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System and Method of Transistor Switch Biasing in a High Power Semiconductor Switch

  • US 20110254614A1
  • Filed: 04/16/2010
  • Published: 10/20/2011
  • Est. Priority Date: 04/16/2010
  • Status: Active Grant
First Claim
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1. A method of biasing transistor switches in a high power switch, the method comprising:

  • providing on-state Vgsd (gate to source/drain bias voltage) at an on-state Vgsd level to a first transistor switch of said transistor switches for biasing the first transistor switch in an on state; and

    providing off-state Vgsd at an off-state Vgsd level to a second transistor switch of said transistor switches for biasing the second transistor switch in an off state, wherein a magnitude of the off-state Vgsd level is less than a magnitude of the on-state Vgsd level by only an amount sufficient for at least one of;

    bringing spurious harmonic emissions of said second transistor switch when biased to the off state below a pre-identified upper limit of acceptable spurious harmonic emissions from the second transistor switch in the off state; and

    bringing a linearity of the high power switch above a pre-identified lower limit of acceptable linearity for the high power switch.

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