X-ray scanning system for identifying material composition of an object being scanned comprising:

  • a. at least one X-ray source for projecting an X-ray beam on the object, at least a portion of the projected X-ray beam being transmitted through the object;

    b. at least one array of detectors for measuring energy spectra of the transmitted X-rays; and

    c. a processor for identifying the material composition of said object wherein said processor determines the material composition using said spectra.

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