Semiconductor Device And Method Of Fabricating The Same
First Claim
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1. A method of fabricating semiconductor device, the method comprising:
- forming an interlayer dielectric on a substrate, the interlayer dielectric including first and second openings respectively disposed in first and second regions formed separately in the substrate;
forming a first conductive layer filling the first and second openings;
etching the first conductive layer such that a bottom surface of the first opening is exposed and a portion of the first conductive layer in the second opening remains; and
forming a second conductive layer filling the first opening and a portion of the second opening.
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Abstract
A method of fabricating a semiconductor device includes forming an interlayer dielectric on a substrate, the interlayer dielectric including first and second openings respectively disposed in first and second regions formed separately in the substrate; fondling a first conductive layer filling the first and second openings; etching the first conductive layer such that a bottom surface of the first opening is exposed and a portion of the first conductive layer in the second opening remains; and forming a second conductive layer filling the first opening and a portion of the second opening.
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Citations
17 Claims
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1. A method of fabricating semiconductor device, the method comprising:
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forming an interlayer dielectric on a substrate, the interlayer dielectric including first and second openings respectively disposed in first and second regions formed separately in the substrate; forming a first conductive layer filling the first and second openings; etching the first conductive layer such that a bottom surface of the first opening is exposed and a portion of the first conductive layer in the second opening remains; and forming a second conductive layer filling the first opening and a portion of the second opening. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method of fabricating semiconductor device, the method comprising:
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forming an interlayer dielectric on a substrate, the interlayer dielectric including an opening; conformally forming a first conductive layer on a bottom surface and side wall of the opening; etching the first conductive layer to remove a portion of the first conductive layer from an upper region of the opening such that the first conductive layer remains on a bottom portion of a bottom surface of the opening and on a sidewall portion on a sidewall of the opening, and a top surface of the sidewall portion is lower than a top surface of the interlayer dielectric; and forming a second conductive layer filling the upper region of the opening. - View Dependent Claims (12, 13, 14, 15, 16)
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17-19. -19. (canceled)
Specification